[KSCI] Korea Science Citation Index Service

Virtual ground monitoring for high fault coverage of linear analog circuits

Roh, Jeongjin (Hanyang University, Electrical Engineering and Computer Science)

Publication Information

JSTS:Journal of Semiconductor Technology and Science / v.2, no.3, 2002 , pp. 226-232 More about this Journal

Abstract

This paper explains a technique to improve the fault coverage of oscillation-test [1-5] for linear analog circuits. The transient behavior of the virtual ground is monitored during oscillation to extract information of the circuit. The limitation of the oscillation-test is analyzed, and an efficient signature analysis technique is proposed to maximize the fault coverage. The experimental result proves that the parametric fault coverage can be significantly increased by the proposed technique.

Keywords

analog circuits; mixed-signal circuits; built-in self test (BIST); oscillation-test; signature analysis;

Citations & Related Records

Reference

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