• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2010.05a
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• pp.483-485
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• 2010

A 200kS/s 10-bit successive approximation(SA) ADC with a rail-to-rail input range is proposed. The proposed SA ADC consists of DAC, comparator, and successive approximation register(SAR) logic. The folded-type capacitor DAC with the boosted NMOS switches is used to reduce the power consumption and chip area. Also, the time-domain comparator which uses a fully differential voltage-to-time converter improves the PSRR and CMRR. The SAR logic uses the flip-flop with a half valid window, it results in the reduction of the power consumption and chip area. The proposed SA ADC is designed by using a $0.18{\mu}m$ CMOS process with 1V supply.

• The Transactions of The Korean Institute of Electrical Engineers
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• v.68 no.1
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• pp.90-97
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• 2019

The charge redistribution digital-to-analog converter(CR-DAC) is often used for successive approximation register analog-to-digital converter(SAR ADC) that requiring low power consumption and small circuit area. However, CR-DAC is required 2 to the power of N unit capacitors to generate reference voltage for successive approximation of the N-bit SAR ADC, and many unit capacitors occupy large circuit area and consume more power. In order to improve this problem, this paper proposes SAR ADC using series capacitor DAC. The series capacitor DAC is required 2(1+N) unit capacitors to generate reference voltage for successive approximation and charges only two capacitors of the reference generation block. Because of these structural characteristics, the SAR ADC using series capacitor DAC can reduce the power consumption and circuit area. Proposed SAR ADC was designed in CMOS 180nm process, and at 1.8V supply voltage and 500kS/s sampling rate, proposed 6-bit SAR ADC have signal-to-noise and distortion ratio(SNDR) of 36.49dB, effective number of bits(ENOB) of 5.77-bit, power consumption of 294uW.

• 제어로봇시스템학회:학술대회논문집
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• 1989.10a
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• pp.943-946
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• 1989

The channel irregularity of Successive Approximation ADC is very large in comparison with other type of ADCs. This characteristic makes it impossible to apply the Successive Approximation ADC to the field of radiation pulse height analysis or the measurement of probability density function. In this paper, an analysis of differential non-linearity of this ADC-is presented. It is made clear that the small deviation of resistance causes very large differential non-linearity.

• Journal of IKEEE
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• v.14 no.1
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• pp.8-16
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• 2010

This paper presents a design of the successive approximation ADC(SA-ADC) applicable to a midium-low speed analog-front end(AFE) for the maximum 15MS/s CCD image processing. SA-ADC is effective in applications ranging widely between low and mid data rates due to the large power scaling effect on the operating frequency variations in some other way of pipelined ADCs. The proposed design exhibits some distinctive features. The "differential capacitor-coupling scheme" segregates the input sampling behavior from the sub-DAC incorporating the differential input and the sub-DAC output, which prominently reduces the loading throughout the signal path. Determining the MSB(sign bit) from the held input data in advance of the data conversion period, a kind of the signed successive approximation, leads to the reduction of the sub-DAC hardware overhead by 1 bit and the conversion period by 1 cycle. Characterizing the proposed design in a 3.3 V $0.35-{\mu}m$ CMOS process by Spectre simulations verified its validity of the application to CCD analog front-ends.

• 제어로봇시스템학회:학술대회논문집
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• 1987.10a
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• pp.847-850
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• 1987

In this paper a new method to correct the differential non-linearity(D NL) error for a successive approximation is proposed. The DNL of ADC is very important characteristic in the field of radiation pulse height analysis or measurement of probability density function. The results of computer simulations are shown to demonstrate the feasibility of the proposed correction method.

• Journal of Radiation Protection and Research
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• v.12 no.1
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• pp.12-25
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• 1987

A basic multichannel analyser (MCA) system have been designed and constructed with the successive approximation type ADC (Analog to Digital Converter). Linear Gate, window, and palse stretcher consist of mainly linear and logic IC's, and are properly combined together to achieve short dead time and good linearity of the system. ADC 1211 (analysing time: $120{\mu}sec$) and S-RAM (static random acess memory) 6264 are used in ADC module. Two 6264 memories are connected in parallel in order to-provide enough counting capacity ($2^{16}-1$). Interfaced microcomputer Apple II controls this system and analizes the counted data. The system is tested by input pulses between 0V to 10V from oscillator.

• Journal of IKEEE
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• v.22 no.4
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• pp.1218-1221
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• 2018

This paper presents a low-power 0.6-V 10-bit 200-kS/s double rail-to-rail successive approximation register (SAR) analog-to-digital converter (ADC). The proposed scheme allows input signal with 4 times power which is compared with conventional one by applying proposed rail-to-rail scheme, and that improves signal-to-noise ratio(SNR) of NTV SAR ADCs. The prototype was designed using 65-nm CMOS technology. At a 0.6-V supply and $2.4-V_{pp}$ (differential) and 200-kS/s, the ADC achieves an SNDR of 59.87 dB and consumes 364.5-nW. The ADC core occupies an active area of only $84{\times}100{\mu}m^2$.

• Journal of IKEEE
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• v.22 no.2
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• pp.514-517
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• 2018

In sensor systems, ADC (analog-to-digital converter) demands high resolution, low power consumption, and high signal bandwidth. Sigma-delta ADC achieves high resolution by high order structure and high over-sampling ratio, but it suffers from high power consumption and low signal bandwidth. SAR (successive-approximation-register) ADC achieves low power consumption, but there is a limitation to achieve high resolution due to process mismatch. This paper surveys architecture improvement of ADC to overcome these problems.

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2011.10a
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• pp.448-451
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• 2011

SoC에서 칩 내부의 온도를 측정하기 위한 proportional-to-absolute-temperature (PTAT) 회로와 sensing 된 아날로그 신호를 디지털로 변환하기 위해 4-bit analog-to-digital converter (ADC)로 구성된 temperature sensor를 제안한다. CMOS 공정에서 vertical PNP 구조를 이용하여 PTAT 회로가 설계되었다. 온도변화에 둔감한 ADC를 구현하기 위해 아날로그 회로를 최소로 사용하는 successive approximation (SA) ADC가 이용되었다. 4-bit SA ADC는 capacitor DAC와 time-domain 비교기를 이용함으로 전력소모를 최소화하였다. 제안된 temperature sensor는 2.5V $0.25{\mu}m$ 1-poly 9-metal CMOS 공정을 이용하여 설계되었고, $50{\sim}150^{\circ}C$ 온도 범위에서 동작한다. Temperature sensor의 면적과 전력 소모는 각각 $130{\times}390\;um^2$과 868 uW이다.

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2012.05a
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• pp.88-90
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• 2012

This paper describes a 10-bit 10-MS/s asynchronous successive approximation register (SAR) analog-to-digital converter (ADC) with a rail-to-rail input range. The proposed SAR ADC consists of a capacitor digital-analog converter (DAC), a SAR logic and a comparator. To reduce the frequency of an external clock, the internal clock which is asynchronously generated by the SAR logic and the comparator is used. The time-domain comparator with a offset calibration technique is used to achieve a high resolution. To reduce the power consumption and area, a split capacitor-based differential DAC is used. The designed asynchronous SAR ADC is fabricated by using a 0.18 um CMOS process, and the active area is $420{\times}140{\mu}m^2$. It consumes the power of 0.818 mW with a 1.8 V supply and the FoM is 91.8 fJ/conversion-step.