Journal of the Institute of Electronics Engineers of Korea SD (대한전자공학회논문지SD)

The Institute of Electronics and Information Engineers (대한전자공학회)
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An Efficiency Testing Algorithm for Realistic Faults in Dual-Port Memories

이중 포트 메모리의 실제적인 고장을 고려한 효율적인 테스트 알고리즘

  • Park, Young-Kyu (Department of Electrical and Electronic Engineering, Yonsei University) ;
  • Yang, Myung-Hoon (Department of Electrical and Electronic Engineering, Yonsei University) ;
  • Kim, Yong-Joon (Department of Electrical and Electronic Engineering, Yonsei University) ;
  • Lee, Dae-Yeal (Department of Electrical and Electronic Engineering, Yonsei University) ;
  • Kang, Sung-Ho (Department of Electrical and Electronic Engineering, Yonsei University)
  • 박영규 (연세대학교 전기전자공학과) ;
  • 양명훈 (연세대학교 전기전자공학과) ;
  • 김용준 (연세대학교 전기전자공학과) ;
  • 이대열 (연세대학교 전기전자공학과) ;
  • 강성호 (연세대학교 전기전자공학과)
  • Published : 2007.02.25
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Abstract

The development of memory design and process technology enabled the production of high density memory. However, this increased the complexity of the memory making memory testing more complicated, and as a result, it brought about an increase in memory testing costs. Effective memory test algorithm must detect various types of defects within a short testing time, and especially in the case of port memory test algorithm, it must be able to detect single port memory defects, and all the defects in the dual port memory. The March A2PF algorithm proposed in this paper is an effective test algorithm that detects all types of defects relating to the duel port and single port memory through the short 18N test pattern.

메모리 설계 기술과 공정기술의 발달은 고집적 메모리의 생산을 가능하게 하였다. 그러나 이는 메모리의 복잡도를 증가시켜 메모리 테스트를 더욱 복잡하게 하여, 결과적으로 메모리 테스트 비용의 증가를 가져왔다. 효과적인 메모리 테스트 알고리즘은 짧은 테스트 시간동안 다양한 종류의 고장을 검출하여야 하며, 특히 이중 포트 메모리 테스트 알고리즘의 경우에는 단일 포트 메모리의 고장과 이중 포트 메모리 고장을 모두 검출할 수 있어야 한다. 본 논문에서 제안하는 March A2PF 알고리즘은 18N의 짧은 테스트 패턴을 통해 이중 포트 및 단일 포트 메모리와 관련된 모든 종류의 고장을 검출하는 효과적인 테스트 알고리즘이다.

Keywords

References

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