• 제목/요약/키워드: high-speed circuits

검색결과 387건 처리시간 0.021초

테스트가 용이한 고속 풀 스윙 BiCMOS회로의 설계방식과 테스트 용이도 분석 (Disign Technique and Testability Analysis of High Speed Full-Swing BiCMOS Circuits)

  • 이재민;정광선
    • 한국산업융합학회 논문집
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    • 제4권2호
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    • pp.199-205
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    • 2001
  • With the growth of BiCMOS technology in ASIC design, the issue of analyzing fault characteristics and testing techniques for BiCMOS circuits become more important In this paper, we analyze the fault models and characteristics of high speed full-swing BiCMOS circuits and the DFT technique to enhance the testability of full-swing high speed BiCMOS circuits is discussed. The SPICE simulation is used to analyze faults characteristics and to confirm the validity of DFT technique.

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High speed wide fan-in designs using clock controlled dual keeper domino logic circuits

  • Angeline, A. Anita;Bhaaskaran, V.S. Kanchana
    • ETRI Journal
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    • 제41권3호
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    • pp.383-395
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    • 2019
  • Clock Controlled Dual keeper Domino logic structures (CCDD_1 and CCDD_2) for achieving a high-speed performance with low power consumption and a good noise margin are proposed in this paper. The keeper control circuit comprises an additional PMOS keeper transistor controlled by the clock and foot node voltage. This control mechanism offers abrupt conditional control of the keeper circuit and reduces the contention current, leading to high-speed performance. The keeper transistor arrangement also reduces the loop gain associated with the feedback circuitry. Hence, the circuits offer less delay variability. The design and simulation of various wide fan-in designs using 180 nm CMOS technology validates the proposed CCDD_1 and CCDD_2 designs, offering an increased speed performance of 7.2% and 8.5%, respectively, over a conventional domino logic structure. The noise gain margin analysis proves good robustness of the CCDD structures when compared with a conventional domino logic circuit configuration. A Monte Carlo simulation for 2,000 runs under statistical process variations demonstrates that the proposed CCDD circuits offer a significantly reduced delay variability factor.

A Delta-Sigma Fractional-N Frequency Synthesizer for Quad-Band Multi-Standard Mobile Broadcasting Tuners in 0.18-μm CMOS

  • Shin, Jae-Wook;Kim, Jong-Sik;Kim, Seung-Soo;Shin, Hyun-Chol
    • JSTS:Journal of Semiconductor Technology and Science
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    • 제7권4호
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    • pp.267-273
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    • 2007
  • A fractional-N frequency synthesizer supports quadruple bands and multiple standards for mobile broadcasting systems. A novel linearized coarse tuned VCO adopting a pseudo-exponential capacitor bank structure is proposed to cover the wide bandwidth of 65%. The proposed technique successfully reduces the variations of KVCO and per-code frequency step by 3.2 and 2.7 times, respectively. For the divider and prescaler circuits, TSPC (true single-phase clock) logic is extensively utilized for high speed operation, low power consumption, and small silicon area. Implemented in $0.18-{\mu}m$ CMOS, the PLL covers $154{\sim}303$ MHz (VHF-III), $462{\sim}911$ MHz (UHF), and $1441{\sim}1887$ MHz (L1, L2) with two VCO's while dissipating 23 mA from 1.8 V supply. The integrated phase noise is 0.598 and 0.812 degree for the integer-N and fractional-N modes, respectively, at 750 MHz output frequency. The in-band noise at 10 kHz offset is -96 dBc/Hz for the integer-N mode and degraded only by 3 dB for the fractional-N mode.

단자속 양자 회로 측정용 고속 프로브의 성능 시험 (High-speed Performance of Single Flux Quantum Circuits Test Probe)

  • 김상문;최종현;김영환;강준희;윤기현;최인훈
    • Progress in Superconductivity
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    • 제4권1호
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    • pp.74-79
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    • 2002
  • High-speed probe made to test single flux quantum(SFQ) circuits was comprised of semi-rigid coaxial cables and microstrip lines. The impedance was set at 50 $\Omega$to carry high-speed signals without much loss. To do performance test of high-speed probe, we have attempted to fabricate a test chip which has a coplanar waveguide(CPW) structure. Electromagnetic simulation was done to optimize the dimension of CPW so that the CPW structure has an impedance of 50$\Omega$, matching in impedance with the probe. We also used the simulation to investigate the effect of the width of signal line and the gap between signal line and ground plane to the characteristics of CPW structure. We fabricated the CPW structure with a gold film deposited on Si wafer whose resistivity was above $1.5\times$10$_4$$\Omega$.cm. The magnitudes of S/sub 21/ of CPW at 6 ㎓ in simulations and in the actual measurements done with a network analyzer were: -0.1 ㏈ and -0.33 ㏈ (type A),-0.2 ㏈ and -0.48 ㏈ (type B), respectively. Using the test chip, we have successfully tested the performance of high-speed probe made for SFQ circuits. The probe showed the good performance overthe bandwidth of 10 ㎓.

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단자속양자 회로 측정프로브의 특성 분석을 위한 시뮬레이션 (Simulation for characterization of high speed probe for measurement of single flux quantum circuits)

  • 김상문;김영환;최종현;조운조;윤기현
    • 한국초전도ㆍ저온공학회논문지
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    • 제4권2호
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    • pp.11-15
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    • 2002
  • High speed probe for measurement of sin91e flux quantum circuits is comprised of coaxial cables and microstrip lines in order to carry high speed signals without loss. For the impedance matching between coaxial cable and microstrip line, we have determined the dimension of the microstrip line with 50${\Omega}$ impedance by simulation and then have investigated the effect of line width and cross-sectional shape of signal line, dielectric material, thickness of soldering lead at the coaxial-to-microstrip transition Point, and the an91c between dielectric material and end part of the signal line on the characteristics of signal transmission of the microstrip line. From the simulation, we have found that these all parameter's had influenced on the characteristic of signal transmission on the microstrip line and should be reflected in fabricating high speed probe, We have also determined the dimension of coplanar waveguide to fabricate testing sample for performance test of high speed probe.

Electromagnetic Interference Analysis of an Inhomogeneous Electromagnetic Bandgap Power Bus for High-Speed Circuits

  • Cho, Jonghyun;Kim, Myunghoi
    • Journal of information and communication convergence engineering
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    • 제15권4호
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    • pp.237-243
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    • 2017
  • This paper presents an analysis of the electromagnetic interference of a heterogeneous power bus where electromagnetic bandgap (EBG) cells are irregularly arranged. To mitigate electrical-noise coupling between high-speed circuits, the EBG structure is placed between parallel plate waveguide (PPW)-based power buses on which the noise source and victim circuits are mounted. We examine a noise suppression characteristic of the heterogeneous power bus in terms of scattering parameters. The characteristics of the dispersion and scattering parameters are compared in the sensitivity analysis of the EBG structure. Electric field distributions at significant frequencies are thoroughly examined using electromagnetic simulation based on a finite element method (FEM). The noise suppression characteristics of the heterogeneous power bus are demonstrated experimentally. The heterogeneous power bus achieves significant reduction of electrical-noise coupling compared to the homogeneous power buses that are adopted in conventional high-speed circuit design. In addition, the measurements show good agreement with the FEM simulation results.

자가검사특성을 이용한 속도독립 비동기회로의 테스팅 (Testing for Speed-Independent Asynchronous Circuits Using the Self-Checking Property)

  • 오은정;이정근;이동익;최호용
    • 대한전자공학회:학술대회논문집
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    • 대한전자공학회 1999년도 추계종합학술대회 논문집
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    • pp.384-387
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    • 1999
  • In this paper, we have proposed a testing methodology for Speed-Independent asynchronous control circuits using the self-checking property where the circuit detects certain classes of faults during normal operation. To exploit self-checking properties of Speed-Independent circuits, the Proposed methodology generates tests from the specification of the target circuit which describes the behavior of the circuit. The generated tests are applied to a fault-free and a faulty circuit, and target faults can be detected by the comparison of the outputs of the both circuits. For the purpose of efficient comparison, reachability information of the both circuits in the form of BDD's is used and operations are conducted by BDD manipulations. The identification for undetectable faults in testing is also used to increase efficiency of the proposed methodology. The proposed identification uses only topological information of the target circuit and reachability information of the good circuit which was generated in the course of preprocess. Experimental results show that high fault coverage is obtained for synthesized Speed-Independent circuits and the use of the identification process decreases the number of tests and execution time.

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고속신호처리를 위한 고주파용 Op-Amp 설계 (A High Frequency Op-amp for High Speed Signal Processing)

  • 신건순
    • 한국정보통신학회논문지
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    • 제6권1호
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    • pp.25-29
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    • 2002
  • High speed 신호처리는 통신분야, SC circuit, HDTV, ISDN 등에서 관심이 더욱 승가하고 있으며, high speed 신호처리를 위한 많은 방법들이 있다. 본 논문에서는 CMOS 공정에서 고주파 Op-amp의 실현을 의한 설계를 기술하였다. 아날로그 집적회로를 기초로 하는 high speed op-amp의 기능을 제한하는 요소 중 한가지는 유효 주파수 범위이다. 본 논문에서는 $C_{L}$ =2pF에서 단위이득 주파수가 170MHz인 향상된 대역폭적을 가지는 CMOS op-amp 구조를 계발한다. 공정은 1.2$\mu$디자인 룰을 따른다. 본 논문에서 제시한 CMOS op-amp 고주파 SC filter에서 요구하는 큰 커패시터 부하에서의 넓고 안정된 대역폭을 얻기에 매우 적합하다.

고속 혼성모드 집적회로를 위한 온-칩 CMOS 전류 및 전압 레퍼런스 회로 (On-Chip Full CMOS Current and Voltage References for High-Speed Mixed-Mode Circuits)

  • 조영재;배현희;지용;이승훈
    • 전자공학회논문지SC
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    • 제40권3호
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    • pp.135-144
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    • 2003
  • 본 논문에서는 고속 혼성모드 집적회로를 위한 온-칩(on-chip) CMOS 전류 및 전압 레퍼런스 회로를 제안한다. 제안하는 전류 레퍼런스 회로는 기존의 전류 레퍼런스 회로에서 부정확한 전류 값을 조정하기 위해 주로 사용되는 아날로그 보정 기법과는 달리 디지털 영역에서의 보정 기법을 사용한다. 또한, 제안하는 전압 레퍼런스 회로는 고속으로 동작하는 혼성모드 집적회로의 출력단에서 발생할 수 있는 고주파수의 잡음 성분을 최소한으로 줄이기 위해 고주파 신호 성분에 대해 작은 출력 저항을 볼 수 있는 구조의 레퍼런스 전압 구동회로를 사용한다. 이 레퍼런스 전압 구동회로는 전력 소모 및 칩 면적을 최소화하기 위해서 저 전력의 증폭기와 크기가 작은 온-칩 캐패시터를 사용하여 구현하였다. 제안하는 레퍼런스 회로는 0.18 um n-well CMOS 공정으로 설계 및 제작되었으며, 250 um x 200 um의 면적을 차지한다. 칩 제작 및 측정결과, 제안하는 전류 및 전압 레퍼런스 회로는 공급 전압 및 온도의 변화에 대해서 각각 2.59 %/V와 48 ppm/℃의 변화율을 보인다.

ENMODL을 이용한 32 비트 CLA 설계 (Design of 32-bit Carry Lookahead Adder Using ENMODL)

  • 김강철;이효상;송근호;서정훈;한석붕
    • 한국정보통신학회논문지
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    • 제3권4호
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    • pp.787-794
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    • 1999
  • 본 논문에서는 기존의 동적 CMOS 논리회로보다 동작속도가 타르고 면적이 작은 새로운 EMMODL (enhanced NORA MODL)의 설계방법을 제시하고, 이를 이용하여 32 비트 CLA(carry lookahead adder)를 구현하였다. 제안된 회로는 MODL(multiple output domino logic)의 출력 인버터를 제거하여 면적을 줄이고 동작속도를 증가시킬 수 있다. 0.8um 이중금속 CMOS 공정으로 구현된 CLA는 시차문제가 발생하지 않았고, 3.9nS 이내에 32 비트 연산이 가능하였다.

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