• 한국전자통신학회논문지
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• 제18권4호
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• pp.625-640
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• 2023

본 논문에서는 IoT 응용에서 사용되는 인덕티브한 센서의 인덕턴스를 측정할 수 있는 회로를 제안하였다. RL 저역 통과 필터 회로, 비교기, 전류 제어 스위치, 커패시터의 특성을 이용하여 회로를 구성하였으며, RL 저역 통과 필터 회로의 출력 전압이 기준 전압보다 큰 duration time을 통해 1nH-1H 범위 내의 인덕턴스 값을 도출 할 수 있다.

• 한국정보통신학회논문지
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• 제16권7호
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• pp.1455-1462
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• 2012

본 논문에서는 BCD 공정 기반으로 PMIC용 고신뢰성 24비트 듀얼 포트(dual port) eFuse OTP 메모리를 설계하였다. 제안된 dynamic pseudo NMOS 로직회로를 이용한 프로그램 데이터 비교회로는 program-verify-read 모드에서 프로그램 데이터와 read 데이터를 비교하여 PFb(pass fail bar) 핀으로 비교 결과를 출력한다. 그래서 한 개의 PFb 핀만 테스트하므로 eFuse OTP 메모리가 정상적으로 프로그램 되었는지를 확인할 수 있다. 그리고 program-verify-read 모드를 이용하여 프로그램된 eFuse 저항의 변동을 고려한 가변 풀-업 부하(variable pull-up load)를 갖는 센싱 마진 테스트 회로를 설계하였다. Magnachip $0.35{\mu}m$ BCD 공정을 이용하여 설계된 24비트 eFuse OTP 메모리의 레이아웃 면적은 $289.9{\mu}m{\times}163.65{\mu}m$($=0.0475mm^2$)이다.

• JSTS:Journal of Semiconductor Technology and Science
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• 제10권4호
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• pp.300-308
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• 2010

This paper describes the development of a low-power electrocardiogram (ECG) touch sensor intended for the use with two dry metal electrodes. An equivalent ECG extraction circuit model encountered in a ground-free two-electrode configuration is investigated for an optimal sensor read-out circuit design criteria. From the equivalent circuit model, (1) maximum sensor resolution is derived based on the electrode's background thermal noise, which originates from high electrode-skin contact impedance, together with the input referred noise of instrumentation amplifier (IA), (2) 60 Hz electrostatic coupling from mains and motion artifact are also considered to determine minimum requirement of common mode rejection ratio (CMRR) and input impedance of IA. A dedicated ECG read-out front end incorporating chopping scheme is introduced to provide an input referred circuit noise of 1.3 ${\mu}V_{rms}$ over 0.5 Hz ~ 200 Hz, CMRR of IA > 100 dB, sensor resolution of 7 bits, and dissipating only 36 ${\mu}W$. Together with 8 bits synchronous successive approximation register (SAR) ADC, the sensor IC chip is implemented in 0.18 ${\mu}m$ CMOS technology and integrated on a 5 cm $\times$ 8 cm PCB with two copper patterned electrodes. With the help of proposed touch sensor, ECG signal containing QRS complex and P, T waves are successfully extracted by simply touching the electrodes with two thumbs.

• 센서학회지
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• 제29권4호
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• pp.270-274
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• 2020

In this study, a read-out integrated circuit (ROIC) that can be applied to a colorimetry-based optical sensor for analyzing total phosphorus and total nitrogen was developed and characterized. The proposed ROIC minimizes the effect on temperature fluctuation, improves sensitivity, and extends the dynamic range by utilizing a dual optical path and feedback control circuit. Using a dual optical path makes it possible to calibrate the output signal of the optical sensor automatically, along with the temperature fluctuation. The calibrated voltage is fed back into the measurement stage; thus, the output current of the measurement is adaptively controlled. As a result, the sensitivity and dynamic range of the proposed ROIC are improved. Finally, a total-phosphorus analysis was conducted by utilizing the ROIC. The ROIC was found to operate stably over a wide temperature range.

• JSTS:Journal of Semiconductor Technology and Science
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• 제2권3호
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• pp.173-179
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• 2002

We propose a novel sensing circuit for 2T-2MTJ MRAM that can be used for high speed synchronous operation. Proposed bit-line sense amplifier detects small voltage difference in bit-lines and develops it into rail-to-rail swing while maintaining small voltage difference on TMR cells. It is small enough to fit into each column that the whole data array on selected word line are activated as in DRAMs for high-speed read-out by changing column addresses only. We designed a 256Kb read-only MRAM in a $0.35\mu\textrm{m}$ logic technology to verify the new sensing scheme. Simulation result shows a 25ns RAS access time and a cycle time shorter than 10 ns.

• 한국초전도저온공학회:학술대회논문집
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• 한국초전도저온공학회 2003년도 추계학술대회 논문집
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• pp.76-78
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• 2003

We have designed and tested an RSFQ (Rapid Single Flux Quantum) NDRO (Non Destructive Read Out) circuit for the development of a high speed superconducting ALU (Arithmetic Logic Unit). When designing the NDRO circuit, we used Julia, XIC and Lmeter for the circuit simulations and layouts. We obtained the simulation margins of larger than $\pm$25％. For the tests of NDRO operations, we attached the three DC/SFQ circuits and two SFQ/DC circuits to the NDRO circuit. In tests, we used an input frequency of 1 KHz to generate SFQ Pulses from DC/SFQ circuit. We measured the operation bias margin of NDRO to be $\pm$15％. The circuit was measured at the liquid helium temperature.

• 전기전자학회논문지
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• 제25권2호
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• pp.309-314
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• 2021

본 논문에서 제안된 에스램 사전 증폭 회로는 에스램 데이터 읽기 과정에서 감지 증폭을 활성화 하는 데 필요한 시간을 55% 감소함으로써 기존 회로 대비 읽기 속도를 현격히 개선하였다. 이는 사전 증폭 과정에서 공정 편차에 의한 트랜지스터의 성능 편차를 보상하는 고유 회로에 기인한 것이다. 뿐만 아니라, 사전 증폭으로 인한 추가 에너지 소모량을 최소화하기 위하여 사전 증폭이 필요한 경우에만 사전 증폭기를 활성화 할 수 있는 선별 활성화 회로를 제안하여 추가 에너지 소모를 4.45% 이내로 제한하였다.

• ETRI Journal
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• 제29권4호
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• pp.457-462
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• 2007

This work presents a low-voltage static random access memory (SRAM) technique based on a dual-boosted cell array. For each read/write cycle, the wordline and cell power node of selected SRAM cells are boosted into two different voltage levels. This technique enhances the read static noise margin to a sufficient level without an increase in cell size. It also improves the SRAM circuit speed due to an increase in the cell read-out current. A 0.18 ${\mu}m$ CMOS 256-kbit SRAM macro is fabricated with the proposed technique, which demonstrates 0.8 V operation with 50 MHz while consuming 65 ${\mu}W$/MHz. It also demonstrates an 87% bit error rate reduction while operating with a 43% higher clock frequency compared with that of conventional SRAM.

• JSTS:Journal of Semiconductor Technology and Science
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• 제11권2호
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• pp.88-94
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• 2011

In this paper, we design a 1-kb OTP (Onetime programmable) memory IP in consideration of BCD process based EM (Electro-migration) and resistance variations of eFuse. We propose a method of precharging BL to VSS before activation of RWL (Read word-line) and an optimized design of read NMOS transistor to reduce read current through a non-programmed cell. Also, we propose a sensing margin test circuit with a variable pull-up load out of consideration for resistance variations of programmed eFuse. Peak current through the non-programmed eFuse is reduced from 728 ${\mu}A$ to 61 ${\mu}A$ when a simulation is done in the read mode. Furthermore, BL (Bit-line) sensing is possible even if sensed resistance of eFuse has fallen by about 9 $k{\Omega}$ in a wafer read test through a variable pull-up load resistance of BL S/A (Sense amplifier).

• 한국정보통신학회논문지
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• 제17권10호
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• pp.2359-2368
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• 2013

본 논문에서는 power IC에서 파워가 ON되어있는 동안 입력 신호인 RD(Read) 신호 포트에 glitch와 같은 신호 잡음이 발생하더라도 파워-업(power-up)시 readout된 DOUT 데이터를 유지하면서 다시 읽기 모드로 재진입하지 못하도록 막아주는 IRD(Internal Read Data) 회로를 제안하였다. 그리고 pulsed WL(Word-Line) 구동방식을 사용하여 differential paird eFuse OTP 셀의 read 트랜지스터에 수 십 ${\mu}A$의 DC 전류가 흐르는 것을 방지하여 blowing 안된 eFuse 링크가 EM(Electro-Migration)에 의해 blowing되는 것을 막아주어 신뢰성을 확보하였다. 또한 program-verify-read 모드에서 프로그램된 eFuse 저항의 변동을 고려하여 가변 풀-업 부하(variable pull-up load)를 갖는 센싱 마진 테스트 기능을 수행하는 동시에 프로그램 데이터와 read 데이터를 비교하여 PFb(pass fail bar) 핀으로 비교 결과를 출력하는 회로를 설계하였다. $0.18{\mu}m$ 공정을 이용하여 설계된 8-비트 eFuse OTP IP의 레이아웃 면적은 $189.625{\mu}m{\times}138.850{\mu}m(=0.0263mm^2)$이다.