• Journal of KIISE:Computer Systems and Theory
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• v.31 no.3_4
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• pp.160-169
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• 2004

With an emergence of SOC from developed IC technology, the VLSI design has required the core re-use technique and modular test development. To minimize the cost of testing SOC, an efficient method is required to optimize the test time and area overhead in conjunction for the core test wrapper, which is one of the important elements for SOC test architecture. In this paper, we propose an efficient design strategy of core test wrapper to achieve the minimum cost for SOC testing. The proposed strategy adopted advantages of traditional methods and more developed to be successfully used in practice.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.41 no.9
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• pp.97-106
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• 2004

A new test strategy for embedded SOC test is proposed. The SOC test is evaluated by the degree that is the amount of the total reduced test time. Since the test time for a embedded core is determined by the configuration of test wrapper, the total test time is decided by the length of the largest TAM used by the test wrapper. So the DFT(Design for Test) must be involved in the design flow. And the efficient test strategy must be settled. The all Previous test strategies are the methods that find a sub-optimal configurations of scan-chains to minimize the test time after the total TAM lines are divided into a few groups. But this is the NP-complete problem so that all attempts which examine such a TAM configuration and scan-chain division are impossible. In this thesis, a new methodology for this problem is proposed and the efficiency of the methodology is proved.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.41 no.3
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• pp.65-70
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• 2004

The SOC(System on Chip) testing has required the core re-use methodology and the efficiency of test method because of increase of its cost. The goal of SOC testing is to minimize the testing time, area overhead, and power consumption during testing. Prior research has concentrated on only one aspect of the test core wrapper design problem at a test time. Our research is concentrated on optimization of test time and area overhead for the core test wrapper, which is one of the important elements for SOC test architecture. In this paper, we propose an efficient wrapper design algorithm that improves on earlier approaches by also reducing the TAM(Test Access Mechanism) width required to achieve these lower testing times.

• The Journal of the Korea Contents Association
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• v.5 no.1
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• pp.229-236
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• 2005

Testing time and power consumption during testing System-On-a-Chip (SOC) are becoming increasingly important as the IP core increases in a SOC. We present a new algorithm to reduce the scan-in power and test data volume using the modified scan latch reordering. We apply scan latch reordering technique for minimizing the hamming distance in scan vectors. Also, during scan latch reordering, the don't care inputs in scan vectors are assigned for low power and high compression. Experimental results for ISCAS 89 benchmark circuits show that reduced test data and low power scan testing can be achieved in all cases.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.41 no.12
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• pp.83-90
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• 2004

This paper proposes an efficient scan testing method for compression of test input data and reduction of test power for SOC. The proposed method determines whether some parts of a test response can be reused as a part of next input test data on the analysis of deterministic test data and its response. Our experimental results show that benchmark circuits have a high similarity between un-compacted deterministic input test data and its response. The proposed testing method achieves the average of 29.4% reduction of power dissipation based on the number of test clock and 69.7% reduction of test data for ISCAS'89 benchmark circuits.

• Proceedings of the Korean Information Science Society Conference
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• 2003.10a
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• pp.208-210
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• 2003

본 논문은 SOC 내에 존재하는 코아들을 테스트하는 과정에서 개별 코아들의 테스트 조건을 기반으로 한 스케듈링을 통해 최적의 Test ing time을 구하는 연구이다. SOC 내에 존재하는 코아들은 주어지는 TAM(Test Access Mechanism) Width에 따라 각코아들의 Width가 달라지고, 최대 Width에서 최소 Width(1)까지 각 Width 별로 Testing time을 계산할 수 있다. 코아들의 각 Width 별 Testing time을 기존의 Rectangle Packing Algorithm을 수정, 보완하여 효율적으로 구성한 수정 Rectangle Packing Algorithm에 적응하여 최적의 Testing time을 구하는 것이 본 논문의 목적이다.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.39 no.12
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• pp.1045-1054
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• 2002

We present a new low power scan testing and test data compression mothod lot System-On-a-Chip (SOC). The don't cares in unspecified scan vectors are mapped to binary values for low Power and encoded by adaptive encoding method for higher compression. Also, the scan-in direction of scan vectors is determined for low power. Experimental results for full - scanned versions of ISCAS 89 benchmark circuits show that the proposed method has both low power and higher compression.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.39 no.9
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• pp.45-54
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• 2002

This paper proposes serial test data compression, a novel DFT scheme for embedded cores in SOC. To reduce test data amounts, share bit compression and fault undetectable fault pattern compression techniques was used. A Circuits using serial test data compression method are derived from a scan DFT method including a test-per-clock technique. For an experiment of the proposed compression method, full scan versions of ISCASS85 and ISCASS89 were used. ATALANTA has been used for ATPG and fault simulation. The amount of test data has been reduced by maximum 98% comparing with original data.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.44 no.12
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• pp.61-70
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• 2007

The density of Memory has been increased by great challenge for memory technology. Therefore, elements of memory become more smaller than before and the sensitivity to faults increases. As a result of these changes, memory testing becomes more complex. In addition, as the number of storage elements per chip increases, the test cost becomes more remarkable as the cost per transistor drops. Recent development in system-on-chip (SOC) technology makes it possible to incorporate large embedded memories into a chip. However, it also complicates the test process, since usually the embedded memories cannot be controlled from the external environment. Proposed design doesn't need controls from outside environment, because it integrates into memory. In general, there are a variety of memory modules in SOC, and it is not possible to test all of them with a single algorithm. Thus, the proposed scheme supports the various memory testing process. Moreover, it is able to At-Speed test in a memory module. consequently, the proposed is more efficient in terms of test cost and test data to be applied.

• Proceedings of the KIPE Conference
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• 2012.11a
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• pp.157-158
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• 2012

본 논문은 리튬 폴리머 배터리의 수명 감소에 대한 경향성 테스트를 토대로 이중 확장 칼만 필터(Dual EKF)를 이용하여 배터리의 SOC(State-of-Charge) 및 SOH(State-of-Charge) 방법을 제안하였다. 배터리에 수명에 따른 임피던스 변화를 테스트를 수행함으로써 등가회로 모델상에서 수명에 따른 변화가 가장 큰 내부 저항을 선택함으로써 배터리의 SOH 추정을 위해 선택하였다. 배터리 모델은 4.2V, 1440mAh의 리튬폴리머 전지에서 추출되었다. 배터리는 Bulk 커패시터, 두 개의 R-C회로, 직렬 저항을 사용하여 모델링하였다. Dual EKF를 모델에 적용하기 위해 캐패시터 전압은 개방 회로 전압(OCV)을 나타내는데 사용된다. Dual EKF는 충/방전 기기인 TOSCAT-5200에 의해 얻은 실험 데이터로 테스트하였다.