• Proceedings of the IEEK Conference
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• 2008.06a
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• pp.389-390
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• 2008

The dependence of $f_T$ and $f_{max}$ on the unit finger width is measured and analyzed for $0.13{\mu}m$ MOSFETs. The increase of $f_T$ at narrow width is attributed by the parasitic gate-bulk capacitance, and the decrease of $f_T$ at wide width is generated by the reduction of increasing rate of $g_{mo}$. The increase of $f_{max}$ at narrow width is originated from the abrupt reduction of gate resistance due to the non-quasi-static effect. These analysis results will be valuable information for layout optimization to improve $f_T$ and $f_{max}$.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2000.11a
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• pp.405-408
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• 2000

We designed and fabricated VCO using inductive reactance variation at 2GHz. A varactor diode is one of the main devices in VCO, which varies capacitance depending on reverse voltage. In this paper, a varactor diode is not used as a variable capacitive reactance device but as an inductive device. The circuit design and simulation have been carried out using HP-MDS. The fabricated VCO is measured using the HP 8532B spectrum analyzer and the HP 4352B VCO/PLL analyzer. The experimental result shows the phase noise -110dBc/Hz at a 100kHz offset frequency, the control voltage sensitivity of 23MHz/V and a -3.5dBm output power with a D.C. current consumption of 5.9mA. The simulation and measurements show exact agreement except with regard to the oscillation frequency. The measured oscillation frequency is lower than the simulation result because there is some parasitic inductance in the PCB layout.

• The Transactions of the Korean Institute of Power Electronics
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• v.24 no.3
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• pp.201-206
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• 2019

This study presents the design and experimental result of a GaN-based DC-DC converter with an integrated gate driver. The GaN device is attractive to power electronic applications due to its superior device performance. However, the switching loss of a GaN-based power converter is susceptible to the common source inductance, and converter efficiency is severely degraded with a large loop inductance. The objective of this study is to achieve high-efficiency power conversion and the highest power density using a multiphase integrated half-bridge GaN solution with minimized loop inductance. Before designing the converter, several GaN and Si devices were compared and loss analysis was conducted. Moreover, the impact of common source inductance from layout parasitic inductance was carefully investigated. Experimental test was conducted in buck mode operation at 48 -12 V, and results showed a peak efficiency of 97.8%.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.12 no.3
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• pp.517-526
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• 2008

A one-chip DC-DC converter circuit for OLED(Organic Light-Emitting Diode) display module of automotive clusters is newly proposed. OLED panel driving voltage circuit, which is a charge-pump type, has improved characteristics in miniaturization, low cost and EMI(Electro-Magnetic Interference) compared with DC-DC converter of PWM(Pulse Width Modulator) type. By using bulk-potential biasing circuit, charge loss due to parasitic PNP BJT formed in charge pumping, is prevented. In addition, the current dissipation in start-up circuit of band-gap reference voltage generator is reduced by 42% and the layout area of ring oscillator is reduced by using a logic voltage VLP in ring oscillator circuit using VDD supply voltage. The driving current of VDD, OLED driving voltage, is over 40mA, which is required in OLED panels. The test chip is being manufactured using $0.25{\mu}m$ high-voltage process and the layout area is $477{\mu}m{\times}653{\mu}m$.

• The Journal of Korean Institute of Electromagnetic Engineering and Science
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• v.18 no.4 s.119
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• pp.364-371
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• 2007

In this paper, the design and implementation of high-power PIN diode switch modules and high-speed switch driver circuits are presented for Wibro base stations. To prevent isolation degradation due to parasitic inductances of conventional packaged PIN diodes and to improve power handling capabilities of the switch modules, bare diode chips are used and carefully placed in a PCB layout, which makes bonding wire inductances to be absorbed in the impedance of a transmission line. The switch module is designed and implemented to have a maximum performance while using a minimum number of the diodes. It shows an insertion loss of ${\sim}0.84\;dB$ and isolation of 80 dB or more at 2.35 GHz. The switch driver circuit is also fabricated and measured to have a switching speed of ${\sim}200\;nsec$. The power handling capability test demonstrates that the module operates normally even under a digitally modulated 70 W RF signal stress.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.14 no.11
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• pp.2541-2547
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• 2010

In this paper, we propose a design technique which replaces logic transistors of 1.2V with medium-voltage transistors of 3.3V having small off-leakage current in repetitive block circuits where speed is not an issue, to implement a low-power eFuse OTP memory IP in the stand-by state. In addition, we use dual-port eFuse cells reducing operational current dissipation by reducing capacitances parasitic to RWL (Read word-line) and BL (Bit-line) in the read mode. Furthermore, we propose an equivalent circuit for simulating program power injected to an eFuse from a program voltage. The layout size of the designed 512-bit eFuse OTP memory IP with a 90nm CMOS image sensor process is $342{\mu}m{\times}236{\mu}m$. It is confirmed by measurement experiments on 42 samples with a program voltage of 5V that we get a good result having 97.6 percent of program yield. Also, the minimal operational supply voltage is measured well to be 0.9V.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.19 no.3
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• pp.567-574
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• 2015

In this paper, a 50ns 256-kb EEPROM IP for MCU (micro controller unit) ICs is designed. The speed of data sensing is increased in the read mode by using a proposed DB sensing circuit of differential amplifier type which uses the reference voltage, and the switching speed is also increased by reducing the total DB parasitic capacitance as a distributed DB structure is separated into eight. Also, the access time is reduced reducing a precharging time of BL in the read mode removing a 5V NMOS transistor in the conventional RD switch, and the reliability of output data can be secured by obtaining the differential voltage (${\Delta}V$) between the DB and the reference voltages as 0.2*VDD. The access time of the designed 256-kb EEPROM IP is 45.8ns and the layout size is $1571.625{\mu}m{\times}798.540{\mu}m$ based on MagnaChip's $0.18{\mu}m$ EEPROM process.

• Transactions of the Korean hydrogen and new energy society
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• v.23 no.4
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• pp.300-309
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• 2012

Long endurance is a key issue in the application of unmanned aerial vehicles. This study presents feasibility test results when fuel cell system as an alternative to the conventional engine is applied for the power of the UAV after the 150W fuel cell system is developed and packaged to the 1/4 scale super cub airplane. Fuel cell system is operated by dead-end method in the anode part and periodically purged to remove the water droplet in flow field during the operation. Oxygen in the air is supplied to the stack by the two air blowers. And fuel cell stack is water cooled by cooling circuit to dissipate the heat generated during the fuel cell operation. Weight balance is considered to integrate the stack and balance of plant (BOP) in package layout. In flight performance test, we demonstrated 4 times standalone take-off and landing. In the laboratory test simulating the flight condition to quantify the energy flow, the system is analyzed in detail. Sankey diagram shows that electric efficiency of the fuel cell system is 39.2%, heat loss 50.1%, parasitic loss 8.96%, and unreacted purged gas 1.67%, respectively compared to the total hydrogen input energy. Feasibility test results show that fuel cell system is high efficient and appropriate for the power of UAV.

• JSTS:Journal of Semiconductor Technology and Science
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• v.10 no.2
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• pp.134-142
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• 2010

A comparative study on the trade-off between the drive current and the total gate capacitance in double-gate (DG) and triple-gate (TG) FinFETs is performed by using 3-D device simulation. As the first result, we found that the optimum ratio of the hardmask oxide thickness ($T_{mask}$) to the sidewall oxide thickness ($T_{ox}$) is $T_{mask}/T_{ox}$=10/2 nm for the minimum logic delay ($\tau$) while $T_{mask}/T_{ox}$=5/1~2 nm for the maximum intrinsic gate capacitance coupling ratio (ICR) with the fixed channel length ($L_G$) and the fin width ($W_{fin}$) under the short channel effect criterion. It means that the TG FinFET is not under the optimal condition in terms of the circuit performance. Second, under optimized $T_{mask}/T_{ox}$, the propagation delay ($\tau$) decreases with the increasing fin height $H_{fin}$. It means that the FinFET-based logic circuit operation goes into the drive current-dominant regime rather than the input gate load capacitance-dominant regime as $H_{fin}$ increases. In the end, the sensitivity of $\Delta\tau/{\Delta}H_{fin}$ or ${{\Delta}I_{ON}}'/{\Delta}H_{fin}$ decreases as $L_G/W_{fin}$ is scaled-down. However, $W_{fin}$ should be carefully designed especially in circuits that are strongly influenced by the self-capacitance or a physical layout because the scaling of $W_{fin}$ is followed by the increase of the self-capacitance portion in the total load capacitance.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.13 no.7
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• pp.1371-1378
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• 2009

We propose a low-power eFuse one-time programmable (OTP) memory cell based on a logic process. The eFuse OTP memory cell uses separate transistors optimized at program and read mode, and reduces an operation current at read mode by reducing parasitic capacitances existing at both WL and BL. Asynchronous interface, separate I/O, BL SA circuit of digital sensing method are used for a low-power and small-area eFuse OTP memory IP. It is shown by a computer simulation that operation currents at a logic power supply voltage of VDD and at I/O interface power supply voltage of VIO are 349.5${\mu}$A and 3.3${\mu}$A, respectively. The layout size of the designed eFuse OTP memory IP with Dongbu HiTek's 0.18${\mu}$m generic process is 300 ${\times}$557${\mu}m^2$.