• 대한전기학회:학술대회논문집
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• 대한전기학회 2008년도 춘계학술대회 논문집 전기설비전문위원
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• pp.123-124
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• 2008

Battery is one of the emergency power. Battery reliability is a very important to keep up the minimum of building capabilities in case of interruption of electric power. Instantaneous discharge test is carried out for measuring transient voltage change(${\Delta}V$) and internal instantaneous impedance(Z), and then it is compared with discharge test results for the estimating the battery capacity. As a result, it was confirmed that the voltage change(${\Delta}V$) and the instantaneous impedance of the batteries failed in actual discharge test were higher that those of the sound batteries. Such an instantaneous discharge test can be a diagnosis of battery sound.

• JSTS:Journal of Semiconductor Technology and Science
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• 제13권3호
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• pp.259-262
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• 2013

Multi-site testing is considered as a solution to reduce test costs. This paper presents a new channel sharing architecture that enables I/O pins to share automatic test equipment (ATE) channels using simple circuitry such as tri-state buffers, AND gates, and multiple-input signature registers (MISR). The main advantage of the proposed architecture is that it is implemented on probe cards and does not require any additional circuitry on a target device under test (DUT). In addition, the proposed architecture can perform DC parametric testing of the DUT such as leakage testing, even if the different DUTs share the same ATE channels. The simulation results show that the proposed architecture is very efficient and is applicable to both wafer testing and package testing.

• JSTS:Journal of Semiconductor Technology and Science
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• 제9권2호
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• pp.98-103
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• 2009

An RF test structure is proposed and its applicability is confirmed by measuring DC characteristics and high frequency characteristics. Effective mobility extraction is also performed to confirm the validity of proposed test structure. The area of suggested test structure consumed on wafer was decreased by more than 50% and its characteristics do not be degraded compared with conventional structure.

• JSTS:Journal of Semiconductor Technology and Science
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• 제12권3호
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• pp.293-296
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• 2012

SOC test methodology in ultra deep submicron (UDSM) technology with reasonable test time and cost has begun to satisfy high quality and reliability of the product. A novel hierarchical test architecture using IEEE standard 1149.1, 1149.7 and 1500 compliant facilities is proposed for the purpose of supporting flexible test environment to ensure SOC test methodology. Each embedded core in a system-on- a-chip (SOC) is controlled by test access ports (TAP) and TAP controller of IEEE standard 1149.1 as well as tested using IEEE standard 1500. An SOC device including TAPed cores is hierarchically organized by IEEE standard 1149.7 in wafer and chip level. As a result, it is possible to select/deselect all cores embedded in an SOC flexibly and reduce test cost dramatically using star scan topology.

• 전력전자학회논문지
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• 제24권6호
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• pp.452-458
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• 2019

This study proposes a new test circuit and control method for the submodules of modular multilevel converter (MMC)-based HVDC systems. The test current of conventional submodule test circuits cannot provide the DC offset components or may have some distortion in the linearized current with the DC offset. The proposed scheme can provide not only the DC component but also linearized current without distortion. Therefore, the submodule test current waveform is relatively similar to that of a real submodule consisting of an MMC-based HVDC system. The validity of the proposed circuit and control method is verified through a simulation and experiment.

• KIEE International Transactions on Electrophysics and Applications
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• 제4C권2호
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• pp.68-72
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• 2004

The performance of copper-tungsten for electrodes used in an ultra high voltage interruption system was evaluated by means of an interruption test, which requires a large-scale apparatus and high cost. In this study, prior to the interruption test, the characteristics of a Cu-W electrode were estimated through the DC arc test, which is a simple, low cost procedure. The DC arc characteristics of a 20wt%Cu-80wt%W electrode were investigated with the change of tungsten powder size distribution and the addition of nickel. In specimens containing a high volume fraction of large sized tungsten particles, the relative density and hardness of sintered Cu-W electrodes increased while the electrical conductivity and the DC arc resistance decreased. Furthermore, the relative density became enhanced with the increase of the amount of nickel while the hardness and electrical conductivity diminished and the DC arc resistance worsened.

• 대한전기학회:학술대회논문집
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• 대한전기학회 2003년도 춘계학술대회 논문집 전기기기 및 에너지변환시스템부문
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• pp.56-58
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• 2003

The Synchronous inductance in Synchronous Reluctance Motor is an element that is proportional to torque. the exact value must be found for controlling and the performance development of motors. In this paper, the inductances that are obtained by the Finite Element Method and AC standstill Test are compared each other. When controlling the direct torque. the fast response characteristics has been carried out with the inductace by the AC stanstill Test. To test the proposal controller, A Synchronous Reluctance Motor has been designed and manufactured and the adequacy of the proposal control are confirmed thought simulations and experiments.

• 전기학회논문지
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• 제61권12호
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• pp.1774-1781
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• 2012

There are some efforts to improve the performance of electrical heat pump(EHP) and replace it with an alternative cooling equipment such as gas engine-driven heat pump(GHP), a gas cooling equipment, in order to solve the problem of summer electricity supply through reducing the summer electricity peak. This paper analyzes cost-benefit in accordance with replacement of electrical cooling system by gas cooling system using california standard test and sensitivity analysis of some scenarios.

• 전력전자학회:학술대회논문집
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• 전력전자학회 2005년도 전력전자학술대회 논문집
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• pp.402-404
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• 2005

In this paper, an effective way to develop electrical system for Korean High-Speed Train(KHST) was introduced. High speed train is complicated electrical system that consists of many kinds of control devices, power supplies and communication systems. Due to reason of cost, safety and time for development, it is not so easy to test system performance after construct the high speed train in the test track. For the effective test and verification of system performance, from each electric system test to integration test for all interconnected electrical system are performed to reduce time and cost for development of high speed train.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2006년도 하계학술대회 논문집 Vol.7
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• pp.501-502
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• 2006

In this paper, new and aging sample of MCCB and ELCB are investigated the main performance test such as short circuit test, mechanical and electrical endurance test, dielectric test and surge current test. The surface conditions of new and aging sample are analyzed by SEM, TGA and DSC. The ELCB occurred badness mainly in short circuit test and surge current test. The badness cause of short circuit test was confirmed due to imperfect contact of contact part.