• JSTS:Journal of Semiconductor Technology and Science
• /
• 제14권5호
• /
• pp.615-624
• /
• 2014

In this paper, we explore the electrical properties and high-frequency performance of carbon nanotube field-effect transistors (CNTFETs), based on the non-equilibrium Green's functions (NEGF) solved self - consistently with Poisson's equations. The calculated results show that CNTFETs exhibit superior performance compared with graphene nanoribbon field-effect transistors (GNRFETs), such as better control ability of the gate on the channel, higher drive current with lower subthreshold leakage current, and lower subthreshold-swing (SS). Due to larger band-structure-limited velocity in CNTFETs, ballistic CNTFETs present better high-frequency performance limit than that of Si MOSFETs. The parameter effects of CNTFETs are also investigated. In addition, to enhance the immunity against short - channel effects (SCE), hetero - material - gate CNTFETs (HMG-CNTFETs) have been proposed, and we present a detailed numerical simulation to analyze the performances of scaling down, and conclude that HMG-CNTFETs can meet the ITRS'10 requirements better than CNTs.

• ETRI Journal
• /
• 제43권4호
• /
• pp.728-745
• /
• 2021

Carbon nanotube field-effect transistors (CNTFETs) have been widely studied as a promising technology to be included in post-complementary metal-oxide-semiconductor integrated circuits. Despite significant advantages in terms of delay and power dissipation, the fabrication process for CNTFETs is plagued by fault occurrences. Therefore, developing a fast and accurate method for estimating the reliability of CNTFET-based digital circuits was the main goal of this study. In the proposed method, effects related to faults that occur in a gate's transistors are first represented as a probability transfer matrix. Next, the target circuit's graph is traversed in topological order and the reliabilities of the circuit's gates are computed. The accuracy of this method (less than 3% reliability estimation error) was verified through various simulations on the ISCAS 85 benchmark circuits. The proposed method outperforms previous methods in terms of both accuracy and computational complexity.

• Advances in nano research
• /
• 제5권1호
• /
• pp.61-67
• /
• 2017

A semi-empirical approach to model the temperature effects on I-V characteristics of Carbon Nanotube Field Effect Transistors (CNTFETs) is proposed. The model includes two thermal parameters describing CNTFET behaviour in terms of saturation drain current and threshold voltage, whose values are extracted from the simulated and trans-characteristics of the device in different temperature conditions. Our results are compared with those of a numerical model online available, obtaining I-V characteristics comparable but with a lower CPU calculation time.

• 센서학회지
• /
• 제16권4호
• /
• pp.313-318
• /
• 2007

Single-wall carbon nanotube field-effect transistors (SWCNT FETs) of top gate structure were fabricated in a conventional metal-oxide-semiconductor field effect transistor (MOSFET) with gate electrodes above the conduction channel separated from the channel by a thin $SiO_{2}$ layer. The carbon nanotubes (CNTs) directly grown using thin Fe film as catalyst by thermal chemical vapor deposition (CVD). These top gate devices exhibit good electrical characteristics, including steep subthreshold slope and high conductance at low gate voltages. Our experiments show that CNTFETs may be competitive with Si MOSFET for future nanoelectronic applications.

• ETRI Journal
• /
• 제43권4호
• /
• pp.717-727
• /
• 2021

In this study, new multiplier and adder method designs with multiplexers are proposed. The designs are based on quaternary logic and a carbon nanotube field-effect transistor (CNTFET). The design utilizes 4 × 4 multiplier blocks. Applying specific rotational functions and unary operators to the quaternary logic reduced the power delay produced (PDP) circuit by 54% and 17.5% in the CNTFETs used in the adder block and by 98.4% and 43.62% in the transistors in the multiplier block, respectively. The proposed 4 × 4 multiplier also reduced the occupied area by 66.05% and increased the speed circuit by 55.59%. The proposed designs are simulated using HSPICE software and 32 nm technology in the Stanford Compact SPICE model for CNTFETs. The simulated results display a significant improvement in the fabrication, average power consumption, speed, and PDP compared to the current bestperforming techniques in the literature. The proposed operators and circuits are evaluated under various operating conditions, and the results demonstrate the stability of the proposed circuits.

• JSTS:Journal of Semiconductor Technology and Science
• /
• 제16권1호
• /
• pp.91-105
• /
• 2016

Carbon Nanotube Field-Effect Transistors (CNTFETs) have been studied as candidates for post Si CMOS owing to the better electrostatic control and high mobility. To enhance the immunity against short - channel effects (SCEs), the novel channel and gate engineered architectures have been proposed to improve CNTFETs performance. This work presents a comprehensive study of the influence of channel and gate engineering on the CNTFET switching, high frequency and circuit level performance of carbon nanotube field-effect transistors (CNTFETs). At device level, the effects of channel and gate engineering on the switching and high frequency characteristics for CNTFET have been theoretically investigated by using a quantum kinetic model. This model is based on two-dimensional non-equilibrium Green's functions (NEGF) solved self - consistently with Poisson's equations. It is revealed that hetero - material - gate and lightly doped drain and source CNTFET (HMG - LDDS - CNTFET) structure can significantly reduce leakage current, enhance control ability of the gate on channel, improve the switching speed, and is more suitable for use in low power, high frequency circuits. At circuit level, using the HSPICE with look - up table(LUT) based Verilog - A models, the impact of the channel and gate engineering on basic digital circuits (inverter, static random access memory cell) have been investigated systematically. The performance parameters of circuits have been calculated and the optimum metal gate workfunction combinations of ${\Phi}_{M1}/{\Phi}_{M2}$ have been concluded in terms of power consumption, average delay, stability, energy consumption and power - delay product (PDP). In addition, we discuss and compare the CNTFET-based circuit designs of various logic gates, including ternary and binary logic. Simulation results indicate that LDDS - HMG - CNTFET circuits with ternary logic gate design have significantly better performance in comparison with other structures.

• 전기전자학회논문지
• /
• 제23권3호
• /
• pp.988-993
• /
• 2019

지난 수십 년간 반도체 업계에서는 반도체 소자의 성능을 높이고 높은 밀도로 반도체 소자를 칩 위에 집적하기 위해 끊임없이 그 크기를 축소해 왔다. 하지만, 게이트 제어의 감소, 높아진 누설 전류, 그리고 단 채널 효과와 같은 다양한 문제점에 직면하면서 이를 극복할 수 있는 차세대 반도체에 점점 더 많은 관심을 보이고 있다. 본 논문에서는 다음 반도체 세대를 이끌 후보로 관심을 받고 있는 CNTFET(Carbon NanuTube Field Effect Transistor)을 활용하여 디지털 회로를 디자인하는 방법에 대해 논하고자 한다. CNTFET이 분명 구조적으로 기존 MOSFET과 다른 구조를 가진 만큼, CNTFET을 활용하여 디지털 회로를 디자인할 때, 기존 디지털 회로 기법을 어떻게 활용할 수 있는지 자세히 알아보고 시뮬레이션을 통해 두 소자의 성능 차이를 확인해 보고자 한다.

• 전기전자학회논문지
• /
• 제27권1호
• /
• pp.65-70
• /
• 2023

높은 캐리어 이동도, 큰 포화 속도, 낮은 고유 정전 용량, 유연성, 그리고 투명성을 장점으로 가진 CNTFET(Carbon NanoTube Field Effect Transistor) 10,000개 이상을 현존하는 반도체 디자인 절차와 공정 프로세서를 활용하여 하나의 반도체 칩에 집적하는데 성공하였다. 제작된 반도체 칩의 3차원 다층 구조와 다양한 CNTFET 생산 공정 연구는 기존 MOSFET과 CNTFET를 하나의 반도체 칩에 함께 사용하는 hybrid MOSFET-CNTFET 반도체 칩 제작에 대한 가능성을 보여주고 있다. 본 논문에서는 hybrid MOSFET-CNTFET을 활용한 6T binary SRAM을 디자인하는 방법에 대해 논하고자 한다. 기존 MOSFET SRAM 또는 CNTFET SRAM 디자인 방법을 활용하여 hybrid MOSFET-CNTFET SRAM을 디자인 하는 방법을 소개하고 그 성능을 기존 MOSFET SRAM 그리고 CNTFET SRAM과 비교하고자 한다.

• JSTS:Journal of Semiconductor Technology and Science
• /
• 제15권1호
• /
• pp.131-144
• /
• 2015

An extensive investigation of the influence of gate engineering on the CNTFET switching, high frequency and circuit level performance has been carried out. At device level, the effects of gate engineering on the switching and high frequency characteristics for CNTFET have been theoretically investigated by using a quantum kinetic model. It is revealed that hetero - material - gate CNTFET(HMG - CNTFET) structure can significantly reduce leakage current, enhance control ability of the gate on channel, and is more suitable for use in low power and high frequency circuits. At circuit level, using the HSPICE with look - up table(LUT) based Verilog - A models, the performance parameters of circuits have been calculated and the optimum combinations of ${\Phi}_{M1}/{\Phi}_{M2}/{\Phi}_{M3}$ have been concluded in terms of power consumption, average delay, stability, energy consumption and power - delay product(PDP). We show that, compared to a traditional CNTFET - based circuit, the one based on HMG - CNTFET has a significantly better performance (SNM, energy, PDP). In addition, results also illustrate that HMG - CNTFET circuits have a consistent trend in delay, power, and PDP with respect to the transistor size, indicating that gate engineering of CNTFETs is a promising technology. Our results may be useful for designing and optimizing CNTFET devices and circuits.

• 전기전자학회논문지
• /
• 제25권3호
• /
• pp.473-478
• /
• 2021

CNTFET은 기존 반도체 소자의 성능을 약 13배 향상시킬 수 있어 큰 관심을 받아 왔지만, CNT를 일정하게 배치시키는 공정의 미성숙으로 인해 상용화에 어려움을 겪어 왔다. 이러한 어려움을 극복하기 위해, 그동안 알려진 CNTFET 공정상 한계를 고려한 회로 디자인 방법이 점점 높은 관심을 받고 있다. SRAM은 마이크로프로세서를 구성하는 주요 요소로서 캐시 메모리 안에 규칙적으로 그리고 반복적으로 배치되어 있어, SRAM 안의 CNT는 다른 회로 블록에 비해 보다 쉽게 그리고 고밀도로 배치될 수 있는 장점이 있다. 이러한 장점을 활용하기 위해, 본 논문에서는 CNT 밀도를 고려한 SRAM 셀의 회로 디자인 방법을 소개하고 그 성능 향상 정도를 HSPICE 시뮬레이션으로 검토하고자 한다. 시뮬레이션 결과, SRAM에 CNTFET을 적용할 경우, gate width를 약 1.7배 줄일 수 있음을 발견하였으며, 동일한 gate width에서 CNT 밀도를 높였을 경우, 읽기 속도 또한 약 2배 정도 향상될 수 있음을 알 수 있었다.