• 제목/요약/키워드: 5-stage pipeline

검색결과 72건 처리시간 0.033초

5단계 파이프라인 DSP 코어를 위한 시뮬레이터의 설계 (A Simulator for a Five-stage Pipeline DSP core)

  • 김문경;정우경
    • 대한전자공학회:학술대회논문집
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    • 대한전자공학회 1998년도 추계종합학술대회 논문집
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    • pp.1161-1164
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    • 1998
  • We designed a DSP core simulator with C language, that is able to simulate 5-stage pipelined DSP core, named YS-DSP. It can emulate all 5 stage pipelines in the DSP core. It can also emulate memory access, exception processing, and DSP parallel processing. Each pipeline stage is implemented by combination of one or more functions to process parts of each stage. After modeling and validating the simulator, we can use it to verify and to complement the DSP core HDL model and to enhance its performance.

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극한지 파이프라인 프로젝트 설계단계에서의 데이터 분류에 관한 연구 (A Study on the Data Classification in Engineering Stage of Pipeline Project in Extreme Cold Weather)

  • 김창한;원서경;이준복;한충희
    • 한국건축시공학회:학술대회논문집
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    • 한국건축시공학회 2014년도 추계 학술논문 발표대회
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    • pp.214-215
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    • 2014
  • Recently, Russia decided to export an annual 7.5 million tons of natural gas to Korea over 30 years from 2015, as also deal with China, planed to build a pipeline connecting Siberia to Shandong Peninsula about 4000km. Risk management is required depending on the project in extreme cold weather, because it is concerned about the behavior of the seasonal changes in soil temperature and the strain of pipe according to the long-distance pipeline construction. The plan of data management shall be prepared in parallel for a sophisticated risk management, because a data is massive scale and it is generated/accumulated in real time. Therefore, this research is aimed to classify a data items in engineering stage of pipeline by previous studies for managing a generated data depending on the detail works in extreme cold weather. We expect to be provided the foundation of an efficient classification system of a generated data from the pipeline project life cycle.

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10bit 50MS/s CMOS 파이프라인 아날로그-디지털 변환기 (10bit 50MS/s CMOS Pipeline Analog-Digital Converter)

  • 김대용;김길수;김수원
    • 대한전자공학회:학술대회논문집
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    • 대한전자공학회 2003년도 하계종합학술대회 논문집 II
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    • pp.1197-1200
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    • 2003
  • This paper presents A/D converter for the signal processing of infrared sensor and CMOS image sensor. The A/D converter designed in a 0.25um CMOS process provides a resolution of 10bits at a sampling rate of 50MS/s while dissipating 67mW at 2.5V supply voltage. This A/D converter is based on a pipeline architecture in which the number of bits converted per stage and the stage number are optimized to achieve the desired linearity and reduce power consumption as well. Simulation results show that the A/D converter using 1.5bit per stage MDAC with switched capacitors and dynamic comparators efficiently reduces the power consumption.

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벨로스형 어큐뮬레이터의 압력 맥동 감쇠 특성 (Attenuation of Pressure Fluctuations in Oil Hydraulic Pipeline with Bellows Type Accumulator)

  • 이일영;정용길;이수종
    • 동력기계공학회지
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    • 제5권4호
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    • pp.31-37
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    • 2001
  • Pressure propagation and attenuation characteristics in a hydraulic pipeline with a bellows type accumulator was investigated by theoretical analyses and experiments. In the first stage of the study, equations to evaluate the amount of oil volume charged into the bellows together with nitrogen gas were proposed. In the next stage, the authors suggested a mathematical model based on transfer matrix method to describe the dynamic characteristics of the pipe element with a metal bellows type accumulator. Through comparisons and considerations of the experimental and the numerical data shown in frequency domain, the validity of the mathematical model was confirmed.

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Pipeline 시스템의 Hazard 검출기를 위한 BIST 설계 (BIST Design for Hazard controller in Pipeline System)

  • 이한권;이현룡;장종권
    • 대한전자공학회:학술대회논문집
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    • 대한전자공학회 2003년도 컴퓨터소사이어티 추계학술대회논문집
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    • pp.27-30
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    • 2003
  • The recent technology developments introduce new difficulties into the test process by the increased complexity of the chip. Most widely used method for testing high complexity and embedded systems is built-in self-test(BIST). In this paper, we describe 5-stage pipeline system as circuit under testing(CUT) and proposed a BIST scheme for the hazard detection unit of the pipeline system. The proposed BIST scheme can generate sequential instruction sets by pseudo-random pattern generator that can detect all hazard issues and compare the expected hazard signals with those of the pipelined system. Although BIST schemes require additional area in the system, it proves to provide a low-cost test solution and significantly reduce the test time.

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12-bit 파이프라인 BiCMOS를 사용한 A/D 변환기의 설계 (The Design of Analog-to-Digital Converter using 12-bit Pipeline BiCMOS)

  • 김현호;이천희
    • 한국시뮬레이션학회논문지
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    • 제11권2호
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    • pp.17-29
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    • 2002
  • There is an increasing interest in high-performance A/D(Analog-to-Digital) converters for use in integrated analog and digital mixed processing systems. Pipeline A/D converter architectures coupled with BiCMOS process technology have the potential for realizing monolithic high-speed and high-accuracy A/D converters. In this paper, the design of 12bit pipeline BiCMOS A/D converter presented. A BiCMOS operational amplifier and comparator suitable for use in the pipeline A/D converter. Test/simulation results of the circuit blocks and the converter system are presented. The main features is low distortion track-and-hold with 0-300MHz input bandwidth, and a proprietary 12bit multi-stage quantizer. Measured value is DNL=${\pm}$0.30LSB, INL=${\pm}$0.52LSB, SNR=66dBFS and SFDR=74dBc at Fin=24.5MHz. Also Fabricated on 0.8um BiCMOS process.

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Range-Scaled 14b 30 MS/s Pipeline-SAR Composite ADC for High-Performance CMOS Image Sensors

  • Park, Jun-Sang;Jeong, Jong-Min;An, Tai-Ji;Ahn, Gil-Cho;Lee, Seung-Hoon
    • JSTS:Journal of Semiconductor Technology and Science
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    • 제16권1호
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    • pp.70-79
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    • 2016
  • This paper proposes a low-power range-scaled 14b 30 MS/s pipeline-SAR composite ADC for high-performance CIS applications. The SAR ADC is employed in the first stage to alleviate a sampling-time mismatch as observed in the conventional SHA-free architecture. A range-scaling technique processes a wide input range of 3.0VP-P without thick-gate-oxide transistors under a 1.8 V supply voltage. The first- and second-stage MDACs share a single amplifier to reduce power consumption and chip area. Moreover, two separate reference voltage drivers for the first-stage SAR ADC and the remaining pipeline stages reduce a reference voltage disturbance caused by the high-speed switching noise from the SAR ADC. The measured DNL and INL of the prototype ADC in a $0.18{\mu}m$ CMOS are within 0.88 LSB and 3.28 LSB, respectively. The ADC shows a maximum SNDR of 65.4 dB and SFDR of 78.9 dB at 30 MS/s, respectively. The ADC with an active die area of $1.43mm^2$ consumes 20.5 mW at a 1.8 V supply voltage and 30 MS/s, which corresponds to a figure-of-merit (FOM) of 0.45 pJ/conversion-step.

A 12b 100 MS/s Three-Step Hybrid Pipeline ADC Based on Time-Interleaved SAR ADCs

  • Park, Jun-Sang;An, Tai-Ji;Cho, Suk-Hee;Kim, Yong-Min;Ahn, Gil-Cho;Roh, Ji-Hyun;Lee, Mun-Kyo;Nah, Sun-Phil;Lee, Seung-Hoon
    • JSTS:Journal of Semiconductor Technology and Science
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    • 제14권2호
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    • pp.189-197
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    • 2014
  • This work proposes a 12b 100 MS/s $0.11{\mu}m$ CMOS three-step hybrid pipeline ADC for high-speed communication and mobile display systems requiring high resolution, low power, and small size. The first stage based on time-interleaved dual-channel SAR ADCs properly handles the Nyquist-rate input without a dedicated SHA. An input sampling clock for each SAR ADC is synchronized to a reference clock to minimize a sampling-time mismatch between the channels. Only one residue amplifier is employed and shared in the proposed ADC for the first-stage SAR ADCs as well as the MDAC of back-end pipeline stages. The shared amplifier, in particular, reduces performance degradation caused by offset and gain mismatches between two channels of the SAR ADCs. Two separate reference voltages relieve a reference disturbance due to the different operating frequencies of the front-end SAR ADCs and the back-end pipeline stages. The prototype ADC in a $0.11{\mu}m$ CMOS shows the measured DNL and INL within 0.38 LSB and 1.21 LSB, respectively. The ADC occupies an active die area of $1.34mm^2$ and consumes 25.3 mW with a maximum SNDR and SFDR of 60.2 dB and 69.5 dB, respectively, at 1.1 V and 100 MS/s.

12-비트 10-MS/s CMOS 파이프라인 아날로그-디지털 변환기 (12-bit 10-MS/s CMOS Pipeline Analog-to-Digital Converter)

  • 조세현;정호용;도원규;이한열;장영찬
    • 전기전자학회논문지
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    • 제25권2호
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    • pp.302-308
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    • 2021
  • 본 논문에서는 영상 처리용 12-비트의 10-MS/s 파이프라인 아날로그-디지털 변환기(ADC: analog-to-digital converter)가 제안된다. 제안된 ADC는 샘플-홀드 증폭기, 3개의 stage, 3-비트 플래시 ADC, 그리고 digital error corrector로 구성된다. 각 stage는 4-비트 flash ADC와 multiplying digital-to-analog ADC로 구성된다. 고해상도의 ADC를 위해 제안된 샘플-홀드 증폭기는 gain boosting을 이용하여 전압 이득을 증가시킨다. 제안된 파이프라인 ADC는 1.8V 공급전압을 사용하는 180nm CMOS 공정에서 설계되었고 차동 1V 전압을 가지는 1MHz 사인파 아날로그 입력신호에 대해 10.52-비트의 유효 비트를 가진다. 또한, 약 5MHz의 나이퀴스트 사인파 입력에 대해 측정된 유효비트는 10.12 비트이다.

디지털 코드 오차 보정 기법을 사용한 15비트 50MS/s CMOS 파이프라인 A/D 변환기 (A 15b 50MS/s CMOS Pipeline A/D Converter Based on Digital Code-Error Calibration)

  • 유필선;이경훈;윤근용;이승훈
    • 대한전자공학회논문지SD
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    • 제45권5호
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    • pp.1-11
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    • 2008
  • 본 논문에서는 디지털 코드 오차 보정 기법을 사용한 15비트 50MS/s CMOS 파이프라인 ADC를 제안한다. 제안하는 ADC는 15비트 수준의 고해상도에서 면적과 전력 소모를 최소화하기 위해서 4단 파이프라인 구조를 사용하며 전체 ADC의 아날로그 회로를 변경하지 않고 첫 번째 단에 약간의 디지털 회로만을 추가하는 디지털 코드 오차 보정 기법을 적용한다. 첫 번째 단에서 소자 부정합으로 인해 발생하는 코드 오차는 나머지 세 단에 의해 측정된 후 메모리에 저장되고 정상 동작 시 메모리에 저장된 코드 오차를 디지털 영역에서 제거하여 보정한다. 모든 MDAC 커패시터 열에는 주변 신호에 덜 민감한 3차원 완전 대칭 구조의 레이아웃 기법을 적용하여 소자 부정합에 의한 영향을 최소화하면서 동시에 첫 번째 단의 소자 부정합을 보다 정밀하게 측정하도록 하였다. 시제품 ADC는 0.18um CMOS 공정으로 제작되었으며, 측정된 DNL 및 INL은 15비트 해상도에서 각각 0.78LSB 및 3.28LSB의 수준을 보이며, 50MS/s의 샘플링 속도에서 최대 SNDR 및 SFDR은 각각 67.2dB 및 79.5dB를 보여준다. 시제품 ADC의 칩 면적은 $4.2mm^2$이며 전력 소모는 2.5V 전원 전압에서 225mW이다.