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An Non-Scan DFT Scheme for RTL Circuit Datapath  

Chang, Hoon (School of Computing, Soongsil Univ)
Yang, Sun-Woong (Dept of Computing, Soongsil Univ)
Park, Jae-Heung (Dept of Computing, Soongsil Univ)
Kim, Moon-Joon (Dept of Computing, Soongsil Univ)
Shim, Jae-Hun (Dept of Computing, Soongsil Univ)
Publication Information
Journal of the Institute of Electronics Engineers of Korea SD / v.41, no.2, 2004 , pp. 55-65 More about this Journal
Abstract
In this paper, An efficient non-scan DFT method for datapaths described in RTL is proposed. The proposed non-scan DFT method improves testability of datapaths based on hierarchical testability analysis regardless to width of the datapath. It always guarantees higher fault efficiency and faster test pattern generation time with little hardware overhead than previous methods. The experimental result shows the superiority of the proposed method of test pattern generation time, application time, and area overhead compared to the scan method.
Keywords
Non-Scan DFT; FCDFG; Controllability; Obversability;
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