• The Journal of Korean Institute of Electromagnetic Engineering and Science
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• v.22 no.6
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• pp.577-583
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• 2011

Radar performance test is one of the major steps for radar system design. However, it is restricted by time and cost when radar performance tests are performed with opportunity targets. So various simulated target generators are developed and used to evaluate radar performance. To simulate the target's range, most of simulated target generators are developed with optical line or DRFM(Digital RF Memory) technique but there are many restrictions such as limit of range imitation and test scenario because of their original usage. In this paper, DDL(Digital Delay Line) module for development of simulated target generator is designed with precise range simulation and easily embodiment feature. And pulse recognition and delay gap detection technique are used to simulate the time delay without distortions. Developed DDL module performances are verified through their performance tests and test results are described in this paper.

• Journal of Korea Society of Industrial Information Systems
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• v.20 no.1
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• pp.1-7
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• 2015

In this paper, a 12-bit high resolution, power and area efficiency hybrid digital pulse width modulator (DPWM) with process and temperature (PT) calibration has been proposed for digital controlled DC-DC converters. The hybrid structure of DPWM combines a 6-bit differential tapped delay line ring-mux digital-to-time converter (DTC) schema and a 6-bit counter-comparator DTC schema, resulting in a power and area saving solution. Furthermore, since the 6-bit differential delay line ring oscillator serves as the clock to the high 6-bit counter-comparator DTC, a high frequency clock is eliminated, and the power is significantly saved. In order to have a simple delay cell and flexible delay time controllability, a voltage controlled inverter is adopted to build the deferential delay cell, which allows fine-tuning of the delay time. The PT calibration circuit is composed of process and temperature monitors, two 2-bit flash ADCs and a lookup table. The monitor circuits sense the PT (Process and Temperature) variations, and the flash ADC converts the data into a digital code. The complete circuits design has been verified under different corners of CMOS 0.18um process technology node.

• Journal of IKEEE
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• v.21 no.4
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• pp.416-419
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• 2017

In this paper, we propose a new digital delay-locked loop (DLL) for high-speed DDR3/DDR4 SDRAMs. The proposed digital DLL adopts a fine delay line using phase interpolation to eliminate the jitter increase problem due to the boundary switching problem. In addition, the proposed digital DLL utilizes a new gradual search algorithm to eliminate the harmonic lock problem. The proposed digital DLL is designed with a 1.1 V, 38-nm CMOS DRAM process and has a frequency operating range of 0.25-2.0 GHz. It has a peak-to-peak jitter of 1.1 ps at 2.0 GHz and has a power consumption of about 13 mW.

• Proceedings of the IEEK Conference
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• 2000.11b
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• pp.87-90
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• 2000

This paper describes a register-controlled symmetrical delay-locked-loop (DLL) using hybrid delay line for use in a high frequency double-data-rate DRAM. The proposed DLL uses a hybrid delay line which can cover two-step delays(coarse/fine delay) by one delay element. The DLL dissipate less power than a conventional dual-loop DLL which use a coarse and a fine delay element and control separately. Additionally, this DLL not only achieves small phase resolution compared to the conventional digital DLL's when it is locked but it also has a great simple delay line compared to a complex dual-loop DLL.

• Journal of IKEEE
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• v.6 no.1 s.10
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• pp.21-29
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• 2002

This paper describes a high resolution DLL(Delay Locked Loop) using all digital circuits. The proposed architecture is based on the three stage of coarse, fine and ultra fine phase tuning block which has a phase detector, selection block and delay line respectively. The first stage, the ultra fine phase tuning block, is tune to accomplish high resolution using a vernier delay line. The second and third stage, the coarse and fine tuning block, are tuning the phase margin of Unit Delay using the delay line and are similar to each other. It was simulated in 0.35um CMOS technology under 3.3V supply using HSPICE simulator. The simulation result shows the phase resolution can be down to lops with the operating range of 250MHz to 800MHz.

• Journal of the Institute of Electronics and Information Engineers
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• v.52 no.6
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• pp.137-143
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• 2015

A delay-line type time-to-digital converter (TDC) implemented in a field-programmable gate array (FPGA) is most widely owing due to its simple structure and high conversion rate. However, the delay-line type TDC suffers from nonlinearity error caused by the long delay-line because its time interval measurement range is determined by the length of the used delay line. In this study, a new TDC structure with a shorter delay line by taking a pulse train as an input is proposed for improved time accuracy and efficient use of resources. The proposed TDC utilizes a pulse-train with four transitions and a transition state detector that identifies the used transition among four transitions and prevents the meta-stable state without a synchronizer. With 72 delay cells, the measured resolution and maximum non-linearity were 20.53 ps, and 1.46 LSB, respectively, and the time interval measurement range was 5070 ps which was enhanced by approximately 343 % compared to the conventional delay-line type TDC.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.48 no.2
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• pp.7-13
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• 2011

This paper presents a Time-to-Digital Converter which is a key block of an All-Digital Phase Locked Loop. In this work, a Vernier Delay Line is added in a conventional Gated Ring Oscillator, so it could get multi-phases and a high resolution. The Gated Ring Oscillator uses 7 unit delay cell, the Vernier Delay Line is used each delay cell. So proposed Time-to-Digital Converter uses total 21 phases. This Time-to-Digital Converter circuit is designed and laid out in $0.13{\mu}m$ 1P-6M CMOS technology. The proposed Time-to-Digital Converter achieves 26ps resolution, maximum input signal frequency is 100MHz and the digital output of proposed Time-to-Digital Converter are 8-bits. The proposed TDC detect 5ns phase difference between Start and Stop signal. A power consumption is 8.4~12.7mW depending on Enable signal width.

• Journal of Navigation and Port Research
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• v.26 no.3
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• pp.295-302
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• 2002

Currently digital communication system adapt various digital modulation schemes. All these communication systems are required to cause the minimum interference to adjacent channels, they must therefore employ the linear power amplifiers. In respect to linear power amplifiers, there are many linearization techniques. Feedforward power amplifier represent very wide bandwidth and high linearization capability. In the feedforward systems overall efficiency is reduced due to the loss of delay line. In this paper, delay filter instead of transmission delay line adapted to get more high efficiency. Experimental results showed that ACLR has improved 17.04dB which is added 2.54dB by using the delay filter.

• Journal of IKEEE
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• v.27 no.3
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• pp.234-238
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• 2023

In this paper, we propose a time-to-digital converter (TDC) with compensation capability for PVT (process, voltage, and temperature) variations. A typical delay line-based TDC measures time based on the inverter's propagation delay, making it fundamentally sensitive to PVT variations. This paper presents a method to minimize the resolution change of TDC by compensating for the propagation delay caused by the PVT variations. Additionally, it dopts Cyclic Vernier TDC (CVTDC) structure to provide a wide input detection range. The proposed CVTDC with PVT compensation function is designed using a 45nm CMOS process, consumes 8mW of power, offers a TDC resolution of 5 ps, and has an input detection range of about 5.1 ns.

• Journal of the Institute of Electronics and Information Engineers
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• v.51 no.8
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• pp.156-164
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• 2014

In a delay line type of a time-to-digital converter implemented in Field Programmable Gate Array, the timing accuracy decreases for a longer carry chain. In this paper, we propose a structure that has a multi-phase clock and a state machine to check metastability; this would reduce the required length of the carry chain with the same time resolution. To reduce the errors caused by the time difference in the four delay lines associated with a four-phase clock, the proposed TDC generates a single input pulse from four phase clocks and uses a single delay line. Moreover, the state machine is designed to find the phase clock that is used to generate the single input pulse and determine the metastable state without a synchronizer. With the measurement range of 1 ms, the measured resolution was 22 ps, and the non-linearity was 25 ps.