• Title/Summary/Keyword: tunneling field-effect transistor

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Guide Lines for Optimal Structure of Silicon-based Pocket Tunnel Field Effect Transistor Considering Point and Line Tunneling (포인트 터널링과 라인 터널링을 모두 고려한 실리콘 기반의 포켓 터널링 전계효과 트랜지스터의 최적 구조 조건)

  • Ahn, Tae-Jun;Yu, Yun Seop
    • Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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    • 2016.10a
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    • pp.167-169
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    • 2016
  • The structure guide lines of pocket tunnel field effect transistor(TFET) considering Line and Point tunneling are introduced. As the pocket doping concentration or thickness increase, on-current $I_{on}$ increases. As the pocket thickness or gate insulator increase, subthreshold swing(SS) increases. Optimal structure reducing the hump effects should be proposed in order to enhance SS.

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Compact Model of Tunnel Field-Effect-Transistors

  • Najam, Faraz;Yu, Yun Seop
    • Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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    • 2016.05a
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    • pp.160-162
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    • 2016
  • A compact model of tunnel field effect transistor (TFET) has been developed. The model includes a surface potentia calculation module and a band-to-band-tunneling current module. Model comparison with TCAD shows that the mode calculates TFET surface potential and drain current accurately.

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The Optimal Design of Junctionless Transistors with Double-Gate Structure for reducing the Effect of Band-to-Band Tunneling

  • Wu, Meile;Jin, Xiaoshi;Kwon, Hyuck-In;Chuai, Rongyan;Liu, Xi;Lee, Jong-Ho
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.13 no.3
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    • pp.245-251
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    • 2013
  • The effect of band-to-band tunneling (BTBT) leads to an obvious increase of the leakage current of junctionless (JL) transistors in the OFF state. In this paper, we propose an effective method to decline the influence of BTBT with the example of n-type double gate (DG) JL metal-oxide-semiconductor field-effect transistors (MOSFETs). The leakage current is restrained by changing the geometrical shape and the physical dimension of the gate of the device. The optimal design of the JL MOSFET is indicated for reducing the effect of BTBT through simulation and analysis.

Analytical Surface Potential Model with TCAD Simulation Verification for Evaluation of Surrounding Gate TFET

  • Samuel, T.S. Arun;Balamurugan, N.B.;Niranjana, T.;Samyuktha, B.
    • Journal of Electrical Engineering and Technology
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    • v.9 no.2
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    • pp.655-661
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    • 2014
  • In this paper, a new two dimensional (2D) analytical modeling and simulation for a surrounding gate tunnel field effect transistor (TFET) is proposed. The Parabolic approximation technique is used to solve the 2-D Poisson equation with suitable boundary conditions and analytical expressions for surface potential and electric field are derived. This electric field distribution is further used to calculate the tunneling generation rate and thus we numerically extract the tunneling current. The results show a significant improvement in on-current characteristics while short channel effects are greatly reduced. Effectiveness of the proposed model has been confirmed by comparing the analytical results with the TCAD simulation results.

Structure Guide Lines of Silicon-based Pocket Tunnel Field Effect Transistor (실리콘 기반 포켓 구조 터널링 전계효과 트랜지스터의 최적 구조 조건)

  • Ahn, Tae-Jun;Yu, Yun Seop
    • Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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    • 2016.05a
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    • pp.166-168
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    • 2016
  • This paper introduces about the structure guide lines of pocket tunneling Field effect transistor. As the pocket length or thickness increase, on-current $I_{on}$ increases. As the pocket thickness is less than 3nm, subthreshold swing (SS) increase. As the dielectric constants of the gate insulator increases, the performance of on-current and subthreshold swing enhances.

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Simulation of metal-semiconductor contact properties for high-performance monolayer MoS2 field effect transistor

  • Park, Ji-Hun;U, Yeong-Jun;Seo, Seung-Beom;Choe, Seong-Yul
    • Proceeding of EDISON Challenge
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    • 2016.03a
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    • pp.299-304
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    • 2016
  • 2차원 반도체 소재의 경우 물질종류마다 내포하고 있는 고유결함에 의해서 Fermi-Level Pinning 이 발생하여 이로 인한 Schottky Barrier transistor로 동작을 하게 되며, 이는 접합부에 Carrier Injection 정도와 Schottky Barrier을 통과하는 Tunneling 정도에 의해서 소자의 특성이 결정 된다. 본 연구에서는 시뮬레이션을 통하여 2차원 반도체인 $MoS_2$소자를 설계하고, S/D Doping에 따라 접촉 저항 개선 효과와 소자의 동작특성이 어떠한 영향을 미치는지 연구하여 최대 $250cm^2/V{\cdot}sec$의 field effect mobility 의 결과를 얻었다. 또한 S/D doping 에 따라 각 저항 성분의 영향을 분석하였으며 면저항 및 접촉 저항 둘 다 doping 농도가 증가함에 따라 감소하는 결과를 나타내며, S/D doping의 영향은 접촉저항에서 더 크게 나타났다. 더불어 2차원 반도체의 Resistance network model 을 제안하여 subthreshold 영역에서는 $R_{ic}$, saturation 영역에서는 $R_{ish}$ 가 전체저항에서 주요한 변수로 전체저항식에 포함되어야 한다는 것을 시뮬레이션을 통해서 검증하였다.

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Quantum Simulation Study on Performance Optimization of GaSb/InAs nanowire Tunneling FET

  • Hur, Ji-Hyun;Jeon, Sanghun
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.16 no.5
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    • pp.630-634
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    • 2016
  • We report the computer aided design results for a GaSb/InAs broken-gap gate all around nanowire tunneling FET (TFET). In designing, the semi-empirical tight-binding (TB) method using $sp3d5s^*$ is used as band structure model to produce the bulk properties. The calculated band structure is cooperated with open boundary conditions (OBCs) and a three-dimensional $Schr{\ddot{o}}dinger$-Poisson solver to execute quantum transport simulators. We find an device configuration for the operation voltage of 0.3 V which exhibit desired low sub-threshold swing (< 60 mV/dec) by adopting receded gate configuration while maintaining the high current characteristic ($I_{ON}$ > $100 {\mu}A/{\mu}m$) that broken-gap TFETs normally have.

Investigation of InAs/InGaAs/InP Heterojunction Tunneling Field-Effect Transistors

  • Eun, Hye Rim;Woo, Sung Yun;Lee, Hwan Gi;Yoon, Young Jun;Seo, Jae Hwa;Lee, Jung-Hee;Kim, Jungjoon;Kang, In Man
    • Journal of Electrical Engineering and Technology
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    • v.9 no.5
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    • pp.1654-1659
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    • 2014
  • Tunneling field-effect transistors (TFETs) are very applicable to low standby-power application by their virtues of low off-current ($I_{off}$) and small subthreshold swing (S). However, low on-current ($I_{on}$) of silicon-based TFETs has been pointed out as a drawback. To improve $I_{on}$ of TFET, a gate-all-around (GAA) TFET based on III-V compound semiconductor with InAs/InGaAs/InP multiple-heterojunction structure is proposed and investigated. Its performances have been evaluated with the gallium (Ga) composition (x) for $In_{1-x}Ga_xAs$ in the channel region. According to the simulation results for $I_{on}$, $I_{off}$, S, and on/off current ratio ($I_{on}/I_{off}$), the device adopting $In_{0.53}Ga_{0.47}As$ channel showed the optimum direct-current (DC) performance, as a result of controlling the Ga fraction. By introducing an n-type InGaAs thin layer near the source end, improved DC characteristics and radio-frequency (RF) performances were obtained due to boosted band-to-band (BTB) tunneling efficiency.

Design of Double-Independent-Gate Ambipolar Silicon-Nanowire Field Effect Transistor (양극성 이중 독립 게이트 실리콘 나노와이어 전계 효과 트랜지스터 설계)

  • Hong, Seong-Hyeon;Yu, YunSeop
    • Journal of the Korea Institute of Information and Communication Engineering
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    • v.19 no.12
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    • pp.2892-2898
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    • 2015
  • We propose a new Double-Independent-Gate Ambipolar Silicon-Nanowire Field Effect Transistor(DIG Ambi-SiNWFET). The proposed transistor has two types of gate such as polarity gate and control gate. The polarity gate determines the operation that the gate bias controls NMOSFET or PMOSFET. The voltage of control gate controls the current characteristic of the transistor. We investigated systematically work functions of the two gates and source/drain to operate ambipolar current-voltage characteristics using 2D device simulator. When the work functions of polarity gate, control gate and source/drain are 4.75eV, 4.5eV, and 4.8eV, respectively, it showed the obvious ambipolar characteristics.

CNT-TFET을 이용한 저전력 인버터 설계

  • Jin, Ik-Gyeong;Jeong, U-Jin
    • Proceeding of EDISON Challenge
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    • 2015.03a
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    • pp.350-353
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    • 2015
  • 최근 에너지 효율과 소형화측면에서 한계를 보이는 Metal-Oxide-Semiconductor Field-Effect Transistor(MOSFET)을 대체할 수 있는 소자로 Tunneling FET(TFET)이 주목받고 있다. 본 논문에서는 탄소나노튜브(Carbon Nanotube, CNT) TFET을 시뮬레이션하여 전자회로의 기본 단위인 인버터(Inverter)를 설계한다. 설계한 인버터의 성능을 CNT-MOSFET 인버터와 비교하여 저전력 디지털 회로로써의 가능성을 확인한다.

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