• Title/Summary/Keyword: Ge-Sb-Se

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Optical properties of Ag/$Ge_1Se_1Te_2$ material with secondary Ag layer adoption (두 번째 Ag 층을 적용한 Ag/$Ge_1Se_1Te_2$ 물질의 광학적 특성 연구)

  • Kim, Hyun-Koo;Han, Song-Lee;Kim, Jae-Hoon;Koo, Sang-Mo;Chung, Hong-Bay
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2008.06a
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    • pp.191-192
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    • 2008
  • For phase transition method, good record sensitivity, low heat radiation, fast crystallization and hi-resolution are essential. Also, a retention time is very important part for phase-transition. In our past papers, we chose composition of $Ge_1Se_1Te_2$ material to use a Se factor which has good optical sensitivity than conventional Sb. Ge-Se-Te and Ag/$Ge_1Se_1Te_2$ samples are fabricated and irradiated with He-Ne laser and DPSS laser to investigate a reversible phase change by light. Because of Ag ions, the Ag layer inserted sample showed better performance than conventional one. We should note that this novel one showed another possibility for phase-change random access memory.

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The study about phase phase change material at nano-scale using c-AFM method (c-AFM 기술을 이용한 나노급 상변화 소자 특성 평가에 대한 연구)

  • Hong, Sung-Hoon;Lee, Heon
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2010.06a
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    • pp.57-57
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    • 2010
  • In this study, nano-sized phase change materials were evaluated using nanoimprint lithography and c-AFM technique. The 200nm in diameter phase change nano-pillar device of GeSbTe, AgInSbTe, InSe, GeTe, GeSb were successfully fabricated using nanoimprint lithography. And the electrical properties of the phase change nano-pillar device were evaluated using c-AFM with pulse generator and voltage source.

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Glass Forming Stability in Chalcogenide-based GeSbSe Materials for IR-Lens (적외선 렌즈용 Ge-Sb-Se계 칼코게나이드의 유리안정성 평가)

  • Jung, Gun-Hong;Kong, Heon;Yeo, Jong-Bin;Lee, Hyun-Yong
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.30 no.4
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    • pp.204-209
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    • 2017
  • Thermal and structural stability in the glass transition region of chalcogenide glasses has been investigated in terms of thermodynamics for application to various optoelectronic devices. In this study, the compositions of $Ge_xSb_{20}Se_{80-x}$ (x = 10, 15, 20, 25, and 30) were selected to investigate the glass stability according to germanium ratios. The chalcogenide bulks were fabricated by using a traditional melt-quenching method. Thin films were deposited by a thermal evaporation system, maintaining the deposition ratio of $3{\sim}5{\AA}$ in order to have uniformity. The thermal and structural properties were measured by a differential scanning calorimeter (DSC) and X-ray diffraction (XRD). The DSC analysis provided thermal parameters and theoretical glass region stabilities. The XRD analysis supported the theoretical stabilities because of where the crystallization peak data occurred.

A high performance nonvolatile memory cell with phase change material of $Ge_1Se_1Te_2$ ($Ge_1Se_1Te_2$ 상변화 재료를 이용한 고성능 비휘발성 메모리에 대한 연구)

  • Lee, Jae-Min;Shin, Kyung;Chung, Hong-Bay
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2005.07a
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    • pp.15-16
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    • 2005
  • Chalcogenide phase change memory has high performance to be next generation memory, because it is a nonvolatile memory processing high programming speed, low programming voltage, high sensing margin, low consumption and long cycle duration. We have developed a new material of PRAM with $Ge_1Se_1Te_2$. This material has been propose to solve the high energy consumption and high programming current. We have investigated the phase transition behaviors in function of various process factor including contact size, cell size, and annealing time. As a result, we have observed that programming voltage and writing current of $Ge_1Se_1Te_2$ are more improved than $Ge_2Sb_2Te_5$ material.

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Selenide Glass Optical Fiber Doped with $Pr^{3+}$ for U-Band Optical Amplifier

  • Chung, Woon-Jin;Seo, Hong-Seok;Park, Bong-Je;Ahn, Joon-Tae;Choi, Yong-Gyu
    • ETRI Journal
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    • v.27 no.4
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    • pp.411-417
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    • 2005
  • $Pr^{3+}-doped$ selenide glass optical fiber, which guarantees single-mode propagation of above at least 1310 nm, has been successfully fabricated using a Ge-Ga-Sb-Se glass system. Thermal properties such as glass transition temperature and viscosity of the glasses have been analyzed to find optimum conditions for fiber drawing. Attenuation loss incorporating the effects of an electronic band gap transition, Rayleigh scattering, and multiphonon absorption has also been theoretically estimated for the Ge-Ga-Sb-Se fiber. A conventional double crucible technique has been applied to fabricate the selenide fiber. The background loss of the fiber was estimated to be approximately 0.64 dB/m at 1650 nm, which can be considered fairly good. When excited at approximately 1470 nm, $Pr^{3+}-doped$ selenide fiber resulted in amplified spontaneous emission and saturation behavior with increasing pump power in a U-band wavelength range of 1625 to 1675 nm.

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Electrical Switching Characteristics of Ge1Se1Te2 Chalcogenide Thin Film for Phase Change Memory

  • Lee, Jae-Min;Yeo, Cheol-Ho;Shin, Kyung;Chung, Hong-Bay
    • Transactions on Electrical and Electronic Materials
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    • v.7 no.1
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    • pp.7-11
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    • 2006
  • The changes of the electrical conductivity in chalcogenide amorphous semiconductors, $Ge_{1}Se_{1}Te_{2}$, have been studied. A phase change random access memory (PRAM) device without an access transistor is successfully fabricated with the $Ge_{1}Se_{1}Te_{2}$-phase-change resistor, which has much higher electrical resistivity than $Ge_{2}Sb_{2}Te_{5}$ and its electric resistivity can be varied by the factor of $10^5$ times, relating with the degree of crystallization. 100 nm thick $Ge_{1}Se_{1}Te_{2}$ thin film was formed by vacuum deposition at $1.5{\times}10^{-5}$ Torr. The static mode switching (DC test) is tested for the $100\;{\mu}m-sized$ $Ge_{1}Se_{1}Te_{2}$ PRAM device. In the first sweep, the amorphous $Ge_{1}Se_{1}Te_{2}$ thin film showed a high resistance state at low voltage region. However, when it reached to the threshold voltage, $V_{th}$, the electrical resistance of device was drastically reduced through the formation of an electrically conducting path. The pulsed mode switching of the $20{\mu}m-sized$ $Ge_{1}Se_{1}Te_{2}$ PRAM device showed that the reset of device was done with a 80 ns-8.6 V pulse and the set of device was done with a 200 ns-4.3 V pulse.

A Geochemical Study on the Enrichment of Trace Elements in the Saline Ash Pond of a Bituminous-burning Power Plant in Korea (국내 모 유연탄 발전소의 석탄회 매립 염호수 내 미량원소 농집에 대한 지구화학적 연구)

  • Kim, Seok-Hwi;Choi, Seung-Hyun;Jeong, Gi Young;Lee, Jae-Cheol;Kim, Kangjoo
    • Journal of the Mineralogical Society of Korea
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    • v.27 no.1
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    • pp.31-40
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    • 2014
  • In present study, we geochemically investigated the fresh coal ashes and the saline ash pond of an electric power plant in Korea, which burns imported bituminous coals. The goals are to see the chemical changes of the ash pond by reaction with coal ashes and to investigate the relative leachability of elements from the ashes by reaction with saline waters. For this study, one fresh fly ash, one fresh bottom ash, and 7 water samples were collected. All the ash samples and 2 water samples were analyzed for 55 elements. The results indicated that the fly ashes are enriched with chalcophilic elements such as Cu, Zn, Ga, Ge, Se, Cd, Sb, Au, Pb, and B relative to other elements. On the other hand, concentrations of As, Ba, Co, Ga, Li, Mn, Mo, Sb, U, V, W, and Zr are much higher in the ash pond than those dissolved in the seawater. Ag, Bi, Li, Mo, Rb, Sb, Sc, Se, Sn, Sr, and W show high ratios of elemental concentrations in pond water to those in the fly ash. Our results imply that the leaching of trace elements is regulated by geochemical controls such as solubility and adsorption even though the trace elements are relatively enriched on the ash surfaces after the coal combustion due to their volatilities.

Analysis of Thermal Stability and Schottky Barrier Height of Pd Germanide on N-type Ge-on-Si Substrate (N형 Ge-on-Si 기판에 형성된 Pd Germanide의 열안정성 및 Schottky 장벽 분석)

  • Oh, Se-Kyung;Shin, Hong-Sik;Kang, Min-Ho;Bok, Jeong-Deuk;Jung, Yi-Jung;Kwon, Hyuk-Min;Lee, Ga-Won;Lee, Hi-Deok
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.24 no.4
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    • pp.271-275
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    • 2011
  • In this paper, thermal stability of palladium germanide (Pd germanide) is analyzed for high performance Schottky barrier germanium metal oxide semiconductor field effect transistors (SB Ge-MOSFETs). Pd germanide Schottky barrier diodes were fabricated on n-type Ge-on-Si substrates and the formed Pd germanide shows thermal immunity up to $450^{\circ}C$. The barrier height of Pd germanide is also characterized using two methods. It is shown that Pd germanide contact has electron Schottky barrier height of 0.569~0.631 eV and work function of 4.699~4.761 eV, respectively. Pd germanide is promising for the nanoscale Schottky barrier Ge channel MOSFETs.

Fabrication and Evaluation of Chalcogenide Glass for Molding (몰드성형용 GeSbSe계 칼코게나이드 유리 제작 및 특성 분석)

  • Park, Heung-Su;Cha, Du-Hwan;Kim, Hye-Jeong;Kim, Jeong-Ho;Lee, Hyun-Yong
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.25 no.2
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    • pp.135-139
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    • 2012
  • In this study, we synthesized the chalcogenide glass($Ge_{19}Sb_{23}Se_{58}$) for infrared optics by meltquenching method and verified the effect of cooling condition on the glass properties. The structural and optical properties of the glass were analyzed by XRD, FT-IR and SEM image. The glass synthesized under the cooling temperature of $980^{\circ}C$ shows transmittance of 58% at $8\sim12{\mu}m$, which was decreased as the cooling temperature was decreased. In addition, thermal and hardness also were measured. From the analysis results, we ascertained the feasibility as a molding materials for infrared optics.