Journal of the Institute of Electronics Engineers of Korea SD (대한전자공학회논문지SD)

The Institute of Electronics and Information Engineers (대한전자공학회)
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An Effective Multiple Transition Pattern Generation Method for Signal Integrity Test on Interconnections

Signal Integrity 연결선 테스트용 다중천이 패턴 생성방안

  • Kim, Yong-Joon (Department of Electrical and Electronic Engineering, Yonsei University) ;
  • Kang, Sung-Ho (Department of Electrical and Electronic Engineering, Yonsei University)
  • 김용준 (연세대학교 공과대학 전기전자공학과) ;
  • 강성호 (연세대학교 공과대학 전기전자공학과)
  • Published : 2008.10.25
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Abstract

Scan architecture is very effective design-for-testability technique that is widely used for high testability, however, it requires so much test time due to test vector shifting time. In this paper, an efficient scan test method is presented that is based on the Illinois scan architecture. The proposed method maximizes the common input effect via a scan chain selection scheme. Experimental results show the proposed method requires very short test time and small data volume by increasing the efficiency of common input effect.

스캔 테스트 기법은 효과적인 테스트 성능 향상 기법이지만, 이를 위한 테스트 수행 시간이 너무나 길어진다는 단점이 있다. 본 논문에서는 동일한 테스트 입력을 이용하는 Illinois 스캔 기법을 기반으로 한 효율적인 스캔 테스트 기법을 제안한다. 제한하는 방안은 다수의 스캔 입력에 선택적으로 접근하여 다중 스캔 기법의 효과를 최대한으로 이용한다. 실험 결과는 제안하는 방안이 입력을 공유하기 위한 효율을 극대화 하여 매우 적은 테스트 시간과 테스트 데이터만을 필요로 함을 보여준다.

Keywords

References

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