Thickness Dependence of Solution Deposited HfOx Sensing Membrane for Electrolyte-Insulator-Semiconductor (EIS) Structures (용액 공정으로 증착된 HfOx 감지막을 갖는 Electrolyte-Insulator-Semiconductor 소자의 두께 의존성)
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- Journal of Sensor Science and Technology
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- v.22 no.3
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- pp.233-237
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- 2013