Simulation for characterization of high speed probe for measurement of single flux quantum circuits

단자속양자 회로 측정프로브의 특성 분석을 위한 시뮬레이션

  • 김상문 (연세대 대학원 세라믹공학과) ;
  • 김영환 (한국과학기술연구원) ;
  • 최종현 (고려대 대학원 재료공학과) ;
  • 조운조 (한국과학기술연구원) ;
  • 윤기현 (연세대 대학원 세라믹공학과)
  • Published : 2002.11.01

Abstract

High speed probe for measurement of sin91e flux quantum circuits is comprised of coaxial cables and microstrip lines in order to carry high speed signals without loss. For the impedance matching between coaxial cable and microstrip line, we have determined the dimension of the microstrip line with 50${\Omega}$ impedance by simulation and then have investigated the effect of line width and cross-sectional shape of signal line, dielectric material, thickness of soldering lead at the coaxial-to-microstrip transition Point, and the an91c between dielectric material and end part of the signal line on the characteristics of signal transmission of the microstrip line. From the simulation, we have found that these all parameter's had influenced on the characteristic of signal transmission on the microstrip line and should be reflected in fabricating high speed probe, We have also determined the dimension of coplanar waveguide to fabricate testing sample for performance test of high speed probe.

Keywords

References

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