• Journal of the Institute of Electronics Engineers of Korea SD
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• v.42 no.9 s.339
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• pp.29-34
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• 2005

This paper describes a novel internal clock generator, called duty cycle-corrected analog synchronous mirror delay (DCC-ASMD). The proposed circuit is well suited for dual edge-triggered systems such as double data-rate synchronous DRAM since it can achieve clock synchronization within two clock cycles with accurate duty cycle correction. To evaluate the performance of the proposed circuit, DCC-ASMD was designed using a $0.35\mu$m CMOS process technology. Simulation results show that the proposed circuit generates an internal clock having $50\%$ duty ratio within two clock cycles from the external clock having duty ratio range of $40\;\~\;60$.

• JSTS:Journal of Semiconductor Technology and Science
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• v.13 no.2
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• pp.152-156
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• 2013

This paper presents a fast-lock dual-loop successive approximation register-controlled duty-cycle corrector (SARDCC) circuit using a mixed (binary+sequential) search algorithm. A wider duty-cycle correction range, higher operating frequency, and higher duty-cycle correction accuracy have been achieved by utilizing the dual-loop architecture and the binary search SAR that achieves the fast duty-cycle correcting property. By transforming the binary search SAR into a sequential search counter after the first DCC lock-in, the proposed dual-loop SARDCC keeps the closed-loop characteristic and tracks variations in process, voltage, and temperature (PVT). The measured duty cycle error is less than ${\pm}0.86%$ for a wide input duty-cycle range of 15-85 % over a wide frequency range of 0.5-2.0 GHz. The proposed dual-loop SARDCC is fabricated in a 0.18-${\mu}m$, 1.8-V CMOS process and occupies an active area of $0.075mm^2$.

• The Transactions of The Korean Institute of Electrical Engineers
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• v.56 no.6
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• pp.1133-1138
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• 2007

DLLs(Delay Locked Loops) have widely been used in many systems in order to achieve the clock synchronization. A SMD (Synchronous Mirror Delay) structure is used both for skew reduction and for DCC (Duty Cycle Correction). In this paper, a SMD based DLL with DCC using Reduced Delay Lines is proposed in order to reduce the clock skew and correct the duty cycle. The merged structure allows the forward delay array to be shared between the DLL and the DCC, and yields a 25% saving in the number of the required delay cells. The designed chip was fabricated using a $0.25{\mu}m$ 1-poly, 4-metal CMOS process. Measurement results showed the 3% duty cycle error when the input signal ranges from 80% to 20% and the clock frequency ranges from 400MHz to 600MHz. The locking operation needs 3 clock and duty correction requires only 5 clock cycles as feature with SMD structure.

• Journal of Korea Society of Industrial Information Systems
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• v.18 no.5
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• pp.51-58
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• 2013

A clock duty-cycle corrector (DCC) which is an essential device of clocking circuits for high-speed system-on-chip (SoC) design is introduced in this paper. The architectures and operation of conventional analog feedback DCCs and digital feedback DCCs are compared and analyzed. A new mixed-mode feedback DCC that combines the advantages of analog DCCs and digital DCCs to achieve a wider duty-cycle correction range, higher operating frequency, and higher duty-cycle correction accuracy is presented. Especially, the architectures and design of a mixed-mode duty-cycle amplifier (DCA) which is a core unit circuit of a mixed-mode DCC is presented in detail. Two mixed-mode DCCs based on a single-stage DCA and a two-stage DCA were designed in a 0.18-${\mu}m$ CMOS process, and it is proven that the two-stage DCA-based DCC has a wider duty-cycler correction range and smaller duty-cycle correction error.

• Proceedings of the IEEK Conference
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• 2006.06a
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• pp.465-466
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• 2006

In this paper, novel analog duty cycle corrector (DCC) with a digital duty error detector is proposed. The digital duty error detector measures the duty error of the clock and converts it into a digital code. This digital code is then used to accurately correct the duty ratio by adaptively steering the charge-pump current. The proposed duty cycle corrector was implemented using an 80nm DRAM process with 1.8V supply voltage. The simulation result shows that the proposed duty cycle corrector improves the settling time up to $70{\sim}80%$ at 500MHz clock frequency for the same duty correction accuracy as the conventional analog DCC.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.42 no.2 s.332
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• pp.23-30
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• 2005

This paper describes a DLL(delay locked loop)-based multi-clock generator having the lower active stand-by power as well as a fast relocking after re-activating the DLL. for low power and high speed VLSI chip. It enables a frequency multiplication using frequency multiplier scheme and produces output clocks with 50:50 duty-ratio regardless of the duty-ratio of system clock. Also, digital control scheme using DAC enables a fast relocking operation after exiting a standby-mode of the clock system which was obtained by storing analog locking information as digital codes in a register block. Also, for a clock multiplication, it has a feed-forward duty correction scheme using multiphase and phase mixing corrects a duty-error of system clock without requiring additional time. In this paper, the proposed DLL-based multi-clock generator can provides a synchronous clock to an external clock for I/O data communications and multiple clocks of slow and high speed operations for various IPs. The proposed DLL-based multi-clock generator was designed by the area of $1796{\mu}m\times654{\mu}m$ using $0.35-{\mu}m$ CMOS process and has $75MHz\~550MHz$ lock-range and maximum multiplication frequency of 800 MHz below 20psec static skew at 2.3v supply voltage.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.16 no.9
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• pp.1847-1855
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• 2012

A 1V 1.6-GS/s 6-bit flash analog-to-digital converter (ADC) with a clock calibration circuit is proposed. A single track/hold circuit with a bootstrapped analog switch is used as an input stage with a supply voltage of 1V for the high speed operation. Two preamplifier-arrays and each comparator composed of two-stage are implemented for the reduction of analog noises and high speed operation. The clock calibration circuit in the proposed flash ADC improves the dynamic performance of the entire flash ADC by optimizing the duty cycle and phase of the clock. It adjusts the reset and evaluation time of the clock for the comparator by controlling the duty cycle of the clock. The proposed 1.6-GS/s 6-bit flash ADC is fabricated in a 1V 90nm 1-poly 9-metal CMOS process. The measured SNDR is 32.8 dB for a 800 MHz analog input signal. The measured DNL and INL are +0.38/-0.37 LSB, +0.64/-0.64 LSB, respectively. The power consumption and chip area are $800{\times}500{\mu}m2$ and 193.02mW.

• Journal of the Institute of Electronics and Information Engineers
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• v.49 no.10
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• pp.142-147
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• 2012

This paper presents a mixed-mode CMOS duty-cycle corrector (DCC) circuit that has a dynamic frequency scaling (DFS) counter and coarse and fine tuning adjustments. A higher duty-cycle correction accuracy and smaller jitter have been achieved by utilizing the DFS counter that reduces the bit-switching glitch effect of a digital to analog converter (DAC). The proposed circuit has been designed using a 0.18-${\mu}m$ CMOS process. The measured duty cycle error is less than ${\pm}1.1%$ for a wide input duty-cycle range of 25-75% over a wide freqeuncy range of 0.5-1.5 GHz.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.47 no.11
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• pp.13-22
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• 2010

This paper proposed the dual-loops multiphase DLL based mixed VCO/VCDL for a high frequency phase noise suppression of the input clock and the multiple frequencies generation with a precise duty cycle. In the proposed architecture, the dual-loops DLL uses the dual input differential buffer based nMOS source-coupled pairs at the input stage of the mixed VCO/VCDL. This can easily convert the input and output phase transfer of the conventional DLL with bypass pass filter characteristic to the input and output phase transfer of PLL with low pass filter characteristic for the high frequency input phase noise suppression. Also, the proposed DLL can correct the duty-cycle error of multiple frequencies by using only the duty-cycle correction circuits and the phase tracking loop without additional correction controlled loop. At the simulation result with $0.18{\mu}m$ CMOS technology, the output phase noise of the proposed DLL is improved under -13dB for 1GHz input clock with 800MHz input phase noise. Also, at 1GHz operating frequency with 40%~60% duty-cycle error, the duty-cycle error of the multiple frequencies is corrected under $50{\pm}1%$ at 2GHz the input clock.

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2012.10a
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• pp.259-262
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• 2012

This paper describes a delay-locked loop (DLL) that generates a 64-phase clock with the operating frequency of 125MHz. The proposed DLL use a $4{\times}8$ matrix-based delay line to improve the linearity of a delay line. The output clock with 64-phase is generated by using a CMOS multiplex and a inverted-based interpolator from 32-phase clock which is the output clock of the $4{\times}8$ matrix-based delay line. The circuit for an initial phase lock, which is independent on the duty cycle ratio of the input clock, is used to prevent from the harmonic lock of a DLL. The proposed DLL is designed using a $0.18-{\mu}m$ CMOS process with a 1.8 V supply. The simulated operating frequency range is 40 MHz to 200 MHz. At the operating frequency of a 125 MHz, the worst phase error and jitter of a 64-phase clock are +11/-12 ps and 6.58 ps, respectively.