• Title/Summary/Keyword: Pipelined ADC

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Modeling of Pipeline A/D converter with Verilog-A (Verilog-A를 이용한 파이프라인 A/D변환기의 모델링)

  • Park, Sang-Wook;Lee, Jae-Yong;Yoon, Kwang-Sub
    • The Journal of Korean Institute of Communications and Information Sciences
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    • v.32 no.10C
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    • pp.1019-1024
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    • 2007
  • In this paper, the 10bit 20MHz pipelined analog-to-digital converter that is able to apply to WLAN system was modeled for ADC design. Each blocks in converter such as sample and hold amplifier(SHA), comparator, multiplyng DAC(MDAC), and digital correction logic(DCL) was modeled. The pipelined ADC with these modeled blocks takes 1/50 less time than the one of simulation using HSPICE.

Brief Overview on Design Techniques and Architectures of SAR ADCs

  • Park, Kunwoo;Chang, Dong-Jin;Ryu, Seung-Tak
    • Journal of Semiconductor Engineering
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    • v.2 no.1
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    • pp.99-108
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    • 2021
  • Successive Approximation Register (SAR) Analog-to-Digital Converters (ADC) seem to become the hottest ADC architecture during the past decade in implementing energy-efficient high performance ADCs. In this overview, we will review what kind of circuit techniques and architectural advances have contributed to place the SAR ADC architecture at its current position, beginning from a single SAR ADC and moving to various hybrid architectures. At the end of this overview, a recently reported compact and high-speed SAR-Flash ADC is introduced as one design example of SAR-based hybrid ADC architecture.

A 2.5 V 10b 120 MSample/s CMOS Pipelined ADC with High SFDR (높은 SFDR을 갖는 2.5 V 10b 120 MSample/s CMOS 파이프라인 A/D 변환기)

  • Park, Jong-Bum;Yoo, Sang-Min;Yang, Hee-Suk;Jee, Yong;Lee, Seung-Hoon
    • Journal of the Institute of Electronics Engineers of Korea SC
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    • v.39 no.4
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    • pp.16-24
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    • 2002
  • This work describes a 10b 120 MSample/s CMOS pipelined A/D converter(ADC) based on a merged-capacitor switching(MCS) technique for high signal processing speed and high resolution. The proposed ADC adopts a typical multi-step pipelined architecture to optimize sampling rate, resolution, and chip area, and employs a MCS technique which improves sampling rate and resolution reducing the number of unit capacitor used in the multiplying digital-to-analog converter (MDAC). The proposed ADC is designed and implemented in a 0.25 um double-poly five-metal n-well CMOS technology. The measured differential and integral nonlinearities are within ${\pm}$0.40 LSB and ${\pm}$0.48 LSB, respectively. The prototype silicon exhibits the signal-to-noise-and-distortion ratio(SNDR) of 58 dB and 53 dB at 100 MSample/s and 120 MSample/s, respectively. The ADC maintains SNDR over 54 dB and the spurious-free dynamic range(SFDR) over 68 dB for input frequencies up to the Nyquist frequency at 100 MSample/s. The active chip area is 3.6 $mm^2$(= 1.8 mm ${\times}$ 2.0 mm) and the chip consumes 208 mW at 120 MSample/s.

Design of High Speed Pipelined ADC for System-on-Panel Applications (System-on-Panel 응용을 위한 고속 Pipelined ADC 설계)

  • Hong, Moon-Pyo;Jeong, Ju-Young
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.46 no.2
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    • pp.1-8
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    • 2009
  • We designed an ADC that operated upto 500Msamples/sec based on proposed R-string folding block as well as second folding block. The upper four bits are processed in parallel by the R-string folding block while the lower four bits are processed in pipeline structured second folding block to supply digital output. To verify the circuit performance, we conducted HSPICE simulation and the average power consumption was only 1.34mW even when the circuit was running at its maximum sampling frequency. We further measured noise immunity by applying linear ramp signal to the input. The DNL was between -0.56*LSB and 0.49*LSB and the INL was between -0.93*LSB and 0.72*LSB. We used 0.35 microns MOSIS device parameters for this work.

A High-Speed CMOS A/D Converter Using an Acquistition-Time Minimization Technique) (정착시간 최소화 기법을 적용한 고속 CMOS A/D 변환기 설계)

  • 전병열;전영득;이승훈
    • Journal of the Korean Institute of Telematics and Electronics C
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    • v.36C no.5
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    • pp.57-66
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    • 1999
  • This paper describes a 12b, 50 Msample/s CMOS AID converter using an acquisition-time minimization technique for the high-speed sampling rate of 50 MHz level. The proposed ADC is implemented in a $0.35\mu\textrm{m}$ double-poly five-metal n-well CMOS technology and adopts a typical multi-step pipelined architecture to optimize sampling rate, resolution, and chip area. The speed limitation of conventional pipelined ADCs comes from the finite bandwidth and resulting speed of residue amplifiers. The proposed acquisition-time minimization technique reduces the acquisition time of residue amplifiers and makes the waveform of amplifier outputs smooth by controlling the operating current of residue amplifiers. The simulated power consumption of the proposed ADC is 197 mW at 3 V with a 50 MHz sampling rate. The chip size including pads is $3.2mm\times3.6mm$.

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Development of a Flash ADC with an Analog Memory (아날로그메모리를 이용한 플레쉬 ADC)

  • Chai, Yong-Yoong
    • The Journal of the Korea institute of electronic communication sciences
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    • v.6 no.4
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    • pp.545-552
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    • 2011
  • In this article, reference voltages in a general flash ADC are not obtained from a series of resistors but floating gates. When a behavior model simulation was performed in a pipelined ADC including the suggested flash ADC as a result of an ADC's overall function, it showed results that SNR is approximately 77 dB and resolution is 12 bit. And more than almost 90% showed INL within ${\pm}0.5$ LSB, and like INL, more than 90% showed DNL within ${\pm}0.5$ LSB.

A 9-Bit 80-MS/s CMOS Pipelined Folding A/D Converter with an Offset Canceling Technique

  • Lee, Seung-Chul;Jeon, Young-Deuk;Kwon, Jong-Kee
    • ETRI Journal
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    • v.29 no.3
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    • pp.408-410
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    • 2007
  • A 9-bit 80-MS/s CMOS pipelined folding analog-to-digital converter employing offset-canceled preamplifiers and a subranging scheme is proposed to extend the resolution of a folding architecture. A fully differential dc-decoupled structure achieves high linearity in circuit design. The measured differential nonlinearity and integral nonlinearity of the prototype are ${\pm}0.6$ LSB and ${\pm}1.6$ LSB, respectively.

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A 10-bit 40-MS/s Low-Power CMOS Pipelined A/D Converter Design (10-bit 40-MS/s 저전력 CMOS 파이프라인 A/D 변환기 설계)

  • Lee, Sea-Young;Yu, Sang-Dae
    • Journal of Sensor Science and Technology
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    • v.6 no.2
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    • pp.137-144
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    • 1997
  • In this paper, the design of a 10-bit 40-MS/s pipelined A/D converter is implemented to achieve low static power dissipation of 70 mW at the ${\pm}2.5\;V$ or +5 V power supply environment for high speed applications. A 1.5 b/stage pipeline architecture in the proposed ADC is used to allow large correction range for comparator offset and perform the fast interstage signal processing. According to necessity of high-performance op amps for design of the ADC, the new op amp with gain boosting based on a typical folded-cascode architecture is designed by using SAPICE that is an automatic design tool of op amps based on circuit simulation. A dynamic comparator with a capacitive reference voltage divider that consumes nearly no static power for this low power ADC was adopted. The ADC implemented using a $1.0{\mu}m$ n-well CMOS technology exhibits a DNL of ${\pm}0.6$ LSB, INL of +1/-0.75 LSB and SNDR of 56.3 dB for 9.97 MHz input while sampling at 40 MHz.

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Differential Capacitor-Coupled Successive Approximation ADC (차동 커패시터 커플링을 이용한 연속근사 ADC)

  • Yang, Soo-Yeol;Mo, Hyun-Sun;Kim, Dae-Jeong
    • Journal of IKEEE
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    • v.14 no.1
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    • pp.8-16
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    • 2010
  • This paper presents a design of the successive approximation ADC(SA-ADC) applicable to a midium-low speed analog-front end(AFE) for the maximum 15MS/s CCD image processing. SA-ADC is effective in applications ranging widely between low and mid data rates due to the large power scaling effect on the operating frequency variations in some other way of pipelined ADCs. The proposed design exhibits some distinctive features. The "differential capacitor-coupling scheme" segregates the input sampling behavior from the sub-DAC incorporating the differential input and the sub-DAC output, which prominently reduces the loading throughout the signal path. Determining the MSB(sign bit) from the held input data in advance of the data conversion period, a kind of the signed successive approximation, leads to the reduction of the sub-DAC hardware overhead by 1 bit and the conversion period by 1 cycle. Characterizing the proposed design in a 3.3 V $0.35-{\mu}m$ CMOS process by Spectre simulations verified its validity of the application to CCD analog front-ends.

A 1V 10b 30MS/s CMOS ADC Using a Switched-RC Technique (스위치-RC 기법을 이용한 1V 10비트 30MS/s CMOS ADC)

  • Ahn, Gil-Cho
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.46 no.8
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    • pp.61-70
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    • 2009
  • A 10b 30MS/s pipelined ADC operating under 1V power supply is presented. It utilizes a switched-RC based input sampling circuit and a resistive loop to reset the feedback capacitor in the multiplying digital-to-analog converter (MDAC) for the low-voltage operation. Cascaded switched-RC branches are used to achieve accurate grain of the MDAC for the first stage and separate switched-RC circuits are used in the sub-ADC to suppress the switching noise coupling to the MDAC input The measured differential and integral non-linearities of the prototype ADC fabricated in a 0.13${\mu}m$, CMOS process are less than 0.54LSB and 1.75LSB, respectively. The prototype ADC achieves 54.1dB SNDR and 70.4dB SFDR with 1V supply and 30MHz sampling frequency while consuming 17mW power.