• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2006.05a
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• pp.902-905
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• 2006

This paper presents a new RF testing scheme based on a design-for-testability (DFT) method for measuring functional specifications of RF integrated circuits (IC). The proposed method provides input impedance. gain, noise figure. input voltage standing wave ratio (VSWR) and output signal-to-noise ratio (SNR) of a low noise amplifier (LNA). The RF test scheme is based on theoretical expressions that produce the actual RF device specifications by output DC voltages from the DR chip.

• Proceedings of the IEEK Conference
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• 1998.10a
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• pp.1169-1172
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• 1998

We designed an ALU(Airthmetic Logic Unit) with BIST(Built-In Self Test), which is suitable for 32-bit DSP RISC processors. We minimized the area of this ALU by allowing different operations to share several hardware blocks. Moreover, we applied DFT(Design for Testability) to ALU and offered Bist(Built-In Self-Test) function. BIST is composed of pattern generation and response analysis. We used the reseeding method and testability design for the high fault coverage. These techniques reduce the test length. Chip's reliability is improved by testing and the cost of testing system can be reduced.

• Proceedings of the IEEK Conference
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• 2000.07a
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• pp.355-358
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• 2000

In this paper we propose procedures to enhance testability by modifying state transition tables. In these procedures, transitions about undefined states, which are not described in state transition tables but exist in a synthesized gate level circuit, are added to a state transition table. Experimental results for MCNC benchmarks are shown.

• Proceedings of the Korean Information Science Society Conference
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• 2003.10b
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• pp.340-342
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• 2003

컴포넌트는 서드파티(third-party)소스코드 형태로 배포되지 않는 등 여러 가지 요인으로 인해 테스트가능성(testability)이 낮아지게 된다. 이렇게 낮은 테스트가능성으로 인하여 개발된 컴포넌트가 실제로 재사용되었을 때 테스트에 많은 어려움이 따르게 된다. 이러한 테스트가능성을 향상시키기 위한 방법으로서 컴포넌트에 테스트를 위한 래퍼(wrapper)를 적용할 수 있다. 본 연구에서는 테스트가능성을 향상시키기 위한 방법인 래퍼를 설계하고 구현하는 방법에 대한 연구를 수행하였다.

• Journal of the Korean Society of Industry Convergence
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• v.4 no.2
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• pp.199-205
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• 2001

With the growth of BiCMOS technology in ASIC design, the issue of analyzing fault characteristics and testing techniques for BiCMOS circuits become more important In this paper, we analyze the fault models and characteristics of high speed full-swing BiCMOS circuits and the DFT technique to enhance the testability of full-swing high speed BiCMOS circuits is discussed. The SPICE simulation is used to analyze faults characteristics and to confirm the validity of DFT technique.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.40 no.9
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• pp.692-701
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• 2003

In this paper, a new logic transformation method to consider both low power consumption and high testability is proposed. We search the CFF(Compact Fanout Free) that has low probability of being observable at the primary outputs. Under the condition that the CFF is unobservable at all primary outputs, the switching operations in it can be removed by adding redundant connections into it. The testability of the transformed circuit generally tends to reduce. In our method, however, the inserted redundant connections operate as test points in the test mode and can improve not only the controllability but also the observability of the CFF. The transformed circuit consumes less power in the normal mode and also has higher testability in the test mode. To show the efficiency of the proposed logic transformation method, we perform some experiments on the MCNC benchmark test circuits. The results show that the power consumption of the transformed circuit is reduced by 13% maximally and the fault coverage of the transformed circuit is increased.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.15 no.3
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• pp.632-638
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• 2011

This paper presents on-chip Design-for-Testability (DFT) circuit for radio frequency System-on-Chip (SoC) applications. The proposed circuit measures functional specifications of RF integrated circuits such as input impedance, gain, noise figure, input voltage standing wave ratio (VSWRin) and output signal-to-noise ratio (SNRout) without any expensive external equipment. The RF DFT scheme is based on developed theoretical expressions that produce the actual RF device specifications by output DC voltages from the DFT chip. The proposed DFT showed deviation of less than 2% as compared to expensive external equipment measurement. It is expected that this circuit can save marginally failing chips in the production testing as well as in the RF system; hence, saving tremendous amount of revenue for unnecessary device replacements.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.41 no.2
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• pp.55-65
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• 2004

In this paper, An efficient non-scan DFT method for datapaths described in RTL is proposed. The proposed non-scan DFT method improves testability of datapaths based on hierarchical testability analysis regardless to width of the datapath. It always guarantees higher fault efficiency and faster test pattern generation time with little hardware overhead than previous methods. The experimental result shows the superiority of the proposed method of test pattern generation time, application time, and area overhead compared to the scan method.

• Journal of the Institute of Electronics Engineers of Korea TC
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• v.43 no.3 s.345
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• pp.68-77
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• 2006

This paper presents a new Design-for-Testability (DfT) circuit for 4.5-5.5GHz low noise amplifiers (LNAs). The DfT circuit measures gain, noise figure, input impedance, input return loss, and output signal-to-noise ratio for the LNA without external expensive equipment. The DfT circuit is designed using 0.18m SiGe technology. The circuit utilizes input impedance matching and DC output voltage measurements. The technique is simple and inexpensive.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.45 no.10
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• pp.39-44
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• 2008

Scan architecture is very effective design-for-testability technique that is widely used for high testability, however, it requires so much test time due to test vector shifting time. In this paper, an efficient scan test method is presented that is based on the Illinois scan architecture. The proposed method maximizes the common input effect via a scan chain selection scheme. Experimental results show the proposed method requires very short test time and small data volume by increasing the efficiency of common input effect.