• Title/Summary/Keyword: Analog circuits

Search Result 354, Processing Time 0.022 seconds

Building Blocks for Current-Mode Implementation of VLSI Fuzzy Microcontrollers

  • Huerats, J.L.;Sanchez-Solano, S.;Baturone, I.;Barriga, A.
    • Proceedings of the Korean Institute of Intelligent Systems Conference
    • /
    • 1993.06a
    • /
    • pp.929-932
    • /
    • 1993
  • A fuzzy microcontroller is presented implementing a simplified inference mechanism. Fuzzification, rule composition and defuzzification are carried out by means of (basically) analog current-mode CMOS circuits operating in strong inversion. Also a voltage interface is provided with the external world. Combining analog and digital techniques allow a programming capability.

  • PDF

Design methodology of analog circuits for a digital-audio-signal processing 1-bit ???? DAC (디지털 오디오 신호처리용 1-bit Δ$\Sigma$ DAC 아날로그 단의 설계기법)

  • 이지행;김상호;손영철;김선호;김대정;김동명
    • Proceedings of the IEEK Conference
    • /
    • 2002.06b
    • /
    • pp.149-152
    • /
    • 2002
  • The performance of a 1-bit DAC depends on that of the analog circuits. The mixed SC-CT (switched capacitor-continuous time) architecture is an effective design methodology for the analog circuits. This paper Proposes a new buffer scheme for the 1-bit digital-to-analog subconverter and a new SF-DSC(smoothing filter and differential-to-sig le converter) which performs both the smoothing filter and the differential-to-single convertor simultaneously.

  • PDF

Virtual ground monitoring for high fault coverage of linear analog circuits

  • Roh, Jeongjin
    • JSTS:Journal of Semiconductor Technology and Science
    • /
    • v.2 no.3
    • /
    • pp.226-232
    • /
    • 2002
  • This paper explains a technique to improve the fault coverage of oscillation-test [1-5] for linear analog circuits. The transient behavior of the virtual ground is monitored during oscillation to extract information of the circuit. The limitation of the oscillation-test is analyzed, and an efficient signature analysis technique is proposed to maximize the fault coverage. The experimental result proves that the parametric fault coverage can be significantly increased by the proposed technique.

Parallel Structure of Viterbi Decoder for High Performance of PRML Signal (PRML신호용 고성능 Viterbi Decoder의 병렬구조)

  • Seo, Beom-Soo;Kim, Jong-Man;Kim, Hyong-Suk
    • The Transactions of the Korean Institute of Electrical Engineers P
    • /
    • v.58 no.4
    • /
    • pp.623-626
    • /
    • 2009
  • In this paper, we applied new analog viterbi decoder to decode PR(1,2,2,1) signal for DVD and analyze the specific and signal characteristics. We implemented the parallel analog viterbi decoder and the convolution digital viterbi decoder(the digital PRML) utilizing the technology of analog parallel processing circuits. The proposed analog viterbi decoder can replace the conventional digital viterbi decoder by a new one. Our circuits design the low distortion and the high accuracy over the previous implementation. Through the parallel structure of the proposed viterbi decoder, we got the achievement of the decoding speed by the multiple times.

Machine learning-based design automation of CMOS analog circuits using SCA-mGWO algorithm

  • Vijaya Babu, E;Syamala, Y
    • ETRI Journal
    • /
    • v.44 no.5
    • /
    • pp.837-848
    • /
    • 2022
  • Analog circuit design is comparatively more complex than its digital counterpart due to its nonlinearity and low level of abstraction. This study proposes a novel low-level hybrid of the sine-cosine algorithm (SCA) and modified grey-wolf optimization (mGWO) algorithm for machine learning-based design automation of CMOS analog circuits using an all-CMOS voltage reference circuit in 40-nm standard process. The optimization algorithm's efficiency is further tested using classical functions, showing that it outperforms other competing algorithms. The objective of the optimization is to minimize the variation and power usage, while satisfying all the design limitations. Through the interchange of scripts for information exchange between two environments, the SCA-mGWO algorithm is implemented and simultaneously simulated. The results show the robustness of analog circuit design generated using the SCA-mGWO algorithm, over various corners, resulting in a percentage variation of 0.85%. Monte Carlo analysis is also performed on the presented analog circuit for output voltage and percentage variation resulting in significantly low mean and standard deviation.

Characteristics of poly-Si TFTs Required for System-on-Glass Analog Circuits

  • Kim, Dae-June;Lee, Kyun-Lyeol;Yoo, Chang-Sik
    • Journal of Information Display
    • /
    • v.5 no.4
    • /
    • pp.1-6
    • /
    • 2004
  • In this paper, we investigate on the characteristics of poly-Si TFTs reuired for the implementation of analog circuits to be integrated with System-on-Glass (SoG). Matching requirements in terms of resistor values, threshold voltage and mobility of poly-Si TFTs are derived as a function of the resolution of display system. Effective mobility of poly-Si TFTs required for the realization of source driver is analyzed for various panel sizes.

Effective Techniques for Diagnosis and Test of Hard-to-Detect Faults in Analog Circuits (아날로그 회로의 난검출 고장을 위한 효과적인 진단 및 테스트 기법)

  • Lee, Jae-Min
    • IEMEK Journal of Embedded Systems and Applications
    • /
    • v.4 no.1
    • /
    • pp.23-28
    • /
    • 2009
  • Testing of analog(and mixed-signal) circuits has been a difficult task for test engineers and effective test techniques to solve these problems are required. This paper develops a new technique which increases fault detection and diagnosis rates for analog circuits by using extended MTSS (Modified Time Slot Specification) technique based on MTSS proposed by the author. High performance current sensors with digital outputs are used as core components for these techniques. A fault diagnosis structure with minimal hardware overhead in ATE is also described.

  • PDF

Feed forward Differential Architecture of Analog Parallel Processing Circuits for Analog PRML Decoder (아날로그 PRML 디코더를 위한 아날로그 병렬처리 회로의 전향 차동 구조)

  • Sah, Maheshwar Pd.;Yang, Chang-Ju;Kim, Hyong-Suk
    • The Transactions of The Korean Institute of Electrical Engineers
    • /
    • v.59 no.8
    • /
    • pp.1489-1496
    • /
    • 2010
  • A feed forward differential architecture of analog PRML decoder is investigated to implement on analog parallel processing circuits. The conventional PRML decoder performs the trellis processing with the implementation of single stage in digital and its repeated use. The analog parallel processing-based PRML comes from the idea that the decoding of PRML is done mainly with the information of the first several number of stages. Shortening the trellis processing stages but implementing it with analog parallel circuits, several benefits including higher speed, no memory requirement and no A/D converter requirement are obtained. Most of the conventional analog parallel processing-based PRML decoders are differential architecture with the feedback of the previous decoded data. The architecture used in this paper is without feedback, where error metric accumulation is allowed to start from all the states of the decoding stage, which enables to be decoded without feedback. The circuit of the proposed architecture is simpler than that of the conventional analog parallel processing structure with the similar decoding performance. Characteristics of the feed forward differential architecture are investigated through various simulation studies.

Specification-based Analog Circuits Test using High Performance Current Sensors (고성능 전류감지기를 이용한 Specification 기반의 아날로그 회로 테스트)

  • Lee, Jae-Min
    • Journal of Korea Multimedia Society
    • /
    • v.10 no.10
    • /
    • pp.1260-1270
    • /
    • 2007
  • Testing and diagnosis of analog circuits(or mixed-signal circuits) continue to be a hard task for test engineers and efficient test methodologies to solve these problems are needed. This paper proposes a novel analog circuits test technique using time slot specification (TSS) based built-in current sensors (BICS). A technique for location of a fault site and separation of fault type based on TSS is also presented. The proposed built-in current sensors and TSS technique has high testability, fault coverage and a capability to diagnose catastrophic faults and parametric faults in analog circuits. In order to reduce time complexity of test point insertion procedure, external output and power nodes are used for test points and the current sensors are implemented in the automatic test equipment(ATE). The digital output of BICS can be easily combined with built-in digital test modules for analog IC test.

  • PDF

Design Methodology of Analog Circuits for a CMOS Stereo 16-bit Δ$\Sigma$ DAC (CMOS Stereo 16-bit Δ$\Sigma$ DAC Analog단의 설계기법)

  • 김상호;채정석;박영진;손영철;조상준;김상민;김동명;김대정
    • Proceedings of the IEEK Conference
    • /
    • 2001.06b
    • /
    • pp.93-96
    • /
    • 2001
  • A design methodology of analog circuits for a CMOS stereo 16-bit Δ$\Sigma$ DAC which are suitable for the digital audio applications is described. The limitations of Δ$\Sigma$ DAC exist in the performance of the 1-bit DAC and that of the smoothing filter. The proposed architecture for analog circuits contains the buffer between the digital modulator and the following analog stage and adopts the SCF (switched capacitor filter) and DSC (differential-to-single converter) scheme. In this paper, a guide line for the selection of the filter type for the SCF design in the Δ$\Sigma$ DAC is suggested through the analytical approaches.

  • PDF