• The Journal of the Korea institute of electronic communication sciences
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• v.3 no.3
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• pp.165-169
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• 2008

Analog-to-Digital converters (ADCs) used in instrumentation and measurements often require high absolute accuracy, including excellent linearity and negligible dc offset. Incremental converters provide a solution for such measurement applications, as they retain most of the advantages of conventional ${\Delta}{\Sigma}$ converters, and yet they are capable of offset-free and accurate conversion. Most of the previous research on incremental converters was for single-channel and dc signal applications, where they can perform extremely accurate data conversion with more than 20-bit resolution. In this paper, a design technique for implementing multiplexed incremental data converters to convert narrow bandwidth ac signals is discussed. A design methodology to optimize the signal-to-quantization+thermal noise ratio of multiplexed IDC is presented. It incorporates the operation principle, topology, and digital decimation filter design. The theoretical results are verified by simulation results.

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2012.05a
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• pp.88-90
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• 2012

This paper describes a 10-bit 10-MS/s asynchronous successive approximation register (SAR) analog-to-digital converter (ADC) with a rail-to-rail input range. The proposed SAR ADC consists of a capacitor digital-analog converter (DAC), a SAR logic and a comparator. To reduce the frequency of an external clock, the internal clock which is asynchronously generated by the SAR logic and the comparator is used. The time-domain comparator with a offset calibration technique is used to achieve a high resolution. To reduce the power consumption and area, a split capacitor-based differential DAC is used. The designed asynchronous SAR ADC is fabricated by using a 0.18 um CMOS process, and the active area is $420{\times}140{\mu}m^2$. It consumes the power of 0.818 mW with a 1.8 V supply and the FoM is 91.8 fJ/conversion-step.

• Journal of IKEEE
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• v.24 no.3
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• pp.719-726
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• 2020

A threshold-voltage sensing circuit is proposed to compensate for pixel aging in active matrix organic light-emitting diodes. The proposed threshold-voltage sensing circuit consists of sample-hold (S/H) circuits and a single-ended successive approximation register (SAR) analog-to-digital converter (ADC) with a resolution of 10 bits. To remove a scale down converter of each S/H circuit and a voltage gain amplifier with a signl-to-differentail converter, the middle reference voltage calibration and input range calibration for the single-ended SAR ADC are performed in the capacitor digital-to-analog converter and reference driver. The proposed threshold-voltage sensing circuit is designed by using a 180-nm CMOS process with a supply voltage of 1.8 V. The ENOB and power consimption of the single-ended SAR ADC are 9.425 bit and 2.83 mW, respectively.

• The Journal of the Institute of Internet, Broadcasting and Communication
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• v.9 no.1
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• pp.39-45
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• 2009

OFDM is used for achieving a high-speed data transmission in mobile wireless communication systems. Conventionally, fast Fourier transform that is the main signal processing of OFDM is implemented using digital signal processing. The DSP FFT LSI requires large power consumption. Current-mode FFT LSI with analog signal processing is one of the best solutions for high speed and low power consumption. However, for the operation of current-mode FFT LSI that has the structure of parallel-input and parallel-output, current-mode serial-to-parallel and parallel-to-serial converter are indispensable. We propose a novel current-mode SPC and PSC and full chip simulation results agree with experimental data. The proposed current-mode SPC and PSC promise the wide application of the current-mode analog signal processing in the field of low power wireless communication LSI.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.12 no.2
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• pp.309-314
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• 2008

Analog-to-digital converters(ADCs) used in instrumentation and measurements often require high absolute accuracy, including excellent linearity and negligible dc offset. Incremental(integrating) data converters(IDCs) provide a solution for such measurement applications, as they retain most of the advantages of conventional $\Delta{\Sigma}$ converters, and yet they are capable of offset-free and accurate conversion. In this paper, a design technique for implementing multiplexed incremental data converters to convert narrow bandwidth AC signals over multi-channel is discussed. It incorporates the operation principle, topology, and digital decimation filter design. The theoretical results are verified by simulation results.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.8 no.7
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• pp.1442-1447
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• 2004

In this paper, a 6-Bit CMOS Folding and Interpolating AD Converter is presented. The converter is considered to be useful as an integrated part of a VLSI circuit handling both analog and digital signals as in the case of HDD or LAN applications. A built-in analog circuit for VLSI of a high-speed data communication requires a small chip area, low power consumption, and fast data processing. The proposed folding and interpolating AD Converter uses a very small number of comparators and interpolation resistors, which is achieved by cascading a couple of folders working in different principles. This reduced number of parts is a big advantage for a built-in AD converter design. The design is based on 0.25m double-poly 2 metal n-well CMOS process. In the simulation, with the applied 2.5V and a sampling frequency of 500MHz, the measurements are as follows: power consumption of 27mw, INL and DNL of $\pm$0.1LSB, $\pm$0.15LSB each, SNDR of 42dB with an input signal of 10MHz.

• Journal of the Institute of Electronics and Information Engineers
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• v.49 no.11
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• pp.149-156
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• 2012

A digital input class-D audio amplifier is presented for digital hearing aid. The class-D audio amplifier is composed of digital and analog circuits. The analog circuit converts a digital input to a analog audio signal (DAC) with noise suppression in the audio band. An interpolated digital delta-sigma modulator is used to convert data types between digital signal processor (DSP) and digital-to-analog converter (DAC). An 16-bit, 25-kbps pulse code modulated (PCM) input is interpolated to 16-bit, 50-kbps by a digital filter. The output signal of interpolation filter is noise-shaped by a third-order digital sigma-delta modulator (SDM). As a result, 1.5-bit, 3.2-Mbps signal is applied to simple digital to analog converter.

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2015.10a
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• pp.420-423
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• 2015

This paper proposes a method of non-linearity error detection and calibration for binary-weighted charge-driven DACs. In general, the non-linearity errors of DACs often occur due to the mismatch of layout designs or process variation, even when careful layout design methods and process calibration are adopted. Since such errors can substantially degrade the SNDR performance of DAC, it is crucial to accurately measure the errors and calibrate the design mismatches. The proposed method employs 2 identical DAC circuits. The 2 DACs are sweeped, respectively, by using 2 digital input counters with a fixed difference. A comparator identifies any non-linearity errors larger than an acceptable discrepancy. We also propose a calibration method that can fine-tune the DAC's capacitor sizes iteratively until the comparator finds no further errors. Simulations are presented, which show that the proposed method is effective to detect the non-linearity errors and calibrate the capacitor mismatches of a 12-bit DAC design of binary-weighted charge-driven structure.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.49 no.5
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• pp.30-36
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• 2012

A new BIST(Built-In Self-Test) scheme to test ADC(Analog-to-Digital Converter) with a transition detector is proposed. The proposed BIST is able to replaces histogram method, the most popular approach in static testing of ADC. With a ramp signal as an input test stimulus, the proposed BIST calculates ADC's static parameters such as offset, gain, INL(Integral Non-Linearity) and DNL(Differential Non-Linearity). The three detectors in the proposed BIST can deal with a transient zone problem, a phenomenon due to random noise in real test environments and are cost efficient at various acceptable ranges determined as a test spec. The simulation results validate that our method performs accurate static test and show the reduction of the hardware overhead.

• Proceedings of the Korea Society for Simulation Conference
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• 2000.04a
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• pp.180-185
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• 2000

발전소 등의 대규모 공정 플랜트에서 사용하고 있는 대부분의 상용 제어기는 PID 제어기이며, 온도 루프를 제외한 대부분의 제어루프가 PI 제어기를 채용하고 있다. 제어 시스템의 성능이 제어기 파라미터의 값에 의해 결정되므로, PI 제어기의 튜닝이 중요하다. 한편, 실제 현장에서의 PI 제어기의 튜닝은 많은 시간과 노력을 필요로 하는 시행착오에 의해서 이루어지고 있으며, 각 제어 루프 제어기 파라미터의 초기값 설정에 어려움을 갖고 있는 실정이다. PI 튜닝 기법이 많이 나와 있지만 시험 신호의 인가 문제로 인해 현장 활용에는 많은 어려움을 가지고 있다. 본 논문에서는 단순한 시험 신호로부터 PI 초기 설정값을 산출할 수 있는 방법에 대해서 알아본다. 또한 발전소에 적용된 국산 분산 제어 시스템을 보면, 대부분 데이터 로깅 시스템으로서만 활용되고 있고, 제어 시스템으로의 활용은 거의 이루어지지 않고 있으며, PID제어기에 대한 구현도 완벽하지 못하여 디지털 PI 제어기의구현 방법에 대한 고찰도 요구되고 있다. 본 논문에서는 디지탈 PI 제어기를 구현하는데 있어서 필요한 사항들, 즉 아날로그 제어기의 디지털 등가 제어기로의 변환 기법, 샘플링 주기의 결정 방법, 그리고 그 외에 공정 제어기가 가져야할 기능들에 대해서 언급한다. 그리고나서 PI 튜닝 기법과 아날로그 제어기의 디지털 등가 제어기로의 변환기법, 샘플링 주기 결정 방법 등에 대해 플랜트 모델을 선정하고 시뮬레이션을 통해 그 효용성을 보인다.