• Title/Summary/Keyword: clock jitter

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A 1.7 Gbps DLL-Based Clock Data Recovery for a Serial Display Interface in 0.35-${\mu}m$ CMOS

  • Moon, Yong-Hwan;Kim, Sang-Ho;Kim, Tae-Ho;Park, Hyung-Min;Kang, Jin-Ku
    • ETRI Journal
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    • v.34 no.1
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    • pp.35-43
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    • 2012
  • This paper presents a delay-locked-loop-based clock and data recovery (CDR) circuit design with a nB(n+2)B data formatting scheme for a high-speed serial display interface. The nB(n+2)B data is formatted by inserting a '01' clock information pattern in every piece of N-bit data. The proposed CDR recovers clock and data in 1:10 demultiplexed form without an external reference clock. To validate the feasibility of the scheme, a 1.7-Gbps CDR based on the proposed scheme is designed, simulated, and fabricated. Input data patterns were formatted as 10B12B for a high-performance display interface. The proposed CDR consumes approximately 8 mA under a 3.3-V power supply using a 0.35-${\mu}m$ CMOS process and the measured peak-to-peak jitter of the recovered clock is 44 ps.

One-Way Delay Estimation Using One-Way Delay Variation and Round-Trip Time (단방향 지연 변이와 일주 지연을 이용한 양단간의 단방향 지연 추정)

  • Kim, Dong-Keun;Lee, Jai-Yong
    • Journal of the Korea Society of Computer and Information
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    • v.13 no.1
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    • pp.175-183
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    • 2008
  • QoS-support technology in networks is based on measuring QoS metrics which reflect a magnitude of stability and performance. The one-way delay measurement of the QoS metrics especially requires a guarantee of clock synchronization between end-to-end hosts. However, the hosts in networks have a relative or absolute difference in clock time by reason of clock offsets. flock skews and clock adjustments. In this paper, we present a theorem, methods and simulation results of one-way delay and clock offset estimations between end-to-end hosts. The proposed theorem is a relationship between one-way delay, one-way delay variation and round-trip time And we show that the estimation error is mathematically smaller than a quarter of round-trip time.

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A 3.125Gb/s/ch Low-Power CMOS Transceiver with an LVDS Driver (LVDS 구동 회로를 이용한 3.125Gb/s/ch 저전력 CMOS 송수신기)

  • Ahn, Hee-Sun;Park, Won-Ki;Lee, Sung-Chul;Jeong, Hang-Geun
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.46 no.9
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    • pp.7-13
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    • 2009
  • This paper presents a multi-channel transceiver that achieves a data rate of 3.125Gb/s/ch. The LVDS is used because of its noise immunity and low power consumption. And a pre-emphasis circuit is also proposed to increase the transmitter speed. On the receiver side, a low-power CDR(clock and data recovery) using 1/4-rate clock based on dual-interpolator is proposed. The CDR generates needed additional clocks in each recovery part internally using only inverters. Therefore each part can be supplied with the same number of 1/4-rate clocks from a clock generator as in 1/2-rate clock method. Thus, the reduction of a clock frequency relaxes the speed limitation and lowers power dissipation. The prototype chip is comprised of two channels and was fabricated in a $0.18{\mu}m$ standard CMOS process. The output jitter of transmitter is loops, peak-to-peak(0.31UI) and the measured recovered clock jitter is 47.33ps, peak-to-peak which is equivalent to 3.7% of a clock period. The area of the chip is $3.5mm^2$ and the power consumption is about 119mW/ch.

A 3.2Gb/s Clock and Data Recovery Circuit without Reference Clock for Serial Data Communication (시리얼 데이터 통신을 위한 기준 클록이 없는 3.2Gb/s 클록 데이터 복원회로)

  • Kim, Kang-Jik;Jung, Ki-Sang;Cho, Seong-Ik
    • Journal of the Institute of Electronics Engineers of Korea SC
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    • v.46 no.2
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    • pp.72-77
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    • 2009
  • In this paper, a 3.2Gb/s clock and data recovery (CDR) circuit for a high-speed serial data communication without the reference clock is described This CDR circuit consists of 5 parts as Phase and frequency detector(PD and FD), multi-phase Voltage Controlled-Oscillator(VCO), Charge-pumps (CP) and external Loop-Filter(KF). It is adapted the PD and FD, which incorporates a half-rate bang-bang type oversampling PD and a half-rate FD that can improve pull-in range. The VCO consists of four fully differential delay cells with rail-to-rail current bias scheme that can increase the tuning range and tuning linearity. Each delay cell has output buffers as a full-swing generator and a duty-cycle mismatch compensation. This materialized CDR can achieve wide pull-in range without an extra reference clock and it can be also reduced chip area and power consumption effectively because there is no additional Phase Locked- Loop(PLL) for generating reference clock. The CDR circuit was designed for fabrication using 0.18um 1P6M CMOS process and total chip area excepted LF is $1{\times}1mm^2$. The pk-pk jitter of recovered clock is 26ps at 3.2Gb/s input data rate and total power consumes 63mW from 1.8V supply voltage according to simulation results. According to test result, the pk-pk jitter of recovered clock is 55ps at the same input data-rate and the reliable range of input data-rate is about from 2.4Gb/s to 3.4Gb/s.

Design of a 0.18$\mu$m CMOS 10Gbps CDR With a Quarter-Rate Bang-Bang Phase Detector (Quarter-Rate Bang-Bang 위상검출기를 사용한 0.18$\mu$m CMOS 10Gbps CDR 회로 설계)

  • Cha, Chung-Hyeon;Ko, Seung-O;Seo, Hee-Taek;Park, Jong-Tae;Yu, Chong-Gun
    • Journal of IKEEE
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    • v.13 no.2
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    • pp.118-125
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    • 2009
  • With recent advancement of high-speed, multi-gigabit data transmission capabilities, transmitters usually send data without clock signals for reduction of hardware complexity, power consumption, and cost. Therefore clock and data recovery circuits(CDR) become important to recover the clock and data signals and have been widely studied. This paper presents the design of 10Gbps CDR in 0.18$\mu$m CMOS process. A quarter-rate bang-bang phase detector is designed to reduce the power and circuit complexity, and a 4-stage LC-type VCO is used to improve the jitter characteristics. Simulation results show that the designed CDR consumes 80mW from a 1.8V supply, and exhibits a peak-to-peak jitter of 2.2ps in the recovered clock. The chip layout area excluding pads is 1.26mm$\times$1.05mm.

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A Wide - Range Dual-Loop DLL with Programmable Skew - Calibration Circuitry for Post Package (패키지후 프로그램을 이용 스큐 수정이 가능한 광범위한 잠금 범위를 가지고 있는 이중 연산 DLL 회로)

  • Choi, Sung-Il;Moon, Gyu;Wee, Jae-Kyung
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.40 no.6
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    • pp.408-420
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    • 2003
  • This paper describes a Delay Locked Loop (DLL) circuit having two advancements : 1) a dual loop operation for a wide lock-range and 2) programmable replica delays using antifuse circuitry and internal voltage generator for a post-package skew calibration. The dual loop operation uses information from the initial time-difference between reference clock and internal clock to select one of the differential internal loops. This increases the lock-range of the DLL to the lower frequency. In addition, incorporation with the programmable replica delay using antifuse circuitry and internal voltage generator allows for the elimination of skews between external clock and internal clock that occur from on and off-chip variations after the package process. The proposed DLL, fabricated on 0.16m process, operates over the wide range of 42MHz - 400MHz with 2.3v power supply. The measured results show 43psec peak-to-peak jitter and 4.71psec ms jitter consuming 52㎽ at 400MHz.

A 125 MHz CMOS Phase-Locked Loop with 51-phase Output Clock (51-위상 출력 클럭을 가지는 125 MHz CMOS 위상 고정 루프)

  • Lee, Pil-Ho;Jang, Young-Chan
    • Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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    • 2013.10a
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    • pp.343-345
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    • 2013
  • This paper describes a phase-locked loop (PLL) that generates a 51-phase clock with the operating frequency of 125MHz. To generate 51-phase clock with a frequency of 125 MHz, the proposed PLL uses three voltage controlled oscillators (VCOs) which are connected by resistors. Each VCO consists of 17 delay-cells. An resistor averaging scheme, which makes three VCOs to connect with each other, makes it possible to generates 51-phase clock of the same phase difference. The proposed PLL is designed by using 65 nm CMOS process with a 1.0 V supply. At the operating frequency of 125 MHz, the simulated DNL and peak-to-peak jitter are +0.0016/-0.0020 LSB and 1.07 ps, respectively. The area and power consumption of the implemented PLL are $290{\times}260{\mu}m^2$ and 2.5 mW, respectively.

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A Random and Systematic Jitter Suppressed DLL (무작위와 체계적인 것에 의한 지터를 제어하는 지연고정루프)

  • Ahn, Sung-Jin;Choi, Yong-Shig;Choi, Hyek-Hwan
    • Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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    • 2016.05a
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    • pp.693-695
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    • 2016
  • A random and systematic jitter suppressed DLL is presented. The AC averages the delay time of successive delay stages and equalizes the delay time of all delay stages. Measurement results of the DLL-based clock generator fabricated in a one-poly six-metal $0.18{\mu}m$ CMOS process shows 13.4-ps rms jitter.

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Design and Implementation of Open-Loop Clock Recovery Circuit for 39.8 Gb/s and 42.8 Gb/s Dual-Mode Operation

  • Lim, Sang-Kyu;Cho, Hyun-Woo;Shin, Jong-Yoon;Ko, Je-Soo
    • ETRI Journal
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    • v.30 no.2
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    • pp.268-274
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    • 2008
  • This paper proposes an open-loop clock recovery circuit (CRC) using two high-Q dielectric resonator (DR) filters for 39.8 Gb/s and 42.8 Gb/s dual-mode operation. The DR filters are fabricated to obtain high Q-values of approximately 950 at the 40 GHz band and to suppress spurious resonant modes up to 45 GHz. The CRC is implemented in a compact module by integrating the DR filters with other circuits in the CRC. The peak-to-peak and RMS jitter values of the clock signals recovered from 39.8 Gb/s and 42.8 Gb/s pseudo-random binary sequence (PRBS) data with a word length of $2^{31}-1$ are less than 2.0 ps and 0.3 ps, respectively. The peak-to-peak amplitudes of the recovered clocks are quite stable and within the range of 2.5 V to 2.7 V, even when the input data signals vary from 150 mV to 500 mV. Error-free operation of the 40 Gb/s-class optical receiver with the dual-mode CRC is confirmed at both 39.8 Gb/s and 42.8 Gb/s data rates.

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Clock and Date Recovery Circuit Using 1/4-rate Phase Picking Detector (1/4-rate 위상선택방식을 이용한 클록 데이터 복원회로)

  • Jung, Ki-Sang;Kim, Kang-Jik;Cho, Seong-Ik
    • Journal of the Institute of Electronics Engineers of Korea SC
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    • v.46 no.1
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    • pp.82-86
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    • 2009
  • This work is design of clock and data recovery circuit using system clock. This circuit is composed by PLL(Phase Locked Loop) to make system clock and data recovery circuit. The data recovery circuit using 1/4-rate phase picking Detector helps to reduce clock frequency. It is advantageous for high speed PLL. It can achieve a low jitter operation. The designed CDR(Clock and data recovery) has been designed in a standard $0.18{\mu}m$ 1P6M CMOS technology and an active area $1{\times}1mm^2$.