• Title/Summary/Keyword: PEEC model

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Electrical Parameter Extraction of High Performance Package Using PEEC Method

  • Pu, Bo;Lee, Jung-Sang;Nah, Wan-Soo
    • Journal of electromagnetic engineering and science
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    • v.11 no.1
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    • pp.62-69
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    • 2011
  • This paper proposes a novel electrical characterization approach for a high-performance package system using an improved Partial Element Equivalent Circuit (PEEC). As the effect of interconnects becomes a pivotal factor for the performance of high-speed electronic systems, there is a great demand for an accurate equivalent model for interconnects. In particular, an equivalent model of interconnects is established in this paper for the Fine-Pitch Ball Grid Array (FBGA) package using the improved PEEC method. Based on the equivalent model, electrical characteristics are analyzed; furthermore, these are verified through the measurement results of a Vector Network Analyzer (VNA).

Novel Power Bus Design Method for High-Speed Digital Boards (고속 디지털 보드를 위한 새로운 전압 버스 설계 방법)

  • Wee, Jae-Kyung
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.43 no.12 s.354
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    • pp.23-32
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    • 2006
  • Fast and accurate power bus design (FAPUD) method for multi-layers high-speed digital boards is devised for the power supply network design tool for accurate and precise high speed board. FAPUD is constructed, based on two main algorithms of the PBEC (Path Based Equivalent Circuit) model and the network synthesis method. The PBEC model exploits simple arithmetic expressions of the lumped 1-D circuit model from the electrical parameters of a 2-D power distribution network. The circuit level design based on PBEC is carried with the proposed regional approach. The circuit level design directly calculates and determines the size of on-chip decoupling capacitors, the size and the location of off-chip decoupling capacitors, and the effective inductances of the package power bus. As a design output, a lumped circuit model and a pre-layout of the power bus including a whole decoupling capacitors are obtained after processing FAPUD. In the tuning procedure, the board re-optimization considering simultaneous switching noise (SSN) added by I/O switching can be carried out because the I/O switching effect on a power supply noise can be estimated over the operation frequency range with the lumped circuit model. Furthermore, if a design changes or needs to be tuned, FAPUD can modify design by replacing decoupling capacitors without consuming other design resources. Finally, FAPUD is accurate compared with conventional PEEC-based design tools, and its design time is 10 times faster than that of conventional PEEC-based design tools.

Circuit Modeling of Interdigitated Capacitors Fabricated by High-K LTCC Sheets

  • Kim, Kil-Han;Ahn, Min-Su;Kang, Jung-Han;Yun, Il-Gu
    • ETRI Journal
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    • v.28 no.2
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    • pp.182-190
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    • 2006
  • The circuit modeling of interdigitated capacitors fabricated by high-k low-temperature co-fired ceramic (LTCC) sheets was investigated. The s-parameters of each test structure were measured from 50 MHz to 10 GHz, and the modeling was performed using these measured sparameters up to the first resonant frequency. Each test structure was divided into appropriate building blocks. The equivalent circuit of each building block was composed based on the partial element equivalent circuit (PEEC) method. Modeling was executed to optimize the parameters in the equivalent circuit of each building block. The validity of the extracted parameters was verified by the predictive modeling for the test structures with different geometry. After that, Monte Carlo analysis and sensitivity analysis were performed based on the extracted parameters. The modeling methodology can allow a device designer to improve the yield and to save time and cost for the design and manufacturing of devices.

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Characterization of Interdigitated Capacitors for Integrated Circuit Application (집적회로 응용을 위한 빗살형 캐패시터의 특성연구)

  • Kim, Kil-Han;Lee, Kyu-Bok;Kim, Jong-Kyu;Yun, Il-Gu
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2004.07a
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    • pp.130-133
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    • 2004
  • The characterization of interdigitated capacitors was investigated. The test structures are manufactured by low temperature co-fired ceramic(LTCC) process and their s-parameters were measured. The optimized equivalent circuit models for test structures were obtained using the partial element equivalent circuit(PEEC) method. Predictive modeling was performed on different test structures using optimized parameters to verify the circuit models. From this result, the manufacturability on the process can be improved through the predictive modeling for the characteristics of interdigitated capacitors.

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Characterization of High-K Embedded Capacitor in Low Temperature Co-fired Ceramic (고 유전율 저온 동시 소성 세라믹으로 제작된 초고주파용 캐패시터의 특성연구)

  • Ahn, Min-Su;Kang, Jung-Han;Yun, Il-Gu
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2005.07a
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    • pp.57-58
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    • 2005
  • The properties such as capacitance and resonant frequency are important in embedded capacitors. Accurate equivalent model is required to find these properties of embedded capacitor. In this paper, we investigate to analyze the properties of high-K embedded capacitor which was fabricated by Low Temperature Co-fired Ceramic (LTCC). Modeling based on partial element equivalent circuit (PEEC) method is performed using HSPICE circuit simulation. This modeling methodology can provide the good inspection of embedded capacitor to device engineer.

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Characterization of Exposed interdigitated Capacitor in Low Temperature Co-fired Ceramic (저온 동시 소성세라믹으로 제작된 노출형 교차전극형 캐패시터의 특성 연구)

  • Ahn, Min-Su;Kang, Jung-Han;Yun, Il-Gu
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2006.06a
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    • pp.38-39
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    • 2006
  • In this paper, we describe a method of accurate modeling capacitor in Low Temperature Co-fired Ceramic(LTCC). We obtain building blocks that present characterization of test structure through partial element equivalent circuit (PEEC) method. The extracted model of building blocks can be used for predicting behaviors of capacitors with different geometries. This method can provide the good inspection of capacitor to device engineer.

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Characterization of Embedded Inductors using Partial Element Equivalent Circuit Models (부분등가회로모델을 이용한 매립형 인덕터의 특성 연구)

  • 신동욱;오창훈;이규복;김종규;윤일구
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.16 no.5
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    • pp.404-408
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    • 2003
  • The characterization for several multi-layer embedded inductors with different structures was investigated. The optimized equivalent circuit models for several test structures were obtained from HSPICE. Building blocks are modeled using Partial element equivalent circuit method. The mean and the standard deviation of model parameters were extracted and predictive modeling was performed on different test structure. From this study, the characteristic of multi-layer inductors can be predicted.

Layout-Based Inductance Model for On-Chip Power Distribution Grid Structures (레이아웃 기반 온-칩 전력 분배 격자 구조의 인덕턴스 모델 개발 및 적용)

  • Jo, JeongMin;Kim, SoYoung
    • Journal of the Institute of Electronics and Information Engineers
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    • v.49 no.9
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    • pp.259-269
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    • 2012
  • With the lower supply voltage and the higher operating frequency in integrated circuits, the analysis of the power distribution network (PDN) including on-chip inductances becomes more important. In this paper, an effective inductance extraction method for a regular on-chip power grid structure is proposed. The loop inductance model applicable to chip layout is proposed and the inductance extraction tool using the proposed inductance model based on post layout RC circuits is developed. The accuracy of the proposed loop model and the developed tool is verified by comparing the test circuit simulation results with those from the partial element equivalent circuit (PEEC) model. The voltage fluctuation from the RLC circuits extracted by the developed tool was examined for the analysis of on-chip inductance effects. The significance of on-chip power grid inductance was investigated by the co-simulation of chip-package-PCB.

Simulation &Analysis of Conducted EMI in Switched Mode Power Supplies (스위치 모드 파워 서플라이에서의 전도 전자파 장애의 시뮬레이션과 분석)

  • Lee, Dong-Young;Lee, Jae-Ho;Min, Seung-Hyeon;Cho, Bo-Hyung
    • The Transactions of the Korean Institute of Electrical Engineers B
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    • v.50 no.3
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    • pp.122-129
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    • 2001
  • Exact simulation of conducted EMI in switched mode power supplies is proposed. In order to achieve exact simulation, PSPICE active component ABM model and modified transformer model are proposed. Each model parameter is extracted from measurements and data-books. PSPICE simulation results with high frequency PCB pattern model are accordant with EMI measurements for a 50[W] isolated flyback converter. EMI relations of each component and EMI patterns are analyzed.

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Characteristic Prediction and Analysis of 3-D Embedded Passive Devices (3차원 매립형 수동소자의 특성 예측 및 분석에 대한 연구)

  • Shin, Dong-Wook;Oh, Chang-Hoon;Lee, Kyu-Bok;Kim, Jong-Kyu;Yun, Il-Gu
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2003.07b
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    • pp.607-610
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    • 2003
  • The characteristic prediction and analysis of 3-dimensional (3-D) solenoid-type embedded inductors is investigated. The four different structures of 3-D inductor are fabricated by using low-temperature cofired ceramic (LTCC) process. The circuit model parameters of the each building block are optimized and extracted using the partial element equivalent circuit method and HSPICE circuit simulator. Based on the model parameters, predictive modeling is applied for the structures composed of the combination of the modeled building blocks. And the characteristics of test structures, such as self-resonant frequency, inductance and Q-factor, are analyzed. This approach can provide the characteristic conception of 3-D solenoid embedded inductors for structural variations.

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