1 |
J.-Y. Ryu, B. C. Kim, S.-T. Kim, and V. Varadarajan, "Novel Defect Testing of RF Front End UsingInput Matching Measurement," 9th IEEE IMSTW, Vol. 9, pp. 31-34, June 2003.
|
2 |
D. Lupea, U. Pursche and H.-J. Jentschel, "RF-BIST: Loopback Spectral Signature Analysis," IEEE Proc. of the 2003 DATE Conference and Exhibition, pp. 478-483, Mar. 2003.
|
3 |
J. Dabrowski, "BiST Model for IC RF-Transceiver Front-End," 2003 Proceedings of the 18th IEEE Int. Sym. on DFT in VLSI SYSTEMS, pp. 295-302, Nov. 2003.
|
4 |
B. R. Veillette and G. W. Roberts, "A Built-in Self-Test Strategy for Wireless Communication Systems," Proceedings of the 1995 ITC, pp. 930-939, Oct. 1995.
|
5 |
M. Soma, "Challenges and Approaches in Mixed Signal RF Testing," IEEE Proc., pp. 33-37, 1997.
|
6 |
J.-Y. Ryu and S.-H. Noh, "A New Design-for- Testability Circuit for Low Noise Amplifiers," Journal of Korea Institute of Telematics and Electronics, Vol. 43, No. 3, pp. 317-326, March 2006.
|
7 |
J.-Y. Ryu and S.-H. Noh, "Novel Defect Testing of RF Front End Using Input Matching Measurement," Conference of The Korean Institute Of Maritime information & Communication Science, Vol. 7, No. 2, pp. 818-823, October 2003.
|
8 |
J.-Y. Ryu and S.-H. Noh, "A New RF Test Circuit on a DFT Technique," Conference of The Korean Institute Of Maritime information & Communication Science, Vol. 10, No. 1, pp. 902-905, May 2006.
|
9 |
G. Gonzalez, Microwave Transistor Amplifiers: Analysis and Design 2nd Edition, Prentice Hall, pp. 212-293, 1997.
|
10 |
Gray, Hurst, Lewis and Meyer, Analog and Design of Analog Integrated Circuits 4th Edition, New York: John Wiley & Sons, Inc., 2001.
|
11 |
J.-Y. Ryu, B.C. Kim and I. Sylla, "A New BIST Scheme for 5GHz Low Noise Amplifiers," IEEE 9th European Test Symposium, pp. 228-233, 2004.
|