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http://dx.doi.org/10.5573/ieie.2014.51.12.072

TLC NAND-type Flash Memory Built-in Self Test  

Kim, Jin-Wan (Department of computing, Soongsil University)
Chang, Hoon (Department of computing, Soongsil University)
Publication Information
Journal of the Institute of Electronics and Information Engineers / v.51, no.12, 2014 , pp. 72-82 More about this Journal
Abstract
Recently, the size of semiconductor industry market is constantly growing, due to the increase in diffusion of smart-phone, tablet PC and SSD(Solid State Drive). Also, it is expected that the demand for TLC NAND-type flash memory would gradually increase, with the recent release of TLC NAND-type flash memory in the SSD market. There have been a lot of studies on SLC NAND flash memory, but no research on TLC NAND flash memory has been conducted, yet. Also, a test of NAND-type flash memory is depending on a high-priced external equipment. Therefore, this study aims to suggest a structure for an autonomous test with no high-priced external test device by modifying the existing SLC NAND flash memory and MLC NAND flash memory test algorithms and patterns and applying them to TLC NAND flash memory.
Keywords
Memory Test; Built-in Self Test; NAND Flash; SoC;
Citations & Related Records
Times Cited By KSCI : 2  (Citation Analysis)
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