• Journal of the Semiconductor & Display Technology
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• v.3 no.4
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• pp.19-27
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• 2004

The characteristic evaluation of A/D converter is to measure the linearity of the converter. The evaluation of the linearity is to measure the DNL, INL, gain error and offset error in the various test parameters of A/D converter. Generally, DNL and INL are to be measured by the Histogram Test Algorithm in the DSP-based ATE environment. And gain error and offset error are to be measured by the calculation equation of the measuring algorithm. It is to propose the new Concurrent Histogram Test Algorithm for the test of the housekeeping A/D converter used in the CDMA cellular phone. Using the proposed method, it is to measure the DNL, INL, gain error and offset error concurrently and to show the measured results.

• Proceedings of the IEEK Conference
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• 2005.11a
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• pp.1241-1246
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• 2005

This paper described an 8bit, 100Msample/s CMOS D/A converter using a glich-time minimization technique for the high-speed sampling rate of 100MHz level. The proposed DAC was implemented in 0,35um Hynix CMOS technology and adopts a current mode architecture to optimize sampling rate, resolution, chip area. The DAC linear characteristics was similar to the proposed specification the prototype error between DNL and INL is less than ${\pm}0.09LSB$ respectively. Also, fab-out chip was tested, analysed the cause of error operation, and proposed the field considerations for chip test.

• 전자공학회논문지 IE
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• v.43 no.3
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• pp.6-12
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• 2006

This paper described an 8bit, 100Msample/s CMOS D/A converter using a glitch-time minimization technique for the high-speed sampling rate of 100MHz level. The proposed DAC was implemented in $0.35{\mu}m$ Hynix CMOS technology and adopts a current mode architecture to optimize sampling rate, resolution, chip area. The DAC linear characteristics was similar to the proposed specification and the prototype error between DNL and INL is less than $\pm$0.09LSB respectively. Also, the manufactured DAC chip was analyzed the cause of error operation and proposed the field considerations for chip test.

• The Journal of the Korea institute of electronic communication sciences
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• v.6 no.4
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• pp.545-552
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• 2011

In this article, reference voltages in a general flash ADC are not obtained from a series of resistors but floating gates. When a behavior model simulation was performed in a pipelined ADC including the suggested flash ADC as a result of an ADC's overall function, it showed results that SNR is approximately 77 dB and resolution is 12 bit. And more than almost 90% showed INL within ${\pm}0.5$ LSB, and like INL, more than 90% showed DNL within ${\pm}0.5$ LSB.

• Journal of the Korean Institute of Telematics and Electronics C
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• v.35C no.9
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• pp.57-63
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• 1998

This paper describes a CMOS digital-to-analog converter to apply a newly-developed digital-to-analog conversion algorithm. The CMOS digital-to-analog converter has been designed by using 1.2$\mu\textrm{m}$ MOSIS SCMOS parameter and simulated for the performance. The simulated results have shown that the digital-to-analog converter has 200MHz of the maximum conversion rate, 7.41mW of the DC power consumption, and ${\pm}$0.08LSB of INL and ${\pm}$0.098LSB of DNL in 8-b.

• The Journal of Korean Institute of Communications and Information Sciences
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• v.24 no.8A
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• pp.1259-1264
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• 1999

In this paper, the High-speed, Low-power Analog-Digital Conversion Archecture is porposed using the Pipelined archecture for High-speed conversion rate and the Successive-Approximation archecture for Low-power consumption. This archecture is the Successive-Approximation archecture using Pipelined Comparator array to change reference voltage during Holding Time. The Analog-to-Digital Converter for video processing is designed using 0.8${\mu}{\textrm}{m}$ CMOS tchnology. When an 6-bit 10MS/s Analog-to-Digital Converter is simulatined, the INL/DNL errors are $\pm$0.5/$\pm$1, respectively. The SNR is 37dB at a sampling rate of 10MHz with 100KHz sine input signal. The power consumption is 1.46mW at 10MS/s. When an 8-bit 10MS/s Analog-to Digital Converter is simulatined, the INL/DNL errors are $\pm$0.5/$\pm$1, respectively. The SNR is 41dB at a sampling rate of 100MHz with 100KHz sine input signal. The power consumption is 4.14m W at 10MS/s.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.46 no.2
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• pp.1-8
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• 2009

We designed an ADC that operated upto 500Msamples/sec based on proposed R-string folding block as well as second folding block. The upper four bits are processed in parallel by the R-string folding block while the lower four bits are processed in pipeline structured second folding block to supply digital output. To verify the circuit performance, we conducted HSPICE simulation and the average power consumption was only 1.34mW even when the circuit was running at its maximum sampling frequency. We further measured noise immunity by applying linear ramp signal to the input. The DNL was between -0.56*LSB and 0.49*LSB and the INL was between -0.93*LSB and 0.72*LSB. We used 0.35 microns MOSIS device parameters for this work.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.9 no.5
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• pp.1073-1081
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• 2005

This paper describes a 3.3 V 10 bit CMOS digital-to-analog converter with a divided architecture of a 7 MSB and a 3 LSB, which uses an optimal Thermal-to-Binary Decoding method. Most of Dfh converters with hiか speed current drive are an architecture choosing current switch cell, column, row decoding method but this decoding circuit is complicated, occupies a large chip area. For these problems, this paper describes a D/A converter using an optimal Thermal-to-Binary Decoding method. The designed D/A converter with an active chip area of $0.953\;mm^2$ is fabricated by using a 0.35um process. The simulation data shows that the rise/fall time, settling time, and INL/DNL are 1.92/2.1 ns, 12.71 ns, and a less than ${\pm}2.3/{\pm}58$ LSB, respectively. The power dissipation of the D/A converter with a single power supply of 3.3 V is about 224 mW.

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2007.10a
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• pp.187-191
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• 2007

This paper describes a 3.3V 10 bit CMOS digital-to-analog converter with a divided architecture of a 7 MSB and a 3 LSB, which uses an optimal Thermal-to-Binary Decoding method with monotonicity, glitch energy. The output stage utilizes here implements a return-to-zero circuit to obtain the dynamic performance. Most of D/A converters in decoding circuit is complicated, occupies a large chip area. For these problems, this paper describes a D/A converter using an optimal Thermal-to-Binary Decoding method. the designed D/A converter using the CMOS n-well $0.35{\mu}m$ process0. The experimental data shows that the rise/fall time, settling time, and INL/DNL are 1.90ns/2.0ns, 12.79ns, and a less than ${\pm}2.5/{\pm}0.7$ LSB, respectively. The power dissipation of the D/A converter with a single power supply of 3.3V is about 250mW.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.12 no.4
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• pp.691-698
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• 2008

This paper describes a 3.3V 10 bit CMOS digital-to-analog converter with a divided architecture of a 7 MSB and a 3 LSB, which uses an optimal Thermal-to-Binary Decoding method with monotonicity, glitch energy. The output stage utilizes here implements a return-to-zero circuit to obtain the dynamic performance. Most of D/A converters in decoding circuit is complicated, occupies a large chip area. For these problems, this paper describes a D/A converter using an optimal Thermal-to-Binary Decoding method. the designed D/A converter using the CMOS n-well $0.35{\mu}m$ process0. The experimental data shows that the rise/fall time, settling time, and INL/DNL are 1.90ns/2.0ns, 12.79ns, and a less than ${\pm}2.5/{\pm}0.7\;LSB$, respectively. The power dissipation of the D/A converter with a single power supply of 3.3V is about 250mW.