• Title/Summary/Keyword: clock scheme

Search Result 213, Processing Time 0.022 seconds

A 2.5 Gb/s Burst-Mode Clock and Data Recovery with Digital Frequency Calibration and Jitter Rejection Scheme (디지털 주파수 보정과 지터 제거 기법을 적용한 2.5 Gb/s 버스트 모드 클럭 데이터 복원기)

  • Jung, Jae-Hun;Jung, Yun-Hwan;Shin, Dong Ho;Kim, Yong Sin;Baek, Kwang-Hyun
    • Journal of the Institute of Electronics and Information Engineers
    • /
    • v.50 no.7
    • /
    • pp.87-95
    • /
    • 2013
  • In this paper, 2.5 Gb/s burst-mode clock and data recovery(CDR) is presented. Digital frequency calibration scheme is adopted to eliminate mismatch between the input data rate and the output frequency of the gated voltage controlled oscillator(GVCO) in the clock recovery circuitry. A jitter rejection scheme is also used to reduce jitter caused by input data. The proposed burst-mode CDR is designed using 0.11 ${\mu}m$ CMOS technology. Post-layout simulations show that peak-to-peak jitter of the recovered data is 14 ps with 0.1 UI input referred jitter, and maximum tolerance of consecutive identical digit(CID) is 2976 bits without input data jitter. The active area occupies 0.125 $mm^2$ without loop filter and the total power consumption is 94.5 mW.

A Design of Full Digital Capacitive Sensing Touch Key Reducing The Effects Due to The Variations of Resistance and Clock Frequency (저항과 클록 주파수 변동에 의한 문제를 감소시킨 풀 디지털 방식 정전용량 센싱 터치키 설계)

  • Seong, Kwong-Su
    • Journal of the Korean Institute of Illuminating and Electrical Installation Engineers
    • /
    • v.23 no.4
    • /
    • pp.39-46
    • /
    • 2009
  • In this paper, we propose a full digital capacitive sensing touch key reducing the effects due to the variations of resistance and clock frequency. The proposed circuit consists of two capacitive loads to measure and a resistor between the capacitive loads. The method measures the delays of the resistor and two capacitive loads, respectively. The ratio of the two delays is represented as the ratio of the two capacitive loads and is irrelative to the resistance and the clock frequency if quantization error is disregarded. Experimental results show the proposed scheme efficiently reduces the effects due to the variations of clock frequency and resistance. Further more the method has l.04[pF] resolution and can be used as a touch key.

Study of the Superconductive Pipelined Multi-Bit ALU (초전도 Pipelined Multi-Bit ALU에 대한 연구)

  • Kim, Jin-Young;Ko, Ji-Hoon;Kang, Joon-Hee
    • Progress in Superconductivity
    • /
    • v.7 no.2
    • /
    • pp.109-113
    • /
    • 2006
  • The Arithmetic Logic Unit (ALU) is a core element of a computer processor that performs arithmetic and logic operations on the operands in computer instruction words. We have developed and tested an RSFQ multi-bit ALU constructed with half adder unit cells. To reduce the complexity of the ALU, We used half adder unit cells. The unit cells were constructed of one half adder and three de switches. The timing problem in the complex circuits has been a very important issue. We have calculated the delay time of all components in the circuit by using Josephson circuit simulation tools of XIC, $WRspice^{TM}$, and Julia. To make the circuit work faster, we used a forward clocking scheme. This required a careful design of timing between clock and data pulses in ALU. The designed ALU had limited operation functions of OR, AND, XOR, and ADD. It had a pipeline structure. The fabricated 1-bit, 2-bit, and 4-bit ALU circuits were tested at a few kilo-hertz clock frequency as well as a few tens giga-hertz clock frequency, respectively. For high-speed tests, we used an eye-diagram technique. Our 4-bit ALU operated correctly at up to 5 GHz clock frequency.

  • PDF

Analog Delay Locked Loop with Wide Locking Range

  • Yoo, Changsik
    • JSTS:Journal of Semiconductor Technology and Science
    • /
    • v.1 no.3
    • /
    • pp.193-196
    • /
    • 2001
  • For wide locking range, an analog delay locked loop (DLL) was designed with the selective phase inversion scheme and the variable number of delay elements. The number of delay elements was determined adaptively depending on the clock cycle time. During the analog fine locking stage, a self-initializing 3-state phase detector was used to avoid the initial state problem associated with the conventional 3-state phase detector. With these schemes, the locking range of analog DLL was increased by four times compared to the conventional scheme according to the simulation results.

  • PDF

An Efficient Test Compression Scheme based on LFSR Reseeding (효율적인 LFSR 리시딩 기반의 테스트 압축 기법)

  • Kim, Hong-Sik;Kim, Hyun-Jin;Ahn, Jin-Ho;Kang, Sung-Ho
    • Journal of the Institute of Electronics Engineers of Korea SD
    • /
    • v.46 no.3
    • /
    • pp.26-31
    • /
    • 2009
  • A new LFSR based test compression scheme is proposed by reducing the maximum number of specified bits in the test cube set, smax, virtually. The performance of a conventional LFSR reseeding scheme highly depends on smax. In this paper, by using different clock frequencies between an LFSR and scan chains, and grouping the scan cells, we could reduce smax virtually. H the clock frequency which is slower than the clock frequency for the scan chain by n times is used for LFSR, successive n scan cells are filled with the same data; such that the number of specified bits can be reduced with an efficient grouping of scan cells. Since the efficiency of the proposed scheme depends on the grouping mechanism, a new graph-based scan cell grouping heuristic has been proposed. The simulation results on the largest ISCAS 89 benchmark circuit show that the proposed scheme requires less memory storage with significantly smaller area overhead compared to the previous test compression schemes.

A 3.2Gb/s Clock and Data Recovery Circuit without Reference Clock for Serial Data Communication (시리얼 데이터 통신을 위한 기준 클록이 없는 3.2Gb/s 클록 데이터 복원회로)

  • Kim, Kang-Jik;Jung, Ki-Sang;Cho, Seong-Ik
    • Journal of the Institute of Electronics Engineers of Korea SC
    • /
    • v.46 no.2
    • /
    • pp.72-77
    • /
    • 2009
  • In this paper, a 3.2Gb/s clock and data recovery (CDR) circuit for a high-speed serial data communication without the reference clock is described This CDR circuit consists of 5 parts as Phase and frequency detector(PD and FD), multi-phase Voltage Controlled-Oscillator(VCO), Charge-pumps (CP) and external Loop-Filter(KF). It is adapted the PD and FD, which incorporates a half-rate bang-bang type oversampling PD and a half-rate FD that can improve pull-in range. The VCO consists of four fully differential delay cells with rail-to-rail current bias scheme that can increase the tuning range and tuning linearity. Each delay cell has output buffers as a full-swing generator and a duty-cycle mismatch compensation. This materialized CDR can achieve wide pull-in range without an extra reference clock and it can be also reduced chip area and power consumption effectively because there is no additional Phase Locked- Loop(PLL) for generating reference clock. The CDR circuit was designed for fabrication using 0.18um 1P6M CMOS process and total chip area excepted LF is $1{\times}1mm^2$. The pk-pk jitter of recovered clock is 26ps at 3.2Gb/s input data rate and total power consumes 63mW from 1.8V supply voltage according to simulation results. According to test result, the pk-pk jitter of recovered clock is 55ps at the same input data-rate and the reliable range of input data-rate is about from 2.4Gb/s to 3.4Gb/s.

A 40 MHz to 280 MHz 32-phase CMOS 0.11-${\mu}m$ Delay-Locked Loop (40MHz ~ 280MHz의 동작 주파수와 32개의 위상을 가지는 CMOS 0.11-${\mu}m$ 지연 고정 루프)

  • Lee, Kwang-Hun;Jang, Young-Chan
    • Proceedings of the Korean Institute of Information and Commucation Sciences Conference
    • /
    • 2012.05a
    • /
    • pp.95-98
    • /
    • 2012
  • This paper describes a multiphase delay-locked loop (DLL) that generates a 32-phase output clock over the operating frequency range of 40 MHz to 280 MHz. The matrix-based delay line is used for high resolution of 1-bit delay. A calibration scheme, which improves the linearity of a delay line, is achieved by calibrating the nonlinearity of the input stage of the matrix. The multi-phase DLL is fabricated by using 0.11-${\mu}m$ CMOS process with a 1.2 V supply. At the operating frequency of 125MHz, the measurement results shows that the DNL is less than +0.51/-0.12 LSB, and the measured peak-to-peak jitter of the multi-phase DLL is 30 ps with input peak-to-peak jitter of 12.9 ps. The area and power consumption of the implemented DLL are $480{\times}550{\mu}m^2$ and 9.6 mW at the supply voltage of 1.2 V, respectively.

  • PDF

A 1.8 V 0.18-μm 1 GHz CMOS Fast-Lock Phase-Locked Loop using a Frequency-to-Digital Converter

  • Lee, Kwang-Hun;Jang, Young-Chan
    • Journal of information and communication convergence engineering
    • /
    • v.10 no.2
    • /
    • pp.187-193
    • /
    • 2012
  • A 1 GHz CMOS fast-lock phase-locked loop (PLL) is proposed to support the quick wake-up time of mobile consumer electronic devices. The proposed fast-lock PLL consists of a conventional charge-pump PLL, a frequency-to-digital converter (FDC) to measure the frequency of the input reference clock, and a digital-to-analog converter (DAC) to generate the initial control voltage of a voltage-controlled oscillator (VCO). The initial control voltage of the VCO is driven toward a reference voltage that is determined by the frequency of the input reference clock in the initial mode. For the speedy measurement of the frequency of the reference clock, an FDC with a parallel architecture is proposed, and its architecture is similar to that of a flash analog-to-digital converter. In addition, the frequency-to-voltage converter used in the FDC is designed simply by utilizing current integrators. The circuits for the proposed fast-lock scheme are disabled in the normal operation mode except in the initial mode to reduce the power consumption. The proposed PLL was fabricated by using a 0.18-${\mu}m$ 1-poly 6-metal complementary metal-oxide semiconductor (CMOS) process with a 1.8 V supply. This PLL multiplies the frequency of the reference clock by 10 and generates the four-phase clock. The simulation results show a reduction of up to 40% in the worstcase PLL lock time over the device operating conditions. The root-mean-square (rms) jitter of the proposed PLL was measured as 2.94 ps at 1 GHz. The area and power consumption of the implemented PLL are $400{\times}450{\mu}m^2$ and 6 mW, respectively.

Passband Digital Symbol Clock Recovery Scheme for 51.84Mbps VDSL QAM Receiver (51.84Mbps VDSL QAM 수신기를 위한 통과대역 디지털 심볼 클록 복원방식)

  • Lee, Jae-Ho;Kim, Jae-Won;Jeong, Hang-Geun;Jeong, Jin-Gyun
    • Journal of the Institute of Electronics Engineers of Korea SC
    • /
    • v.37 no.2
    • /
    • pp.77-84
    • /
    • 2000
  • In this paper, we discuss a symbol clock extraction scheme based on maximizing the band-edge component of the transmitted signal frequency spectrum for applications to 51.84Mbps VDSL system which uses a 16-QAM. The major characteristics of the digital PLL are examined. In addition, we suggest an efficient design method of a sinusoidal look-up table which is used for NCO.

  • PDF

High-speed, High-resolution Phase Measuring Technique for Heterodyne Displacement Measuring Interferometers (헤테로다인 변위 측정 간섭계의 고속, 고분해능 위상 측정)

  • Kim, Min-Seok;Kim, Seung-Woo
    • Journal of the Korean Society for Precision Engineering
    • /
    • v.19 no.9
    • /
    • pp.172-178
    • /
    • 2002
  • One of the ever-increasing demands on the performances of heterodyne interferometers is to improve the measurement resolution, of which current state -of-the-art reaches the region of sub-nanometers. So far, the demand has been met by increasing the clock speed that drives the electronics involved fur the phase measurement of the Doppler shift, but its further advance is being hampered by the technological limit of modem electronics. To cope with the problem, in this investigation, we propose a new scheme of phase -measuring electronics that reduces the measurement resolution without further increase in clock speed. Our scheme adopts a super-heterodyne technique that lowers the original beat frequency to a level of 1 MHz by mixing it with a stable reference signal generated from a special phase- locked-loop. The technique enables us to measure the phase of Doppler shift with a resolution of 1.58 nanometer at a sampling rate of 1 MHz. To avoid the undesirable decrease in the maximum measurable speed caused by the lowered beat frequency, a special form of frequency up-down counting technique is combined with the super-heterodyning. This allows performing required phase unwrapping simply by using programmable digital gates without 2n ambiguities up to the maximum velocity guaranteed by the original beat frequency.