• 한국전기전자재료학회논문지
• /
• 제23권4호
• /
• pp.267-272
• /
• 2010

In this paper, a Gm-C LPF utilizing common-mode feedforward (CMFF) CMOS inverter type operational transconductance amplifier (OTA) has been designed and verified by circuit simulations. The CMFF CMOS inverter OTA was optimized for wide input linearity and low current consumption using a standard 0.18 ${\mu}m$ CMOS process; gm of 100 ${\mu}S$ and current of 100 ${\mu}A$ at supplied voltage of 1.3 V. Using this optimized CMFF CMOS inverter type OTA, an elliptic 5th order Gm-C LPF for GPS specifications was designed. Gain and frequency tuning of the LPF was done by changing the internal supply voltages. The designed Gm-C LPF gave pass-band ripple of 1.6 dB, stop-band attenuation of 60.8 dB, current consumption of 0.60 mA at supply voltage of 1.2 V. The gain and frequency characteristics of designed Gm-C LPF was unchanged even though the input common-mode voltage is varied.

• 한국지능시스템학회논문지
• /
• 제16권5호
• /
• pp.627-634
• /
• 2006

CMOS 인버터 특성곡선의 기울기를 조절하는 방법과 y축으로 이동할 수 있는 방법을 제안하였다. 기울기의 변경과 y축으로 이동은 트랜지스터의 문턱 값을 조절하는 방법을 사용하였다. 그리고 특성곡선의 중심에서는 두 트랜지스터 모두 포화영역에 머물러 있음에 착안하여, 단극성 뉴런의 특성곡선을 만드는 방법을 제안하였다. 제안된 방법은 회로레벨의 시뮬레이션을 통해 검증하였으며, 회로레벨의 시뮬레이션은 OrCAD사의 PSpice(Professional Simulation Program with Integrated Circuit Emphasis)를 사용하였다.

• 전자공학회논문지 IE
• /
• 제48권3호
• /
• pp.1-9
• /
• 2011

본 연구는 submicrometer CMOS 인버터의 신호 전달 지연에 대한 모사로서 출력 전류 파형을 삼각형 모양으로 근사하고 두 개의 실험적 변수를 사용하여 구현 하였다. 본 모사의 결과는 HSPICE 결과와 매우 부합된 결과를 보인다. 모델의 시뮬레이션 결과 인버터 지연 값과 jitter의 최대 오류치는 각각 0.6%와 2.8% 이하의 결과를 보인다. 앞선 연구자들의 결과와 비교해 볼 때 본 연구의 모사는 작은 동작 전압에서 더 나은 결과를 보이는 특성을 가지고 있다. 이러한 모사의 결과를 실험적으로 증명하기 위해 인버터 체인을 제작 하였고 인버터 지연과 jitter 특성을 평가하였다. 제작된 시료의 결과는 새로운 모델과 매우 근사한 값을 보인다.

• 대한전기학회논문지:전기물성ㆍ응용부문C
• /
• 제53권10호
• /
• pp.500-504
• /
• 2004

We propose a new method to reduce the subthreshold leakage current. By moving the operating point of OFF state MOSFETs through input-controlled voltage generators, logic circuits with much lower leakage current can be built with few extra components. SPICE simulation results for the new inverter show correct logic results without speed degradation compared to a conventional inverter.

• 전기학회논문지
• /
• 제66권10호
• /
• pp.1494-1498
• /
• 2017

In this study, we investigate the influence of an overlap between the gate and source/drain regions of silicon nanowire (SiNW) CMOS (complementary metal-oxide-semiconductor) inverter on bendable plastic substrates and describe their electrical characteristics. The combination of n-channel silicon nanowire field-effect transistor (n-SiNWFET) and p-channel silicon nanowire field-effect transistor (p-SiNWFET) operates as an inverter logic gate. The gains with a drain voltage ($V_{dd}$) of 1 V are 3.07 and 1.21 for overlapped device and non-overlapped device, respectively. The superior electrical characteristics of each of the SiNW transistors including steep subthreshold slopes and the high $I_{on}/I_{off}$ ratios are major factors that enable the excellent operation of the logic gate.

• 대한전기학회논문지:전력기술부문A
• /
• 제48권10호
• /
• pp.1317-1326
• /
• 1999

As the integration ratio and operation speed increase, it has become an important problem to estimate the dissipated power during the design procedure as a method to reduce the TTM(time to market). This paper proposed a prediction model to estimate the maximum dissipated power of a CMOS logic gate. This model uses a calculational method. It was formed by including the characteristics of MOSFETs of which a CMOS gate consists, the operational characteristics of the gate, and the characteristics of the input signals. As the modeling process, a maximum power estimation model for CMOS inverter was formed first, and then a conversion model to convert a multiple input CMOS gate into a corresponding CMOS inverter was proposed. Finally, the power model for inverter was applied to the converted result so that the model could be applied to a general CMOS gate. For experiment, several CMOS gates were designed in layout level by $0.6{\mu}m$ layout design rule. The result by comparing the calculated results with those from HSPICE simulations for the gates showed that the gate conversion model has within 5% of the relative error rate to the SPICE and the maximum power estimation model has within 10% of the relative error rate. Thus, the proposed models have sufficient accuracies. Also in calculation time, the proposed models was more than 30 times faster than SPICE simulation. Consequently, it can be said that the proposed model could be used efficiently to estimate the maximum dissipated power of a CMOS logic gate during the design procedure.

• 대한전자공학회:학술대회논문집
• /
• 대한전자공학회 1998년도 추계종합학술대회 논문집
• /
• pp.577-580
• /
• 1998

This paper presents the characteristics of each MOS device and Bipolar device, then investigates about how these devices take effect on BiCMOS inverter from 300K to 470K. The turn-off and Logic swing characteristics of BiCMOS inverter are degraded by the electrical characteristics of the MOS to around 400K, but over that temperature enhanced by the characteristics of the Bipolar transistor.

• 전자공학회논문지C
• /
• 제34C권6호
• /
• pp.11-21
• /
• 1997

The delay models for CMOS invertr presented so far predicted the delay time quite accurately whens input transition-time is very small. But the problem that the accuracy is inclined to decrease becomes apparent as input transition tiem increases. In this paper, a delay model for CMOS inverter is presented, which accuractely predicts the delay time even though input transition-time increases. To inverter must be included in modeling process because the main reason of inaccuracy as input transition tiem is the leakage current through the complementary MOS. For efficient modeling, this paper first models the MOSes with simple I-V charcteristic, with which both the pMOS and the nMOS are considered easily in calculating the inverter delay times. This resulting model needs few parameters and re-models each MOS effectively and simply evaluates output voltage to predict delay time, delay values obtained from this effectively and simply evaluates output voltage to predict delay time, delay values obtained from this model have been found to be within about 5% error rate of the SPICE results. The calculation time to predict the delay time with the model from this paper has the speed of more than 70times as fast as to the SPICE.

• Journal of Semiconductor Engineering
• /
• 제3권2호
• /
• pp.161-167
• /
• 2022

Electrical characteristics of LDMOS power device with LDD(Lightly Doped Drain) structure is studied with variation of the region of channel and LDD. The channel in LDMOSFET encloses a junction-type source and is believed to be an important parameter for determining the circuit operation of CMOS inverter. Two-dimensional TCAD MEDICI simulation is used to study hot-carrier effect, on-resistance Ron, breakdown voltage, and transient switching characteristic. The voltage-transfer characteristics and on-off switching properties are studied as a function of the channel length and doping levels. The digital logic levels of the output and input voltages are analyzed from the transfer curves and circuit operation. Study indicates that drain current significantly depends on the channel length rather than the LDD region, while the switching transient time is almost independent of the channel length. The high and low logic levels of the input voltage showed a strong dependency on the channel length, while the lateral substrate resistance from a latch-up path in the CMOS inverter was comparable to that of a typical CMOS inverter with a guard ring.

• Journal of information and communication convergence engineering
• /
• 제8권1호
• /
• pp.103-106
• /
• 2010

In this paper, the delay times were evaluated to develop highly reliable time-to-digital converter(TDC) in analog and digital delay element structures. The delay element can be designed by using current source or inverter. In case of using inverter, the number of inverter has to be controlled to adjust the delay time. And in case of using current source, the current for charging and discharging is controlled. When the current source is used the delay time of the delay element is not sensitive with varying the channel width of CMOS. However, when the inverter is used the delay time is directly related to the channel width of CMOS. Therefore to obtain good reliability in TDC circuit the delay element using current source is more stable compared to inverter in the viewpoint of the variation of fabrication process.