Design of 1-Kb eFuse OTP Memory IP with Reliability Considered |
Kim, Jeong-Ho
(Dep. EE., Changwon National University)
Kim, Du-Hwi (Dep. EE., Changwon National University) Jin, Liyan (Dep. EE., Changwon National University) Ha, Pan-Bong (Dep. EE., Changwon National University) Kim, Young-Hee (Dep. EE., Changwon National University) |
1 | N. Robson et al., "Electrically programmable fuse (eFuse): From memory redundancy to autonomic chip," Proceedings of Custom Integrated Circuits Conference, pp.799-804, Sep., 2007. |
2 | H. K. Cha, I. H. Yun, J. B. Kim, B. C. So, K. H. Chun, I. K. Nam, and K. R. Lee, "A 32-KB Standard CMOS Antifuse one-time programmable ROM embedded in a 16-bit microcontroller," IEEE Journal of Solid-State Circuits, Vol.41, No.9, 2006. DOI ScienceOn |
3 | D. H. Kim, J. H. Jang, L. Jin, J. H. Lee, P. B. Ha, and Y. H. Kim, "Design and measurement of a 1-kBit eFuse one-time programmable memory IP based on a BCD process," IEICE Trans. Electron, Vol.E93-C, No.8, pp.1365-1370, Aug., 2010 DOI |
4 | C. H. Choi, J. H. Jang, T. H. Kim, O. Y. Shim, Y. G. Hwang, K. S. Ahn, P. B. Ha, and Y. H. Kim, "Design of asynchronous multi-bit OTP memory," IEICE Trans. Electron, Vol.E92-C, No.1, pp.173-177, Jan., 2009. DOI |