• 제목/요약/키워드: kink effect

검색결과 43건 처리시간 0.024초

NMOSFET SOI 소자의 Current Kink Effect 감소에 관한 연구 (A Study on the Reduction of Current Kink Effect in NMOSFET SOI Device)

  • 한명석;이충근;홍신남
    • 전자공학회논문지T
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    • 제35T권2호
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    • pp.6-12
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    • 1998
  • 박막의 SOI(Silicon-On-Insulator) 소자는 짧은 채널 효과(short channel effect), subthreshold slope의 개선, 이동도 향상, latch-up 제거 등 많은 이점을 제공한다. 반면에 이 소자는 current kink effect와 같이 정상적인 소자 동작에 있어 주요한 저해 요소인 floating body effect를 나타낸다. 본 논문에서는 이러한 문제를 해결하기 위해 T-형 게이트 구조를 갖는 SOI NMOSFET를 제안하였다. T-형 게이트 구조는 일부분의 게이트 산화막 두께를 다른 부분보다 30nm 만큼 크게 하여 TSUPREM-4로 시뮬레이션 하였으며, 이것을 2D MEDICI mesh를 구성하여 I-V 특성 시뮬레이션을 시행하였다. 부분적으로 게이트 산화층의 두께가 다르기 때문에 게이트 전계도 부분적으로 차이가 발생되어 충격 이온화 전류의 크기도 줄어든다. 충격 이온화 전류가 감소한다는 것은 current kink effect가 감소하는 것을 의미하며, 이것을 MEDICI 시뮬레이션을 통해 얻어진 충격 이온화 전류 곡선, I-V 특성 곡선과 정공 전류의 분포 형태를 이용하여 제안된 구조에서 current kink effect가 감소됨을 보였다.

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The Electrical Properties of Single-silicon TFT Structure with Symmetric Dual-Gate for kink effect suppression

  • 이덕진;강이구
    • 한국컴퓨터산업학회논문지
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    • 제6권5호
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    • pp.783-790
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    • 2005
  • In this paper, we have simulated a Symmetric Dual-gate Single-Si TFT which has three split floating n+ zones. This structure reduces the kink-effect drastically and improves the on-current. Due to the separated floating n+ zones, the transistor channel region is split into four zones with different lengths defined by a floating n+ region, This structure allows an effective reduction of the kink-effect depending on the length of two sub-channels. The on-current of the proposed dual-gate structure is 0.9mA while that of the conventional dual-gate structure is 0.5mA at a 12V drain voltage and a 7V gate voltage. This result shows a 80% enhancement in on-current. Moreover we observed the reduction of electric field in the channel region compared to conventional single-gate TFT and the reduction of the output conductance in the saturation region. In addition, we also confirmed the reduction of hole concentration in the channel region so that the kink-effect reduces effectively.

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Kink-effect 개선을 위한 세 개의 분리된 N+ 구조를 지닌 대칭형 듀얼 게이트 단결정 TFT 구조에 대한 연구 (Single-silicon TFT Structure for Kink-effect Suppression with Symmetric Dual-gate by Three Split floating N+ Zones)

  • 이대연;황상준;박상원;성만영
    • 한국전기전자재료학회논문지
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    • 제18권5호
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    • pp.423-430
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    • 2005
  • In this paper, we have simulated a Symmetric Dual-gate Single-Si TFT which has three split floating $n^{+}$ zones. This structure reduces the kink-effect drastically and improves the on-current. Due to the separated floating $n^{+}$ zones, the transistor channel region is split into four zones with different lengths defined by a floating $n^{+}$ region. This structure allows an effective reduction of the kink-effect depending on the length of two sub-channels. The on-current of the proposed dual-gate structure is 0.9 mA while that of the conventional dual-gate structure is 0.5 mA at a 12 V drain voltage and a 7 V gate voltage. This results show a $80 {\%}$ enhancement in on-current by adding two floating $n^{+}$ zones. Moreover we observed the reduction of electric field In the channel region compared to conventional single-gate TFT and the reduction of the output conductance in the saturation region. In addition we also confirmed the reduction of hole concentration in the channel region so that the kink-effect reduces effectively.

Electrical Characteristics of Single-silicon TFT Structure with Symmetric Dual-gate for Kink Effect Suppression

  • Kang Ey-Goo;Lee Dae-Yeon;Lee Chang-Hun;Kim Chang-Hun;Sung Man-Young
    • Transactions on Electrical and Electronic Materials
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    • 제7권2호
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    • pp.53-57
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    • 2006
  • In this paper, a Symmetric Dual-gate Single-Si TFT, which includes three split floating n+ zones, is simulated. This structure drastically reduces the kink-effect and improves the on-current. This is due to the separated floating n+ zones, the transistor channel region is split into four zones with different lengths defined by a floating n+ region. This structure allows effective reduction in the kink-effect, depending on thy length of the two sub-channels. The on-current of the proposed dual-gate structure is 0.9 mA, while that of the conventional dual-gate structure is 0.5 mA, at both 12 V drain and 7 V gate voltages. This result shows an 80% enhancement in on-current. In addition, the reduction of electric field in the channel region compared to a conventional single-gate TFT and the reduction of the output conductance in the saturation region, is observed. In addition, the reduction in hole concentration, in the channel region, in order for effectively reducing the kink-effect, is also confirmed.

Compression Strength Size Effect on Carbon-PEEK Fiber Composite Failing by Kink Band Propagation

  • Kim, Jang-Ho
    • KCI Concrete Journal
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    • 제12권1호
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    • pp.57-68
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    • 2000
  • The effect of structure size on the nominal strength of unidirectional fiber-polymer composites, failing by propagation of a kink band with fiber microbuckling, is analyzed experimentally and theoretically. Tests of novel geometrically similar carbon-PEEK specimens, with notches slanted so as to lead to a pure kink band (without shear or splitting cracks), are conducted. The specimens are rectangular strips of widths 15.875, 31.75. and 63.5 mm (0.625, 1.25 and 2.5 in and gage lengths 39.7, 79.375 and 158.75 mm (1.563, 3.125 and 6.25 in.). They reveal the existence of a strong (deterministic. non-statistical) size effect. The doubly logarithmic plot of the nominal strength (load divided by size and thickness) versus the characteristic size agrees with the approximate size effect law proposed for quasibrittle failures in 1983 by Bazant This law represents a gradual transition from a horizontal asymptote, representing the case of no size effect (characteristic of plasticity or strength criteria), to an asymptote of slope -1/2 (characteristic of linear elastic fracture mechanics. LEFM) . The size effect law for notched specimens permits easy identification of the fracture energy of the kink bandand the length of the fracture process zone at the front of the band solely from the measurements of maximum loads. Optimum fits of the test results by the size effect law are obtained, and the size effect law parameters are then used to identify the material fracture characteristics, Particularly the fracture energy and the effective length of the fracture process zone. The results suggest that composite size effect must be considered in strengthening existing concrete structural members such as bridge columns and beams using a composite retrofitting technique.

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다중 게이트을 이용한 부분 공핍형 SOI MOSFET 특성에 관한 연구 (A Study on Partially-Depleted SOI MOSFET with Multi-gate)

  • 신경식;박윤권;이성준;김철주
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 1997년도 하계학술대회 논문집 C
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    • pp.1286-1288
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    • 1997
  • In this study, partially-depleted SOI MOSFET with multi-gate was fabricated on p-type SIMOX(Seperation by Implanted Oxygen). As increase the number of its gate, increase the breakdown voltage. But kink effect was not affected by the number of its gate. However, it is known that the asymmetric gate structure reduce kink effect. So if asymmetric multi-gate applied to partially-depleted SOI MOSFET, it is expected that the breakdown voltage of SOI MOSET with asymmetric multi-gate is higher than that of SOI MOSFET with single gate and that kink effect is reduced by SOI MOSFET with asymmetric multi-gate.

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소수운반자 전도 SiGe PD-SOI MOSFET의 전기적 특성에 대한 전산 모사 (Simulation on Electrical Properties of SiGe PD-SOI MOSFET for Improved Minority Carrier Conduction)

  • 양현덕;최상식;한태현;조덕호;김재연;심규환
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2005년도 하계학술대회 논문집 Vol.6
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    • pp.21-22
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    • 2005
  • Partially-depleted Silicon on insulator metal-oxide-semiconductor field- effect transistors (PD-SOI MOSFETs) with Silicon-germanium (SiGe) layer is investigated. This structure uses SiGe layer to reduce the kink effect in the floating body region near the bottom channel/buried oxide interface. Among many design parameters influencing the performance of the device, Ge composition is presented most predominant effects, simulation results show that kink effect is reduced with increase the Ge composition. Because the bandgap of SiGe layer is reduced at higher Ge composition, the hole current between body and SiGe layer is enhanced.

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LDD 구조를 가지는 n-채널 다결정 실리콘 박막 트랜지스터의 전기적 특성 분석 (Analysis of the Electirical Characteristics on n-channel LDD structured poly-Si TFT's)

  • 김동진;강창수
    • 대한전자공학회논문지TE
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    • 제37권2호
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    • pp.12-16
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    • 2000
  • 본 연구는 n-채널 다결정 실리콘 박막 트랜지스터를 LDD 길이에 변화를 주며 제조한 후 이에 따른 전기적인 특성을 분석하였다. LDD 구조를 갖는 소자는 LDD 영역에 의한 직렬저항 효과와 드레인 부근의 전계 감소 효과에 의해서 기존의 구조를 가지는 소자에서 볼 수 있었던 Kink 현상이 사라지게 된다. 또한, on전류의 소폭 감소와 함께 큰 폭의 off 전류 감소가 일어나 on/off 전류비가 기존 구조를 갖는 소자보다 크게 증가하게 된다. 이는 LDD 영역에 의한 직렬저항 효과보다 전계 감소 효과가 더 지배적으로 나타나기 때문으로 사료된다.

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GOLDD 구조를 갖는 LTPS TFT 소자의 전기적 특성 비교분석

  • 김민규;조재현;이준신
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2009년도 추계학술대회 논문집
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    • pp.40-40
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    • 2009
  • The electrical characteristic of the conventional self-aligned polycrystalline silicon (poly-Si) TFTs are known to present several undesired effects such as large leakage current, kink effect and hot-carrier effects. In this paper, LTPS TFTs with different GOLDD length were fabricated and investigated the effect of the GOLDD. GOLDD length of 1, 1.5 and $2{\mu}m$ were used, while the thickness of the gate dielectrics($SiN_x/SiO_2$) was fixed at 65nm(40nm/25nm). The electrical characteristics show that the kink effect is reduced at the LTPS TFTs, and degradation from the hot-carrier effect was also decreased by increasing GOLDD length.

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A Novel Body-tied Silicon-On-Insulator(SOI) n-channel Metal-Oxide-Semiconductor Field-Effect Transistor with Grounded Body Electrode

  • Kang, Won-Gu;Lyu, Jong-Son;Yoo, Hyung-Joun
    • ETRI Journal
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    • 제17권4호
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    • pp.1-12
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    • 1996
  • A novel body-tied silicon-on-insulator(SOI) n-channel metal-oxide-semiconductor field-effect transistor with grounded body electrode named GBSOI nMOSFET has been developed by wafer bonding and etch-back technology. It has no floating body effect such as kink phenomena on the drain current curves, single-transistor latch and drain current overshoot inherent in a normal SOI device with floating body. We have characterized the interface trap density, kink phenomena on the drain current ($I_{DS}-V_{DS}$) curves, substrate resistance effect on the $I_{DS}-V_{DS}$ curves, subthreshold current characteristics and single transistor latch of these transistors. We have confirmed that the GBSOI structure is suitable for high-speed and low-voltage VLSI circuits.

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