• Journal of Ginseng Research
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• v.20 no.3
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• pp.226-232
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• 1996

This study was performed to investigate the effect of red ginseng extract including some vitamin B groups as test drug on learning and memory in mice. Single and repeated administrations of the test drug improved the acquisition and the process of consolidation in the tests using step-through and step-down apparatus, indicating this test drug improved learning and memory. However, the test drug did not improve scopolamine-induced amnesia. These results suggest that test drug may be useful as a nootropic agent.

• Proceedings of the KIEE Conference
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• 2004.05a
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• pp.153-155
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• 2004

In this paper, we design the memory tester chip playing an important role in the memory tester as central parts. Memory tester has the sixteen inner instructions to control the test sequence and the address and data signals to DUT. These instructions are saved in memory with each block such as sequencer and pattern generator. Sequencer controls the test sequence according to instructions saved in the memory. And Pattern generator generates the address and data signals according to instructions saved in the memory, too. We can use these chips for various functional test of memory.

• Journal of the Institute of Electronics and Information Engineers
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• v.51 no.12
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• pp.72-82
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• 2014

Recently, the size of semiconductor industry market is constantly growing, due to the increase in diffusion of smart-phone, tablet PC and SSD(Solid State Drive). Also, it is expected that the demand for TLC NAND-type flash memory would gradually increase, with the recent release of TLC NAND-type flash memory in the SSD market. There have been a lot of studies on SLC NAND flash memory, but no research on TLC NAND flash memory has been conducted, yet. Also, a test of NAND-type flash memory is depending on a high-priced external equipment. Therefore, this study aims to suggest a structure for an autonomous test with no high-priced external test device by modifying the existing SLC NAND flash memory and MLC NAND flash memory test algorithms and patterns and applying them to TLC NAND flash memory.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.49 no.8
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• pp.55-62
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• 2012

The development of memory design and process technology enabled the production of high density memory. As the weight of embedded memory within aggregate Systems-On-Chips(SoC) gradually increases to 80-90% of the number of total transistors, the importance of testing embedded dual-port memories in SoC increases. This paper proposes a new micro-code based programmable memory Built-In Self-Test(PMBIST) architecture for dual-port memories that support test various test algorithms. In addition, various test algorithms including March based algorithms and dual-port memory test algorithms are efficiently programmed through the proposed algorithm instruction set. This PMBIST has an optimized hardware overhead, since test algorithm can be implemented with the minimum bits by the optimized algorithm instructions.

• Journal of Oriental Neuropsychiatry
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• v.25 no.3
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• pp.243-252
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• 2014

Objectives: This study was designed to investigate the dose-dependent effects of Gastrodia elata Blume for memory improvement. Methods: This study was a 12-weeks, double blind, and comparative clinical study. Those who were eligible worked with a group of healthy seniors, all 60 years of age or older. 22 subjects were randomized either to Gastrodia elata Blume powder form that was steeped in hot water or placebo. We measured the faculty of memory by using MMSE-K, Digit Span, Letter Fluency Test, Word List Memory Test, and Trail Making Test, and again after 12 weeks. Results: 1) Neither Gastrodia elata Blume groups nor control have a difference in MMSE-K, Digit Span, Letter Fluency Test, and Trail Making Test. 2) Gastrodia elata Blume group showed significant advances in immediate recall 1 and 2 of Word List Memory Test, and 3 g group show better results than the 4 g group. 3) 4 g Gastrodia elata Blume group showed significant advances in the recognition of Word List Memory Test. Conclusions: The results suggest that positive effects on memory improvement due to Gastrodia elata Blume depend on the amount.

• Journal of KIISE:Computer Systems and Theory
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• v.34 no.12
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• pp.618-629
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• 2007

In this paper, we propose an effective memory test environment, called a virtualized kernel, for 64bit multi-core computing environments. The term of effectiveness means that we can test all of the physical memory space, even the memory space occupied by the kernel itself, without rebooting. To obtain this capability, our virtualized kernel provides four mechanisms. The first is direct accessing to physical memory both in kernel and user mode, which allows applying various test patterns to any place of physical memory. The second is making kernel virtualized so that we can run two or more kernel image at the different location of physical memory. The third is isolating memory space used by different instances of virtualized kernel. The final is kernel hibernation, which enables the context switch between kernels. We have implemented the proposed virtualized kernel by modifying the latest Linux kernel 2.6.18 running on Intel Xeon system that has two 64bit dual-core CPUs with hyper-threading technology and 2GB main memory. Experimental results have shown that the two instances of virtualized kernel run at the different location of physical memory and the kernel hibernation works well as we have designed. As the results, the every place of physical memory can be tested without rebooting.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.45 no.2
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• pp.69-81
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• 2008

The density of Memory has been increased by great challenge for memory technology, so elements of memory become smaller than before and the sensitivity to faults increases. As a result of these changes, memory testing becomes more complex. The number of storage elements is increased per chip, and the cost of test becomes more remarkable as the cost per transistor drops. Proposed design doesn't need to control from outside environment, because it integrates into memory. The proposed scheme supports the various memory testing algorithms. Consequently, the proposed one is more efficient in terms of test cost and test data to be applied. Moreover, we proposed a reallocation algorithm for faulty memory parts. It has an efficient reallocation scheme with row and column redundant memory. Previous reallocation information is obtained from faulty memory every each tests. However proposed scheme avoids to this problem. because onetime test result from reallocation information can save to flash memory. In this paper, a reallocation scheme has been increased efficiency because of using flash memory.

• The Journal of Korea Institute of Information, Electronics, and Communication Technology
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• v.4 no.3
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• pp.209-216
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• 2011

Recently the design of SoCs(System-on-Chips) in which TCM is embedded for high speed operation increases rapidly. In this paper, a parallel test structure for eDRAM-based TCM embedded in SoCs is proposed. In the presented technique, the MUT (Memory Under Test) is changed to parallel structure and it increases testability of MUT with boundary scan chains. The eDRAM is designed in structure for parallel test so that it can be tested for each modules. Dynamic test can be performed based on input-output data. The proposed techniques are verified their performance by circuits simulation.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.44 no.2
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• pp.72-85
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• 2007

The development of memory design and process technology enabled the production of high density memory. However, this increased the complexity of the memory making memory testing more complicated, and as a result, it brought about an increase in memory testing costs. Effective memory test algorithm must detect various types of defects within a short testing time, and especially in the case of port memory test algorithm, it must be able to detect single port memory defects, and all the defects in the dual port memory. The March A2PF algorithm proposed in this paper is an effective test algorithm that detects all types of defects relating to the duel port and single port memory through the short 18N test pattern.

• Proceedings of the IEEK Conference
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• 2008.06a
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• pp.491-492
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• 2008

According to high-speed large scale integration trend of Memory module product, many type of noises, such a reflection, cross-talk simultaneous switching noise, occur on the Package PCB and they make the deterioration of memory module's performance and reliability. As module products have more high efficiency, Hardware of test board and socket has to be considered In test of the high-speed Memory Module. we mainly focused on improvement of Signal integrity Using the High Frequency Test socket that we invented