• Title/Summary/Keyword: INL

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The Analysis of Total Ionizing Dose Effects on Analog-to-Digital Converter for Space Application (우주용 ADC의 누적방사선량 영향 분석)

  • Kim, Tae-Hyo;Lee, Hee-Chul
    • Journal of the Institute of Electronics and Information Engineers
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    • v.50 no.6
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    • pp.85-90
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    • 2013
  • In this paper, 6bit SAR ADC tolerant to ionizing radiation is presented. Radiation tolerance is achieved by using the Dummy Gate Assisted (DGA) MOSFET which was proposed to suppress the leakage current induced by ionizing radiation and its comparing sample is designed with the conventional MOSFET. The designed ADC consists of binary capacitor DAC, dynamic latch comparator, and digital logic and was fabricated using a standard 0.35um CMOS process. Irradiation was performed by Co-60 gamma ray. After the irradiation, ADC designed with the conventional MOSFET did not operate properly. On the contrary, ADC designed with the DGA MOSFET showed a little parametric degradation of which DNL was increased from 0.7LSB to 2.0LSB and INL was increased from 1.8LSB to 3.2LSB. In spite of its parametric degradation, analog to digital conversion in the ADC with DGA MOSFET was found to be possible.

A 8-bit 10-MSample/s Folding & Interpolation ADC using Preamplifier Sharing Method (전치 증폭기 공유 기법을 이용한 8-bit 10-MSample/s Folding & Interpolation ADC)

  • Ahn, Cheol-Min;Kim, Young-Sik
    • Journal of IKEEE
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    • v.17 no.3
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    • pp.275-283
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    • 2013
  • In this paper, a 8bit 10Ms/s CMOS Folding and Interpolation analog-to-digital convertor is proposed. The architecture of the proposed ADC is based on a Folding & Interpolation using FR(Folding Rate)=8, NFB(Number of Folding Block)=4, IR(Interpolation Rate)=8. The proposed ADC adopts a preamplifier sharing method to decrease the number of preamplifier by half comparing to the conventional ones. This chip has been fabricated with a 0.35[um] CMOS technology. The effective chip area is $1.8[mm]{\times}2.11[mm]$ and it consumes 20[mA] at 3.3 power supply with 10[MHz] clock. The INL is -0.57, +0.61 [LSB] and DNL is -0.4, +0.51 [LSB]. The SFDR is 48.9[dB] and SNDR is 47.9[dB](ENOB 7.6b) when the input frequency is 100[kHz] at 10[MHz] conversion rate.

A 10-Bit 210MHz CMOS D/A Converter (WLAN용 10bit 210MHz CMOS D/A 변환기 설계)

  • Cho, Hyun-Ho;Yoon, Kwang-Sub
    • Journal of the Institute of Electronics Engineers of Korea TC
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    • v.42 no.11
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    • pp.61-66
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    • 2005
  • This paper describes a 10-bit 210MHz CMOS current-mode Digital-to-Analog Converter (DAC) consisting of 6 bit MSB current cell matrix Sub-DAC, 2 bit mSB unary current source Sub-DAC, and 2 bit LSB binary weighting Sub-DAC for Wireless LAN application. A new deglitch circuit is proposed to control a crossing point of signals and minimize a glitch energy. The proposed 10-bit CMOS current mode DAC was designed by a $0.35{\mu}m$ CMOS double-poly four-metal technology rate of 210MHz, DNL/INL of ${\pm}0.7LSB/{\pm}1.1LSB$, a glitch energy of $76pV{\cdot}sec$, a SNR of 50dB, a SFDR of 53dB at 200MHz sampling clock and power dissipation of 83mW at 3.3V

A 10-bit 40-MS/s Low-Power CMOS Pipelined A/D Converter Design (10-bit 40-MS/s 저전력 CMOS 파이프라인 A/D 변환기 설계)

  • Lee, Sea-Young;Yu, Sang-Dae
    • Journal of Sensor Science and Technology
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    • v.6 no.2
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    • pp.137-144
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    • 1997
  • In this paper, the design of a 10-bit 40-MS/s pipelined A/D converter is implemented to achieve low static power dissipation of 70 mW at the ${\pm}2.5\;V$ or +5 V power supply environment for high speed applications. A 1.5 b/stage pipeline architecture in the proposed ADC is used to allow large correction range for comparator offset and perform the fast interstage signal processing. According to necessity of high-performance op amps for design of the ADC, the new op amp with gain boosting based on a typical folded-cascode architecture is designed by using SAPICE that is an automatic design tool of op amps based on circuit simulation. A dynamic comparator with a capacitive reference voltage divider that consumes nearly no static power for this low power ADC was adopted. The ADC implemented using a $1.0{\mu}m$ n-well CMOS technology exhibits a DNL of ${\pm}0.6$ LSB, INL of +1/-0.75 LSB and SNDR of 56.3 dB for 9.97 MHz input while sampling at 40 MHz.

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Analog Front-End IC for Automotive Battery Sensor (차량 배터리 센서용 Analog Front-End IC 설계)

  • Yeo, Jae-Jin;Jeong, Bong-Yong;Roh, Jeong-Jin
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.48 no.10
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    • pp.6-14
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    • 2011
  • This paper presents the design of the battery sensor IC for instrumentation of current, voltage using delta-sigma ADC. The proposed circuit consists of programmable gain instrumentation amplifier (PGIA) and second-order discrete-time delta-sigma modulator with 1-bit quantization were fabricated by a 0.25 ${\mu}m$ CMOS technology. Design circuit show that the modulator achieves 82 dB signal-to-noise ratio (SNR) over a 2 kHz signal bandwidth with an oversampling ratio (OSR) of 256 and differential nonlinearity (DNL) of ${\pm}$ 0.3 LSB, integral nonlinearity (INL) of ${\pm}$ 0.5 LSB. Power consumption is 4.5 mW.

Incremental Delta-Sigma Analog to Digital Converter for Sensor (센서용 Incremental 델타-시그마 아날로그 디지털 변환기 설계)

  • Jeong, Jinyoung;Choi, Danbi;Roh, Jeongjin
    • Journal of the Institute of Electronics and Information Engineers
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    • v.49 no.10
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    • pp.148-158
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    • 2012
  • This paper presents the design of the incremental delta-sigma ADC. The proposed circuit consists of pre-amplifier, S & H circuit, MUX, delta-sigma modulator, and decimation filter. Third-order discrete-time delta-sigma modulator with 1-bit quantization were fabricated by a $0.18{\mu}m$ CMOS technology. The designed circuit show that the modulator achieves 87.8 dB signal-to-noise and distortion ratio (SNDR) over a 5 kHz signal bandwidth and differential nonlinearity (DNL) of ${\pm}0.25$ LSB, integral nonlinearity (INL) of ${\pm}0.2$ LSB. Power consumption of delta-sigma modulator is $941.6{\mu}W$. It was decided that N cycles are 200 clock for 16-bits output.

A 10-bit CMOS Time-Interpolation Digital-to-Analog Converter (10-비트 CMOS 시간-인터폴레이션 디지털-아날로그 변환기)

  • Kim, Myngyu;Jang, Young-Chan
    • Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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    • 2012.10a
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    • pp.225-228
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    • 2012
  • In this paper, a 10-bit digital-to-analog converter (DAC) with small area is proposed. The 10-bit DAC consists of a 8-bit decoder, a 2-bit time-interpolator, and a buffer amplifier. The proposed time-interpolation is achieved by controlling the charging time through a low-pass filter composed of a resistor and a capacitor. To implement the accurate time-interpolator, a control pulse generator using a replica circuit is proposed to minimize the effect of the process variation. The proposed 10-bit Time-Interpolation DAC occupies 61 % of the conventional 10-bit resistor-string DAC. The proposed DAC is designed using a $0.35{\mu}m$ CMOS process with a 3.3 V supply. The simulated DNL and INL are +0.15/-0.21 LSB and +0.15/-0.16 LSB, respectively.

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An 8b 220 MS/s 0.25 um CMOS Pipeline ADC with On-Chip RC-Filter Based Voltage References (온-칩 RC 필터 기반의 기준전압을 사용하는 8b 220 MS/s 0.25 um CMOS 파이프라인 A/D 변환기)

  • 이명진;배현희;배우진;조영재;이승훈;김영록
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.41 no.10
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    • pp.69-75
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    • 2004
  • This work proposes an 8b 220 MS/s 230 mW 3-stage pipeline CMOS ADC with on-chip filers for temperature- and power- insensitive voltage references. The proposed RC low-pass filters improve switching noise performance and reduce reference settling time at heavy R & C loads without conventional off-chip large bypass capacitors. The prototype ABC fabricated in a 0.25 um CMOS occupies the active die area of 2.25 $\textrm{mm}^2$ and shows the measured DNL and INL of maximum 0.43 LSB and 0.82 LSB, respectively. The ADC maintains the SNDR of 43 dB and 41 dB up to the 110 MHz input at 200 MS/s and 220 MS/s, respectively, while the SNDR at the 500 MHz input is degraded as much as only 3 dB than the SNDR at the 110 MHz input.

I-Q Channel 12bit 1GS/s CMOS DAC for WCDMA (WCDMA 통신용 I-Q 채널 12비트 1GS/s CMOS DAC)

  • Seo, Sung-Uk;Shin, Sun-Hwa;Joo, Chan-Yang;Kim, Soo-Jae;Yoon, Kwang-S.
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.45 no.1
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    • pp.56-63
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    • 2008
  • This paper describes a 12 bit 1GS/s current mode segmented DAC for WCDMA communication. The proposed circuit in this paper employes segmented structure which consists of 4bit binary weighted structure in the LSB and 4bit thermometer decoder structure in the mSB and MSB. The proposed DAC uses delay time compensation circuits in order to suppress performance decline by delay time in segmented structure. The delay time compensation circuit comprises of phase frequency detector, charge pump, and control circuits, so that suppress delay time by binary weighted structure and thermometer decoder structure. The proposed DAC uses CMOS $0.18{\mu}m$ 1-poly 6-metal n-well process, and measured INL/DNL are below ${\pm}0.93LSB/{\pm}0.62LSB$. SFDR is approximately 60dB and SNDR is 51dB at 1MHz input frequency. Single DAC's power consumption is 46.2mW.

A 500MSamples/s 6-Bit CMOS Folding and Interpolating AD Converter (500MSamples/s 6-비트 CMOS 폴딩-인터폴레이팅 아날로그-디지털 변환기)

  • Lee Don-Suep;Kwack Kae-Dal
    • Journal of the Korea Institute of Information and Communication Engineering
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    • v.8 no.7
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    • pp.1442-1447
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    • 2004
  • In this paper, a 6-Bit CMOS Folding and Interpolating AD Converter is presented. The converter is considered to be useful as an integrated part of a VLSI circuit handling both analog and digital signals as in the case of HDD or LAN applications. A built-in analog circuit for VLSI of a high-speed data communication requires a small chip area, low power consumption, and fast data processing. The proposed folding and interpolating AD Converter uses a very small number of comparators and interpolation resistors, which is achieved by cascading a couple of folders working in different principles. This reduced number of parts is a big advantage for a built-in AD converter design. The design is based on 0.25m double-poly 2 metal n-well CMOS process. In the simulation, with the applied 2.5V and a sampling frequency of 500MHz, the measurements are as follows: power consumption of 27mw, INL and DNL of $\pm$0.1LSB, $\pm$0.15LSB each, SNDR of 42dB with an input signal of 10MHz.