• Title/Summary/Keyword: CMOS inverter

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A Gm-C Filter using CMFF CMOS Inverter-type OTA (CMFF CMOS 인버터 타입 OTA를 이용한 Gm-C 필터 설계)

  • Choi, Moon-Ho;Kim, Yeong-Seuk
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.23 no.4
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    • pp.267-272
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    • 2010
  • In this paper, a Gm-C LPF utilizing common-mode feedforward (CMFF) CMOS inverter type operational transconductance amplifier (OTA) has been designed and verified by circuit simulations. The CMFF CMOS inverter OTA was optimized for wide input linearity and low current consumption using a standard 0.18 ${\mu}m$ CMOS process; gm of 100 ${\mu}S$ and current of 100 ${\mu}A$ at supplied voltage of 1.3 V. Using this optimized CMFF CMOS inverter type OTA, an elliptic 5th order Gm-C LPF for GPS specifications was designed. Gain and frequency tuning of the LPF was done by changing the internal supply voltages. The designed Gm-C LPF gave pass-band ripple of 1.6 dB, stop-band attenuation of 60.8 dB, current consumption of 0.60 mA at supply voltage of 1.2 V. The gain and frequency characteristics of designed Gm-C LPF was unchanged even though the input common-mode voltage is varied.

CMOS neuron activation function (CMOS 뉴런의 활성화 함수)

  • Kang, Min-Jae;Kim, Ho-Chan;Song, Wang-Cheol;Lee, Sang-Joon
    • Journal of the Korean Institute of Intelligent Systems
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    • v.16 no.5
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    • pp.627-634
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    • 2006
  • We have proposed the methods how to control the slope of CMOS inverter's characteristic and how to shift it in y axis. We control the MOS transistor threshold voltage for these methods. By observing that two transistors are in saturation region at the center of the CMOS inverter's characteristic, we have presented how to make the characteristic for one pole neuron. The circuit level simulation is used for verifying the proposed method. PSpice(OrCAD Co.) is used for circuit level simulation.

CMOS Inverter Delay Model Using the Triangle-shaped Waveform of Output Current (삼각형 모양의 출력 전류 모형을 이용한 CMOS 인버터 지연 모사)

  • Choi, Deuk-Sung
    • 전자공학회논문지 IE
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    • v.48 no.3
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    • pp.1-9
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    • 2011
  • In this paper, we develop an analytical expression for the propagation delay of submicrometer CMOS inverter using the triangle-shaped waveform of output current and two fitting parameters. Our model shows that simulation results are well in accordance with HSPICE results. Maximum simulation errors of total inverter delay and jitter are below 0.6% and 2.8%, respectively. Comparing with previous researches, the new model has better fittering characteristics in the range of low operating voltage. We also have fabricated the inverters with ten chains and estimated inverter delay and jitter characteristics. The results show that the values of delay and jitter in the fabricated samples come close to the values of those in the new model.

CMOS Logic Circuits with Lower Subthreshold Leakage Current (낮은 Subthreshold 누설전류를 갖는 CMOS 논리회로)

  • Song Sang-Hun
    • The Transactions of the Korean Institute of Electrical Engineers C
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    • v.53 no.10
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    • pp.500-504
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    • 2004
  • We propose a new method to reduce the subthreshold leakage current. By moving the operating point of OFF state MOSFETs through input-controlled voltage generators, logic circuits with much lower leakage current can be built with few extra components. SPICE simulation results for the new inverter show correct logic results without speed degradation compared to a conventional inverter.

Characteristics of Nanowire CMOS Inverter with Gate Overlap (Gate Overlap에 따른 나노선 CMOS Inverter 특성 연구)

  • Yoo, Jeuk;Kim, Yoonjoong;Lim, Doohyeok;Kim, Sangsig
    • The Transactions of The Korean Institute of Electrical Engineers
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    • v.66 no.10
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    • pp.1494-1498
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    • 2017
  • In this study, we investigate the influence of an overlap between the gate and source/drain regions of silicon nanowire (SiNW) CMOS (complementary metal-oxide-semiconductor) inverter on bendable plastic substrates and describe their electrical characteristics. The combination of n-channel silicon nanowire field-effect transistor (n-SiNWFET) and p-channel silicon nanowire field-effect transistor (p-SiNWFET) operates as an inverter logic gate. The gains with a drain voltage ($V_{dd}$) of 1 V are 3.07 and 1.21 for overlapped device and non-overlapped device, respectively. The superior electrical characteristics of each of the SiNW transistors including steep subthreshold slopes and the high $I_{on}/I_{off}$ ratios are major factors that enable the excellent operation of the logic gate.

Macro-model for Estimation of Maximum Power Dissipation of CMOS Digital Gates (CMOS 디지털 게이트의 최대소모전력 예측 매크로 모델)

  • Kim, Dong-Wook
    • The Transactions of the Korean Institute of Electrical Engineers A
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    • v.48 no.10
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    • pp.1317-1326
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    • 1999
  • As the integration ratio and operation speed increase, it has become an important problem to estimate the dissipated power during the design procedure as a method to reduce the TTM(time to market). This paper proposed a prediction model to estimate the maximum dissipated power of a CMOS logic gate. This model uses a calculational method. It was formed by including the characteristics of MOSFETs of which a CMOS gate consists, the operational characteristics of the gate, and the characteristics of the input signals. As the modeling process, a maximum power estimation model for CMOS inverter was formed first, and then a conversion model to convert a multiple input CMOS gate into a corresponding CMOS inverter was proposed. Finally, the power model for inverter was applied to the converted result so that the model could be applied to a general CMOS gate. For experiment, several CMOS gates were designed in layout level by $0.6{\mu}m$ layout design rule. The result by comparing the calculated results with those from HSPICE simulations for the gates showed that the gate conversion model has within 5% of the relative error rate to the SPICE and the maximum power estimation model has within 10% of the relative error rate. Thus, the proposed models have sufficient accuracies. Also in calculation time, the proposed models was more than 30 times faster than SPICE simulation. Consequently, it can be said that the proposed model could be used efficiently to estimate the maximum dissipated power of a CMOS logic gate during the design procedure.

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High Temperature Characterization of PSA-BiCMOS (PSA-BiCMOS의 고온특성에 관한 연구)

  • 조정호;구용서안철
    • Proceedings of the IEEK Conference
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    • 1998.10a
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    • pp.577-580
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    • 1998
  • This paper presents the characteristics of each MOS device and Bipolar device, then investigates about how these devices take effect on BiCMOS inverter from 300K to 470K. The turn-off and Logic swing characteristics of BiCMOS inverter are degraded by the electrical characteristics of the MOS to around 400K, but over that temperature enhanced by the characteristics of the Bipolar transistor.

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A delay model for CMOS inverter (CMOS 인버터의 지연 시간 모델)

  • 김동욱;최태용;정병권
    • Journal of the Korean Institute of Telematics and Electronics C
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    • v.34C no.6
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    • pp.11-21
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    • 1997
  • The delay models for CMOS invertr presented so far predicted the delay time quite accurately whens input transition-time is very small. But the problem that the accuracy is inclined to decrease becomes apparent as input transition tiem increases. In this paper, a delay model for CMOS inverter is presented, which accuractely predicts the delay time even though input transition-time increases. To inverter must be included in modeling process because the main reason of inaccuracy as input transition tiem is the leakage current through the complementary MOS. For efficient modeling, this paper first models the MOSes with simple I-V charcteristic, with which both the pMOS and the nMOS are considered easily in calculating the inverter delay times. This resulting model needs few parameters and re-models each MOS effectively and simply evaluates output voltage to predict delay time, delay values obtained from this effectively and simply evaluates output voltage to predict delay time, delay values obtained from this model have been found to be within about 5% error rate of the SPICE results. The calculation time to predict the delay time with the model from this paper has the speed of more than 70times as fast as to the SPICE.

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Effect of Channel Variation on Switching Characteristics of LDMOSFET

  • Lee, Chan-Soo;Cui, Zhi-Yuan;Kim, Kyoung-Won
    • Journal of Semiconductor Engineering
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    • v.3 no.2
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    • pp.161-167
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    • 2022
  • Electrical characteristics of LDMOS power device with LDD(Lightly Doped Drain) structure is studied with variation of the region of channel and LDD. The channel in LDMOSFET encloses a junction-type source and is believed to be an important parameter for determining the circuit operation of CMOS inverter. Two-dimensional TCAD MEDICI simulation is used to study hot-carrier effect, on-resistance Ron, breakdown voltage, and transient switching characteristic. The voltage-transfer characteristics and on-off switching properties are studied as a function of the channel length and doping levels. The digital logic levels of the output and input voltages are analyzed from the transfer curves and circuit operation. Study indicates that drain current significantly depends on the channel length rather than the LDD region, while the switching transient time is almost independent of the channel length. The high and low logic levels of the input voltage showed a strong dependency on the channel length, while the lateral substrate resistance from a latch-up path in the CMOS inverter was comparable to that of a typical CMOS inverter with a guard ring.

Delay Time Reliability of Analog and Digital Delay Elements for Time-to-Digital Converter

  • Choi, Jin-Ho
    • Journal of information and communication convergence engineering
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    • v.8 no.1
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    • pp.103-106
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    • 2010
  • In this paper, the delay times were evaluated to develop highly reliable time-to-digital converter(TDC) in analog and digital delay element structures. The delay element can be designed by using current source or inverter. In case of using inverter, the number of inverter has to be controlled to adjust the delay time. And in case of using current source, the current for charging and discharging is controlled. When the current source is used the delay time of the delay element is not sensitive with varying the channel width of CMOS. However, when the inverter is used the delay time is directly related to the channel width of CMOS. Therefore to obtain good reliability in TDC circuit the delay element using current source is more stable compared to inverter in the viewpoint of the variation of fabrication process.