• Title/Summary/Keyword: 문턱전압이하

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Relation of Short Channel Effect and Scaling Theory for Double Gate MOSFET in Subthreshold Region (문턱전압이하 영역에서 이중게이트 MOSFET의 스켈링 이론과 단채널효과의 관계)

  • Jung, Hak-Kee
    • Journal of the Korea Institute of Information and Communication Engineering
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    • v.16 no.7
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    • pp.1463-1469
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    • 2012
  • This paper has presented the influence of scaling theory on short channel effects of double gate(DG) MOSFET in subthreshold region. In the case of conventional MOSFET, to preserve constantly output characteristics,current and switching frequency have been analyzed based on scaling theory. To analyze the results of application of scaling theory for short channel effects of DGMOSFET, the changes of threshold voltage, drain induced barrier height and subthreshold swing have been observed according to scaling factor. The analytical potential distribution of Poisson equation already verified has been used. As a result, it has been observed that threshold voltage among short channel effects is grealty changed according to scaling factor. The best scaling theory for DGMOSFET has been explained as using modified scaling theory, applying weighting factor reflected the influence of two gates when scaling theory has been applied for channel length.

Comparison of Current-Voltage Characteristics of Nanosheet FET and FinFET (Nanosheet FET와 FinFET의 전류-전압 특성 비교)

  • Ahn, Eun Seo;Yu, Yun Seop
    • Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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    • 2022.05a
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    • pp.560-561
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    • 2022
  • In this paper, current-voltage characteristics of various types of Nanosheet FET (NSFET) and FinFET are simulated with 3D device simulator. The threshold voltage and subthreshold swing extracted from the simulated current-voltage characteristics of NSFET and FinFET were compared. Both of threshold voltage and drain current of NSFET are higher than those of FinFET. The subthreshold voltage swing (SS) of NSFET is steeper than that of FinFET.

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Analysis of subthreshold region transport characteristics according to channel doping for DGMOSFET using MicroTec (MicroTec을 이용한 DGMOSFET의 채널도핑에 따른 문턱전압이하영역 특성분석)

  • Han, Ji-Hyung;Jung, Hak-Kee;Lee, Jong-In;Jeong, Dong-Soo;Kwon, Oh-Shin
    • Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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    • 2010.10a
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    • pp.715-717
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    • 2010
  • In this paper, the subthreshold characteristics have been alanyzed using MicroTec4.0 for double gate MOSFET(DGMOSFET). The DGMOSFET is extensively been studing since it can reduce the short channel effects due to structural characteristics. We have presented the short channel effects such as subthreshold swing and threshold voltage for DGMOSFET, using MicroTec, semiconductor simulator. We have analyzed for channel length, thickness and width to consider the structural characteristics for DGMOSFET. The subthreshold swing and threshold voltage have been analyzed for DGMOSFET using MicroTec since MicroTec is well verified as comparing with results of the numerical three dimensional models.

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Steep subthreshold slope at elevated temperature in junctionless and inversion-mode MuGFET (고온에서 무접합 및 반전모드 MuGFET의 문턱전압 이하에서 급격히 작은 기울기 특성)

  • Lee, Seung-Min;Park, Jong-Tae
    • Journal of the Korea Institute of Information and Communication Engineering
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    • v.17 no.9
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    • pp.2133-2138
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    • 2013
  • In this paper, the variation of a steep subthreshold slope at elevated temperature in nanowire n-channel junctionless and inversion mode MuGFETs has been compared. It has been observed that the subthreshold slopes are increased with the increase of the operation temperature in junctionless and inversio-mode transistors. The variation of a subthreshold slope with operation temperature is more significant in junctionless transistor than inversion-mode transistor. The temperature dependence on the variation of a subthreshold slope for different fin widths shows a similar behavior regardless of fin width. From the temperature dependence on the variation of a subthreshold slope for different substrate biases, it has been observed that the variation of a subthreshold slope is less significant when the substrate bias was applied. It is worth noting that one can achieve a subthreshold slope of below 41mV/dec at elevated temperature of 400K using the junctionless MuGFETs with a positive substrate bias.

Deviation of Threshold Voltage and Conduction Path for the Ratio of Top and Bottom Oxide Thickness of Asymmetric Double Gate MOSFET (비대칭 DGMOSFET의 상하단 산화막 두께비에 따른 문턱전압 및 전도중심의 변화)

  • Jung, Hakkee
    • Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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    • 2014.10a
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    • pp.765-768
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    • 2014
  • 본 연구에서는 비대칭 이중게이트 MOSFET의 상하단 게이트 산화막 두께 비에 대한 문턱전압 및 전도중심의 변화에 대하여 분석하고자한다. 비대칭 이중게이트 MOSFET는 상하단 게이트 산화막의 두께를 다르게 제작할 수 있어 문턱전압이하 영역에서 전류를 제어할 수 있는 요소가 증가하는 장점이 있다. 상하단 게이트 산화막 두께 비에 대한 문턱전압 및 전도중심을 분석하기 위하여 포아송방정식을 이용하여 해석학적 전위분포를 구하였다. 이때 전하분포는 가우스분포함수를 이용하였다. 하단게이트 전압, 채널길이, 채널두께, 이온주입범위 및 분포편차를 파라미터로 하여 문턱전압 및 전도중심의 변화를 관찰한 결과, 문턱전압은 상하단 게이트 산화막 두께 비에 따라 큰 변화를 나타냈다. 특히 채널길이 및 채널두께의 절대값보다 비에 따라 문턱전압이 변하였으며 전도중심이 상단 게이트로 이동할 때 문턱전압은 증가하였다. 또한 분포편차보단 이온주입범위에 따라 문턱전압 및 전도중심이 크게 변화하였다.

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Comparison of Current-Voltage Characteristics by Doping Concentrations of Nanosheet FET and FinFET (Nanosheet FET와 FinFET의 도핑 농도에 따른 전류-전압 특성 비교)

  • Ahn, Eun Seo;Yu, Yun Seop
    • Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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    • 2022.10a
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    • pp.121-122
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    • 2022
  • In this paper, the device performance with the structure of Nanosheet FET (NSFET) and FinFET is simulated through a three-dimensional device simulator. Current-voltage characteristics of NSFET and FinFET were simulated with respect to channel doping concentrations, and the performance such as threshold voltage and subthreshold swing extracted from the current-voltage characteristics was compared. NSFET flows more drain current and has a higher threshold voltage in current-voltage characteristics depending on channel doping concentration than that of FinFET. The subthreshold voltage swing (SS) of NSFET is steeper than that of FinFET

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Analysis of Channel Doping Concentration Dependent Subthreshold Characteristics for Double Gate MOSFET (이중게이트 MOSFET에서 채널도핑농도에 따른 문턱전압이하 특성 분석)

  • Jung, Hak-Kee
    • Journal of the Korea Institute of Information and Communication Engineering
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    • v.12 no.10
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    • pp.1840-1844
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    • 2008
  • In this paper, the influence of channel doping concentration, which the most important factor is as double gate MOSFET is fabricated, on transport characteristics has been analyzed in the subthreshold region. The analytical model is used to derive transport model based on Poisson equation. The thermionic omission and tunneling current to have an influence on subthreshold current conduction are analyzed, and the relationship of doping concentration and subthreshold swings of this paper are compared with those of Medici two dimensional simulation, to verify this model. As a result, transport model presented in this paper is good agreement with two dimensional simulation model, and the transport characteristics have been considered according to the dimensional parameters of double gate MOSFET.

Analysis of Transport Characteristics for DGMOSFET according to Channel Dopiong Concentration Using Series (급수를 이용한 DGMOSFET의 채널도핑농도에 대한 전송 특성 분석)

  • Han, Jihyung;Jung, Hakkee;Jeong, Dongsoo;Lee, Jongin;Kwon, Ohshin
    • Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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    • 2012.10a
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    • pp.845-847
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    • 2012
  • In this paper, the transport characteristics for doping concentration in the channel has been analyzed for DGMOSFET. The Possion equation is used to analytical. The DGMOSFET is extensively been studying because of advantages to be able to reduce the short channel effects(SCEs) to occur in conventional MOSFET. Since SCEs have been occurred in subthreshold region including threshold region, the analysis of transport characteristics in subthreshold region is very important. The threshold voltage roll-off and DIBL have been with various of doping concentration for DGMOSFET in this study.

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Analysis of subthreshold region transport characteristics according to channel thickness for DGMOSFET (DGMOSFET의 채널두께에 따른 문턱전압이하영역에서의 전송특성분석)

  • Han, Ji-Hyung;Jung, Hak-Kee;Lee, Jong-In;Jeong, Dong-Soo;Kwon, Oh-Shin
    • Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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    • 2010.10a
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    • pp.737-739
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    • 2010
  • In this paper, the subthreshold characteristics have been alanyzed using MicroTec4.0 for double gate MOSFET(DGMOSFET). The technology for characteristic analysis of device for high integration is changing rapidly. Therefore to understand characteristics of high-integrated device by computer simulation and fabricate the device having such characteristics became one of very important subjects. The oxide thickness and channel thickness in DG MOSFET determines threshold voltage and extensively influences on Ss(Subthreshold swing). We have investigated the threshold voltage and Ss(Subthreshold swing) characteristics according to variation of channel thickness from 1nm to 3nm in this study.

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MOS Capacitor 에서 Fixed Oxide Charge 가 문턱전압에 미치는 영향 분석

  • Cha, Su-Hyeong
    • Proceeding of EDISON Challenge
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    • 2016.03a
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    • pp.362-364
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    • 2016
  • 본 논문에서는 MOS(Metal Oxide Semiconductor) Capacitor의 산화막내에 다양한 원인에 의해 존재하는 비이상적인 전하들 중 Fixed Oxide Charge가 소자의 문턱전압에 어떤 영향을 주는지 분석했다. 분석한 결과 n+ polysilicon Gate를 가지고, 산화막인 $SiO_2$의 두께가 3nm이고, 도핑농도가 $10^{18}cm^{-2}$인 P형 실리콘 기판으로 이루어진 MOS Capacitor에서 Fixed Oxide Charge Density가 $C/cm^2$ 이상일 때 문턱전압을 0.01V 이상 감소시키고 $C/cm^2$ 이하일 때 문턱전압을 0.01V 이상 증가시켰다.

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