• Title/Summary/Keyword: low-power system chip

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Low Power Scan Testing and Test Data Compression for System-On-a-Chip (System-On-a-Chip(SOC)에 대한 효율적인 테스트 데이터 압축 및 저전력 스캔 테스트)

  • 정준모;정정화
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.39 no.12
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    • pp.1045-1054
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    • 2002
  • We present a new low power scan testing and test data compression mothod lot System-On-a-Chip (SOC). The don't cares in unspecified scan vectors are mapped to binary values for low Power and encoded by adaptive encoding method for higher compression. Also, the scan-in direction of scan vectors is determined for low power. Experimental results for full - scanned versions of ISCAS 89 benchmark circuits show that the proposed method has both low power and higher compression.

Low power scan testing and efficient test data compression for System-On-a-Chip

  • Jung, Jun-Mo;Chong, Jong-Wha
    • Proceedings of the IEEK Conference
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    • 2002.07a
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    • pp.228-230
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    • 2002
  • We present a new low power scan testing and test data compression method for System-On-a-Chip (SOC). The don't cares in unspecified scan vectors are mapped to binary values for low power and encoded by adaptive encoding method for higher compression. Also, the scan-in direction of scan vectors is determined for low power. Experimental results for full-scanned versions of ISCAS 89 benchmark circuits show that the proposed method has both low power and higher compression.

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Low Power Test for SoC(System-On-Chip)

  • Jung, Jun-Mo
    • Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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    • 2011.10a
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    • pp.892-895
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    • 2011
  • Power consumption during testing System-On-Chip (SOC) are becoming increasingly important as the IP core increases in SOC. We present a new algorithm to reduce the scan-in power using the modified scan latch reordering and clock gating. We apply scan latch reordering technique for minimizing the hamming distance in scan vectors. Also, during scan latch reordering, the don't care inputs in scan vectors are assigned for low power. Also, we apply the clock gated scan cells. Experimental results for ISCAS 89 benchmark circuits show that reduced low power scan testing can be achieved in all cases.

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Efficient Test Data Compression and Low Power Scan Testing for System-On-a-Chip(SOC) (SOC(System-On-a-Chip)에 있어서 효율적인 테스트 데이터 압축 및 저전력 스캔 테스트)

  • Park Byoung-Soo;Jung Jun-Mo
    • The Journal of the Korea Contents Association
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    • v.5 no.1
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    • pp.229-236
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    • 2005
  • Testing time and power consumption during testing System-On-a-Chip (SOC) are becoming increasingly important as the IP core increases in a SOC. We present a new algorithm to reduce the scan-in power and test data volume using the modified scan latch reordering. We apply scan latch reordering technique for minimizing the hamming distance in scan vectors. Also, during scan latch reordering, the don't care inputs in scan vectors are assigned for low power and high compression. Experimental results for ISCAS 89 benchmark circuits show that reduced test data and low power scan testing can be achieved in all cases.

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A Low Power Multi-Function Digital Audio SoC

  • Lim, Chae-Duck;Lee, Kyo-Sik
    • Proceedings of the IEEK Conference
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    • 2004.06b
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    • pp.399-402
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    • 2004
  • This paper presents a system-on-chip prototype implementing a full integration for a portable digital audio system. The chip is composed of a audio processor block to implements audio decoding and voice compression or decompression software, a system control block including 8-bit MCU core and Memory Management Unit (MMU) a low power 16-bit ${\Sigma}{\Delta}$ CODEC, two DC-to-BC converter, and a flash memory controller. In order to support other audio algorithms except Mask ROM type's fixed codes, a novel 16-bit fixed-point DSP core with the program-download architecture is proposed. Funker, an efficient power management technique such as task-based clock management is implemented to reduce power consumption for portable application. The proposed chip has been fabricated with a 4 metal 0.25um CMOS technology and the chip area is about 7.1 mm ${\times}$ 7.1mm with 100mW power dissipation at 2.5V power supply.

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Design of A High-Speed Current-Mode Analog-to-Digital Converter (고속 전류 구동 Analog-to-digital 변환기의 설계)

  • 조열호;손한웅;백준현;민병무;김수원
    • Journal of the Korean Institute of Telematics and Electronics B
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    • v.31B no.7
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    • pp.42-48
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    • 1994
  • In this paper, a low power and high speed flash Analog-to-Digital Converter using current-mode concept is proposed. Current-mode approach offers a number of advantages over conventional voltage-mode approach, such as lower power consumption small chip area improved accuracy etc. Rescently this concept was applied to algorithmic A/D Converter. But, its conversion speed is limited to medium speed. Consequently this converter is not applicable to the high speed signal processing system. This ADC is fabricated in 1.2um double metal CMOS standard process. This ADC's conversion time is measured to be 7MHz, and power consumption is 2.0mW, and differential nonlinearity is less than 1.14LSB and total harmonic distortion is -50dB. The active area of analog chip is about 350 x 550u$m^2$. The proposed ADC seems suitable for a single chip design of digital signal processing system required high conversion speed, high resolution small chip area and low power consumption.

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On-Chip Bus Serialization Method for Low-Power Communications

  • Lee, Jae-Sung
    • ETRI Journal
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    • v.32 no.4
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    • pp.540-547
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    • 2010
  • One of the critical issues in on-chip serial communications is increased power consumption. In general, serial communications tend to dissipate more energy than parallel communications due to bit multiplexing. This paper proposes a low-power bus serialization method. This encodes bus signals prior to serialization so that they are converted into signals that do not greatly increase in transition frequency when serialized. It significantly reduces the frequency by making the best use of word-to-word and bit-by-bit correlations presented in original parallel signals. The method is applied to the revision of an MPEG-4 processor, and the simulation results show that the proposed method surpasses the existing one. In addition, it is cost-effective when implemented as a hardware circuit since its algorithm is very simple.

Low Power Test for SoC(System-On-Chip)

  • Jung, Jun-Mo
    • Journal of information and communication convergence engineering
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    • v.9 no.6
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    • pp.729-732
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    • 2011
  • Power consumption during testing System-On-Chip (SOC) is becoming increasingly important as the IP core increases in SOC. We present a new algorithm to reduce the scan-in power using the modified scan latch reordering and clock gating. We apply scan latch reordering technique for minimizing the hamming distance in scan vectors. Also, during scan latch reordering, the don't care inputs in scan vectors are assigned for low power. Also, we apply the clock gated scan cells. Experimental results for ISCAS 89 benchmark circuits show that reduced low power scan testing can be achieved in all cases.

Retina-Motivated CMOS Vision Chip Based on Column Parallel Architecture and Switch-Selective Resistive Network

  • Kong, Jae-Sung;Hyun, Hyo-Young;Seo, Sang-Ho;Shin, Jang-Kyoo
    • ETRI Journal
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    • v.30 no.6
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    • pp.783-789
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    • 2008
  • A bio-inspired vision chip for edge detection was fabricated using 0.35 ${\mu}m$ double-poly four-metal complementary metal-oxide-semiconductor technology. It mimics the edge detection mechanism of a biological retina. This type of vision chip offer several advantages including compact size, high speed, and dense system integration. Low resolution and relatively high power consumption are common limitations of these chips because of their complex circuit structure. We have tried to overcome these problems by rearranging and simplifying their circuits. A vision chip of $160{\times}120$ pixels has been fabricated in $5{\times}5\;mm^2$ silicon die. It shows less than 10 mW of power consumption.

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Improved Transmitter Power Efficiency using Cartesian Feedback Loop Chip

  • Chong, Young-Jun;Lee, Il-Kyoo;Oh, Seung-Hyeub
    • Journal of electromagnetic engineering and science
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    • v.2 no.2
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    • pp.93-99
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    • 2002
  • The Cartesian loop chip which is one of key devices in narrow-band Walky-Talky transmitter using RZ-SSB modulation method was designed and implemented with 0.35 Um CMOS technology. The reduced size and low cost of transmitter were available by the use of direct-conversion and Cartesian loop chip, which improved the power efficiency and linearity of transmitting path. In addition, low power operation was possible through CMOS technology. The performance test results of transmitter showed -23 dBc improvement of IMD level and -30 dEc below suppression of SSB characteristic in the operation of Cartesian loop chip (closed-loop). At that time, the transmitting power was about 37 dBm (5 W). The main parameters to improve the transmitting characteristic and to compensate the distortion in feed back loop such as DC-offset, loop gain and phase value are interfaced with notebook PC to be controlled with S/W.