• Title/Summary/Keyword: RF-Sputtering

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이종밴드갭을 갖는 $TiO_2/Cr_2O_3$/Cr 다층박막의 친수성

  • Park, Seon-Ho;Lee, Gi-Seon;Mun, Chang-Jun
    • Proceedings of the Korean Vacuum Society Conference
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    • 2010.02a
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    • pp.373-373
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    • 2010
  • 광촉매능을 갖는 $TiO_2$는 국내외적으로 많은 연구가 진행되고 있다. 빛의 조사로 발생하는 다양한 물리 화학적 촉매특성이 환경정화 뿐만 아니라 및 에너지 흡수차단 기능도 갖고 있어 최근 주목을 받고 있다. 응용분야로 초친수성 유리제품, 필터, 살균기능의 의료용 부품소재, 고효율 수소생산 및 태양전지 등에 활용성이 커서 친환경에너지 소재로 각광을 받고 있다. 본 연구에서는 초친수성 자동차의 사이드미러 개발을 위해 유리표면에 초친수성 $TiO_2$를 코팅하 고 그의 특성을 평가하였다. 특히, 이종밴드갭을 갖는 복합구조 $TiO_2/Cr_2O_3$/Cr 박막을 스퍼터링법으로 증착하여 중간층인 $Cr_2O_3$의 역할을 고찰하였다. 제조된 박막의 결정구조는 thin film형 X-선회절기(XRD)를 사용하여 분석하였으며, 박막의 표면 미세구조는 FE-SEM(Field Emission Scanning Electron Microscope)와 AFM(Atomic Force Microscope)으로, 화학구조는 XPS(X-ray Photoelectron Spectroscope)로 분석하였다. 친수성 평가는 실온 분위기에서 접촉각 측정기(Topcon-UVR2)를 사용하여 평가 하였으며 이때 조사되는 UV는 파장이 365nm이다. $Cr_2O_3$(비정질)/Cr박막위에 제조된 $TiO_2$ 박막은 균일한 anatase-$TiO_2$가 성장했으나, Cr, $Cr_2O_3$(결정질)박막위에 제조 된 $TiO_2$ 박막은 anatase상과 rulile상이 혼합된 형태로 성장하였다. $TiO_2$/Cr, $TiO_2/Cr_2O_3$(비정질)/Cr, $TiO_2/Cr_2O_3$(결정질)/Cr박막은 UV조사 1시간 만에 $10^{\circ}$ 이하의 초친수성을 나타내었다. 이종 밴드갭을 갖는 $TiO_2/Cr_2O_3$(비정질)/Cr박막은 40시간까지 친수성을 유지하는 결과를 나타냈다.

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Effect of Annealing Temperature after Deposition on the Structural, Electrical and Optical Properties of In2O3 Films (증착 후 열처리 온도에 따른 In2O3 박막의 구조적, 전기적, 광학적 특성 변화)

  • Lee, Y.J.;Lee, H.M.;Heo, S.B.;Kim, Y.S.;Chae, J.H.;Kong, Y.M.;Kim, Daeil
    • Journal of the Korean Society for Heat Treatment
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    • v.24 no.6
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    • pp.307-310
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    • 2011
  • We have investigated the structural, electrical and optical properties of $In_2O_3$ thin films deposited by RF magnetron sputtering and then annealed at $150^{\circ}C$ and $300^{\circ}C$ in vacuum. The structural and electrical properties are strongly related to annealing temperature. All the annealed $In_2O_3$ films are grown as a hexagonal wurtzite phase and the largest grain size is observed in the films annealed at $300^{\circ}C$. The sheet resistance decreases with a increase in annealing temperature and $In_2O_3$ film annealed at $300^{\circ}C$ shows the lowest sheet resistance of $174{\Omega}/{\Box}$. The optical transmittance of $In_2O_3$ films in a visible wavelength region also depends on the annealing temperature. The films annealed at $300^{\circ}C$ show higher transmittance of 76% than those of the films prepared in this study.

Effect of Annealing in Nitrogen Atmosphere on the Characteristics of Ga Doped ZnO Films (Ga doped ZnO 박막의 질소분위기 열처리에 따른 특성 변화)

  • Heo, Sung-Bo;Lee, Young-Jin;Lee, Hak-Min;Kim, Sun Kwang;Kim, Yu Sung;Kong, Young Min;Kim, Dae-Il
    • Journal of the Korean Society for Heat Treatment
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    • v.24 no.6
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    • pp.338-342
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    • 2011
  • Ga doped ZnO (GZO) thin films were deposited with RF magnetron sputtering on glass substrate and then the effect of post deposition annealing at nitrogen atmosphere on the structural, optical and electrical properties of the films was investigated. The post deposition annealing process was conducted for 30 minutes at different temperature of 150, 300 and $450^{\circ}C$, respectively. As increase annealing temperature, GZO films show the increment of the prefer orientation of ZnO (002) diffraction peak in the XRD pattern and the optical transmittance in a visible wave region was also increased, while the electrical sheet resistance was decreased. The figure of merit obtained in this study means that GZO films which vacuum annealed at $450^{\circ}C$ have the highest optoelectrical performance in this study.

The Magnetic Properties of Co-Ni-Fe-N Soft Magnetic Thin Films

  • Kim, Y. M.;Park, D.;Kim, K. H.;Kim, J.;S. H. Han;Kim, H. J.
    • Journal of Magnetics
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    • v.5 no.4
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    • pp.120-123
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    • 2000
  • Co-Ni-Fe-N thin films were fabricated by a $N_2$ reactive rf magnetron sputtering method. The nitrogen partial pressure ($P_{N2}$) was varied in the range 0~10% . As$P_{N2}$ increases in this range, the saturation magnetization $B_s$ linearly decreases from 19.8 kG to 14 kG and the electrical resistivity ($\rho$) increases from 27 to 155 $\mu\Omegacm$. The coercivity $H_c$ exhibits the minimum value at 4% $P_{N2}$. The magnetic anisotropy fields ($H_k$) are in the range of 20$\sim$50 Oe. High frequency characteristics of $(Co_{22.2}Ni_{27.6}Fe_{50.2})_{100-x}N_x$ films are excellent in the range of 3$\sim$5% of $P_{N2}$. In particular, the effective permeability of the film fabricated at 4% $P_{N2}$ is 800, which is maintained up to 600 MHz. This film also shows Bs of 17.5 kG, $H_c$/ of 1.4 Oe, resistivity of 98$\mu\Omegacm$ and $H_k$ of about 25 Oe. Also, the corrosion resistance of $(Co_{22.2}Ni_{27.6}Fe_{50.2})_{100-x}N_x$ films was imp roved with increasing N concentration.

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The Effect of electron beam surface irradiation on the properties of SnO2/Ag/SnO2 thin films (전자빔 표면 조사에 따른 SnO2/Ag/SnO2 박막의 특성 연구)

  • Jang, Jin-Kyu;Kim, Hyun-Jin;Choi, Jae-Wook;Lee, Yeon-Hak;Kong, Young-Min;Heo, Sung-Bo;Kim, Yu-Sung;Kim, Daeil
    • Journal of the Korean institute of surface engineering
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    • v.54 no.6
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    • pp.302-306
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    • 2021
  • SnO2 30/Ag 15/SnO2 30 nm(SAS) tri-layer films were deposited on the glass substrates with RF and DC magnetron sputtering and then electron beam is irradiated on the surface to investigate the effect of electron bombardment on the opto-electrical performance of the films. electron beam irradiated tri-layer films at 1000 eV show a higher figure of merit of 2.72×10-3 Ω-1 than the as deposited films due to a high visible light transmittance of 72.1% and a low sheet resistance of 14.0 Ω/☐, respectively. From the observed results, it is concluded that the post-deposition electron irradiated SnO2 30/Ag 15/SnO2 30 nm tri-layer films can be used as a substitute for conventional transparent conducting oxide films in various opto-electrical applications.

Optically Transparent ITO Film and the Fabrication of Plasma Signboard (투명 전극 ITO 박막의 열처리 영향과 플라즈마 응용 표시소자 제작에 관한 연구)

  • Jo, Young Je;Kim, Jae-Kwan;Han, Seung-Cheol;Kwak, Joon-Seop;Lee, Ji-Myon
    • Korean Journal of Metals and Materials
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    • v.47 no.1
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    • pp.44-49
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    • 2009
  • Indium tin oxide(ITO) thin films were deposited on the glass substrates by radio-frequency (RF) magnetron sputtering method. The influence of rapid thermal annealing (RTA) treatment on the optical and electrical properties of the films were investigated for the purpose of fabricating plasma display signboard. Structural properties, surface roughness, sheet resistance and transmittance of the ITO film were analysed by using x-ray diffraction method, atomic force microscopy (AFM), four point prove, and ultraviolet-visible spectrometer, respectively. It was found that the RTA treatment increased the transmittance and decreased the resistivity of the ITO film, respectively. Furthermore, we successfully demonstrated the direct-current plasma signboard by using ITO electrode and phosphors.

Influence of Ag Interlayer on the Optical and Electrical Properties of SnO2 Thin Films (Ag 중간층이 SnO2 박막의 광학적, 전기적 특성에 미치는 영향)

  • Jang, Jin-Kyu;Kim, Hyun-Jin;Choi, Jae-Wook;Lee, Yeon-Hak;Heo, Sung-Bo;Kim, Yu-Sung;Kong, Young-Min;Kim, Daeil
    • Journal of the Korean institute of surface engineering
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    • v.54 no.3
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    • pp.119-123
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    • 2021
  • SnO2 single layer and SnO2/Ag/SnO2 (SAS) tri-layered films were deposited on the glass substrate by RF and DC magnetron sputtering at room temperature and then the effect of Ag interlayer on the opto-electrical performance of the films were considered. As deposited SnO2 films show a visible transmittance of 85.5 % and a sheet resistance of 1.2×104 Ω/□, the SAS films with a 15 nm thick Ag interlayer show a lower resistance of 18.8 Ω/□ and a visible transmittance of 70.6 %, respectively. The figure of merit based on the optical transmittance and sheet resistance revealed that the Ag interlayer in the SnO2 films enhances the opto-electrical performance without substrate heating or annealing process.

Effect of Ag interlayer on the optical and electrical properties of ZnO thin films (Ag 중간층 두께에 따른 ZnO 박막의 광학적, 전기적 특성 연구)

  • Kim, Hyun-Jin;Jang, Jin-Kyu;Choi, Jae-Wook;Lee, Yeon-Hak;Heo, Sung-Bo;Kong, Young-Min;Kim, Daeil
    • Journal of the Korean institute of surface engineering
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    • v.55 no.2
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    • pp.91-95
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    • 2022
  • ZnO single layer (60 nm thick) and ZnO with Ag interlayer (ZnO/Ag/ZnO; ZAZ) films were deposited on the glass substrates by using radio frequency (RF) and direct current (DC) magnetron sputter to evaluate the effectiveness of Ag interlayer on the optical visible transmittance and the conductivity of the films. In the ZAZ films, the thickness of ZnO layers was kept at 30 nm, while the Ag thickness was varied as 5, 10, 15 and 20 nm. In X-ray diffraction (XRD) analysis, ZnO films show the (002) diffraction peak and ZAZ films also show the weak ZnO (002) peak and Ag (111) diffraction peak. As a thickness of Ag interlayer increased to 20 nm, the grain size of the Ag films enlarged to 11.42 nm and the optical band gap also increased from 4.15 to 4.22 eV with carrier concentration increasing from 4.9 to 10.5×1021 cm-3. In figure of merit measurements, the ZAZ films with a 10 nm thick Ag interlayer showed the higher figure of merit of 4.0×10-3 Ω-1 than the ZnO single layer and another ZAZ films. From the experimental result, it is assumed that the Ag interlayer enhanced effectively the opto-electrical performance of the ZAZ films.

Sensing characteristics of a non-dispersive infrared CO2 sensor using a Fabry-Perot filter based on distributed Bragg reflector (분산 반사경 기반 패브리-페로 필터를 이용한 비분산적외선 CO2 센서의 감지 특성)

  • Do, Nam Gon;Lee, Junyeop;Jung, Dong Geon;Kong, Seong Ho;Jung, Daewoong
    • Journal of Sensor Science and Technology
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    • v.30 no.6
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    • pp.446-450
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    • 2021
  • Non-dispersive infrared (NDIR) gas sensors typically use an optical filter that transmits a discriminating 4.26 ㎛ wavelength band to measure carbon dioxide (CO2), as CO2 absorbs 4.26 ㎛ infrared. The filter performance depends on the transmittance and full width at half maximum (FWHM). This paper presents the fabrication, sensitivity, and selectivity characteristics of a distributed Bragg reflector (DBR)-based Fabry-Perot filter with a simple structure for CO2 detection. Each Ge and SiO2 films were prepared using the RF magnetron sputtering technique. The transmittance characteristics were measured using Fourier-transform infrared spectroscopy (FT-IR). The fabricated filter had a peak transmittance of 59.1% at 4.26 ㎛ and a FWHM of 158 nm. In addition, sensitivity and selectivity experiments were conducted by mounting the sapphire substrate and the fabricated filter on an NDIR CO2 sensor measurement system. When measuring the sensitivity, the concentration of CO2 was observed in the range of 0-10000 ppm, and the selectivity was measured for environmental gases of 1000 ppm. The fabricated filter showed lower sensitivity to CO2 but showed higher selectivity with other gases.

Influence of Oxygen Annealing on Temperature Dependent Electrical Characteristics of Ga2O3/4H-SiC Heterojunction Diodes (산소 후열처리가 Ga2O3/4H-SiC 이종접합 다이오드의 온도에 따른 전기적 특성에 미치는 영향 분석)

  • Chung, Seung Hwan;Lee, Hyung Jin;Lee, Hee Jae;Byun, Dong Wook;Koo, Sang Mo
    • Journal of the Semiconductor & Display Technology
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    • v.21 no.4
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    • pp.138-143
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    • 2022
  • We analyzed the influence of post-annealing on Ga2O3/n-type 4H-SiC heterojunction diode. Gallium oxide (Ga2O3) thin films were deposited by radio frequency (RF) sputtering. Post-deposition annealing at 950℃ in an Oxygen atmosphere was performed. The material properties of Ga2O3 and the electrical properties of the diodes were investigated. Atomic Force Microscopy (AFM), X-Ray Diffraction and Scanning Electron Microscope (SEM) images show a significant increase in the roughness and crystallinity of the O2-annealed films. After Oxygen annealing X-ray Photoelectron Spectroscopy (XPS) shows that the atomic ratio of oxygen increases which is related to a decrease in oxygen vacancy within the Ga2O3 film. The O2-annealed diodes exhibited higher on-current and lower leakage current. Moreover, the ideality factor, barrier height, and thermal activation energy were derived from the current-voltage curve by increasing the temperature from 298 - 434K.