• Journal of the Korea Institute of Information and Communication Engineering
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• v.21 no.5
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• pp.899-905
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• 2017

This paper presents a reference-less dual loop clock and data recovery (CDR) circuit that supports a data rate of 2.496 Gb/s for the mobile industry processor interface (MIPI) M-PHY. An adaptive loop bandwidth scheme is used to implement the fast lock time maintaining a low time jitter. To this scheme, the proposed CDR consists of two loops for a frequency locked loop and a phase locked loop. The proposed 2.496 Gb/s reference-less dual loop CDR is designed using a 65 nm CMOS process with 1.2 V supply voltage. The simulated peak-to-peak jitter of output clock is 9.26 ps for the input data of 2.496 Gb/s pseudo-random binary sequence (PRBS) 15. The active area and power consumption of the implemented CDR are $470{\times}400{\mu}m^2$ and 6.49 mW, respectively.

• Journal of the Institute of Electronics Engineers of Korea SC
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• v.46 no.2
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• pp.72-77
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• 2009

In this paper, a 3.2Gb/s clock and data recovery (CDR) circuit for a high-speed serial data communication without the reference clock is described This CDR circuit consists of 5 parts as Phase and frequency detector(PD and FD), multi-phase Voltage Controlled-Oscillator(VCO), Charge-pumps (CP) and external Loop-Filter(KF). It is adapted the PD and FD, which incorporates a half-rate bang-bang type oversampling PD and a half-rate FD that can improve pull-in range. The VCO consists of four fully differential delay cells with rail-to-rail current bias scheme that can increase the tuning range and tuning linearity. Each delay cell has output buffers as a full-swing generator and a duty-cycle mismatch compensation. This materialized CDR can achieve wide pull-in range without an extra reference clock and it can be also reduced chip area and power consumption effectively because there is no additional Phase Locked- Loop(PLL) for generating reference clock. The CDR circuit was designed for fabrication using 0.18um 1P6M CMOS process and total chip area excepted LF is $1{\times}1mm^2$. The pk-pk jitter of recovered clock is 26ps at 3.2Gb/s input data rate and total power consumes 63mW from 1.8V supply voltage according to simulation results. According to test result, the pk-pk jitter of recovered clock is 55ps at the same input data-rate and the reliable range of input data-rate is about from 2.4Gb/s to 3.4Gb/s.

• Journal of Sensor Science and Technology
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• v.12 no.4
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• pp.191-197
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• 2003

Due to explosive increase of internet usage, broadband data transmission using optical fibers is broadly used. In order to decrease distortion during long distance transmission, the optical signal need to be restored, typically, by converting the optical signal into the electrical signal. The optical signal is converted into the electrical signal using a photo-diode, and then a clock-and-recovery (CDR) circuit is used to recover the clock and retime the data. In this study, a clock-and-data recovery circuit has been designed using a standard 1.8 V $0.18\;{\mu}m$ CMOS process. With this CDR circuit, the improved phase detector and charge pump have been utilized. Also, by using a ring oscillator, the CDR circuit can recover clock and data from broadband multi-rate data ranging between 750 Mb/s and 2.85 Gb/s.

• The Journal of Korean Institute of Communications and Information Sciences
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• v.28 no.8A
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• pp.644-649
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• 2003

Novel 622Mb/s burst-mode clock and data recovery (CDR) circuits with muxed oscillators are realized for passive optical network (PON) application. The CDR circuits are implemented with 0.35$\mu\textrm{m}$ CMOS process technology. Lock is accomplished on the first data transition and data are sampled in the optimal point. The experimental results show that the proposed CDR circuits recover the incoming 400Mbps-680Mbps burst mode input data without error.

• Journal of IKEEE
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• v.14 no.1
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• pp.40-46
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• 2010

This paper describes a clock and data recovery (CDR) circuit that supports dual data rates of 2.7Gbps and 1.62Gbps for DisplayPort standard. The proposed CDR has a dual mode voltage-controlled oscillator (VCO) that changes the operating frequency with a "Mode" switch control. The chip has been implemented using $0.18{\mu}m$ CMOS process. Measured results show the circuit exhibits peak-to-peak jitters of 37ps(@2.7Gbps) and 27ps(@1.62Gbps) in the recovered data. The power dissipation is 80mW at 2.7Gbps rate from a 1.8V supply.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.45 no.4
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• pp.21-26
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• 2008

In this paper, a novel 622Mbps burst-mode clock and data recovery (CDR) circuit is proposed for passive optical network (PON) applications. The CDR circuits are implemented with 0.35um CMOS process technology. Locking dynamics is accomplished with instantaneous feature and data are sampled at an optimal timing. This is realized by seven different delay configurations, which are generated from precisely-controlled delay buffers. The experimental results show that the proposed CDR circuits are operating as expected, recovering an incoming 622Mbps burst-mode input data without errors.

• Journal of the Institute of Electronics Engineers of Korea SC
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• v.46 no.1
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• pp.82-86
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• 2009

This work is design of clock and data recovery circuit using system clock. This circuit is composed by PLL(Phase Locked Loop) to make system clock and data recovery circuit. The data recovery circuit using 1/4-rate phase picking Detector helps to reduce clock frequency. It is advantageous for high speed PLL. It can achieve a low jitter operation. The designed CDR(Clock and data recovery) has been designed in a standard $0.18{\mu}m$ 1P6M CMOS technology and an active area $1{\times}1mm^2$.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.46 no.9
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• pp.7-13
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• 2009

This paper presents a multi-channel transceiver that achieves a data rate of 3.125Gb/s/ch. The LVDS is used because of its noise immunity and low power consumption. And a pre-emphasis circuit is also proposed to increase the transmitter speed. On the receiver side, a low-power CDR(clock and data recovery) using 1/4-rate clock based on dual-interpolator is proposed. The CDR generates needed additional clocks in each recovery part internally using only inverters. Therefore each part can be supplied with the same number of 1/4-rate clocks from a clock generator as in 1/2-rate clock method. Thus, the reduction of a clock frequency relaxes the speed limitation and lowers power dissipation. The prototype chip is comprised of two channels and was fabricated in a $0.18{\mu}m$ standard CMOS process. The output jitter of transmitter is loops, peak-to-peak(0.31UI) and the measured recovered clock jitter is 47.33ps, peak-to-peak which is equivalent to 3.7% of a clock period. The area of the chip is $3.5mm^2$ and the power consumption is about 119mW/ch.

• Proceedings of the IEEK Conference
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• 2003.07b
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• pp.1193-1196
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• 2003

This paper proposes a 2x oversampling method with a smart sampling for a clock and data recovery(CDR) circuit in a 2.5Gbps serial data link. In the conventional 2x oversampling method, the "bang-bang" operation of the phase detection produces a systematic jitter in CDR. The smart sampling in phase detection helps the CDR to remove the "bang-bang" operation and to improve the jitter performance. The CDR with the proposed 2x oversampling method is designed using Samsung 0.25${\mu}{\textrm}{m}$ process parameters and verified by simulation. Simulation result shows the proposed 2x oversampling method removes the systematic jitter.e systematic jitter.

• Journal of IKEEE
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• v.23 no.3
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• pp.858-864
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• 2019

A clock system is proposed to eliminate data loss due to frequency difference between sensor nodes in a sensor utility network. The proposed clock system for each sensor node consists of a bust clock-data recovery (CDR) circuit, a digital phase-locked loop outputting a 32-phase clock, and a digital frequency synthesizer using a programmable open-loop fractional divider. A CMOS oscillator using an active inductor is used instead of a burst CDR circuit for the first sensor node. The proposed clock system is designed by using a 65 nm CMOS process with a 1.2 V supply voltage. When the frequency error between the sensor nodes is 1%, the proposed burst CDR has a time jitter of only 4.95 ns with a frequency multiplied by 64 for a data rate of 5 Mbps as the reference clock. Furthermore, the frequency change of the designed digital frequency synthesizer is performed within one period of the output clock in the frequency range of 100 kHz to 320 MHz.