• Journal of the Korea Institute of Information Security & Cryptology
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• v.19 no.5
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• pp.195-200
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• 2009

CRT-based RSA algorithm, which was implemented on smartcard, microcontroller and so on, leakages secret primes p and q by fault attacks using laser injection, EM radiation, ion beam injection, voltage glitch injection and so on. Among the many fault injection methods, voltage glitch can be injected to target device without any modification, so more practical. In this paper, we made an experiment on the fault injection attack using abnormal source voltage. As a result, CRT-RSA's secret prime p and q are disclosed by fault attack with voltage glitch injection which was introduced by several previous papers, and also succeed the fault attack with source voltage blocking for proper period.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.41 no.11
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• pp.79-85
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• 2004

A digitally-controlled analog-block inevitably undergoes the bang-bang oscillations which may cause a big amplitudes of the glitches if the oscillation occurs at the MSB transition points of a binary counter. The glitch results into the jitter noise for the case of the DLL. In this paper, we devise a new counter code that has the hysteresis in the bit transitions in order to prevent the transitions of the significant counter-bits at the locking state. The maximum clock jitter is simulated to considerably reduce over the voltage-temperature range guaranteed by specifications. The counter is employed to implement the high speed packet-base DRAM and contributes to the maximized valid data-window.

• Journal of the Institute of Electronics and Information Engineers
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• v.52 no.12
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• pp.99-108
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• 2015

The embedded microcontroller which is operated by the logic gates synchronized on the clock pulse, is gradually used as main controller of mission-critical systems. Severe electrical situations such as high voltage/frequency surge may cause malfunctioning of the clock source. The tolerant system operation is required against the various external electric noise and means the robust design technique is becoming more important issue in system clock failure problems. In this paper, we propose on-chip backup clock change architecture for the automatic clock failure detection. For the this, we adopt the edge detector, noise canceller logic and glitch-free clock changer circuit. The implemented edge detector unit detects the abnormal low-frequency of the clock source and the delay chain circuit of the clock pulse by the noise canceller can cancel out the glitch clock. The externally invalid clock source by detecting the emergency status will be switched to back-up clock source by glitch-free clock changer circuit. The proposed circuits are evaluated by Verilog simulation and the fabricated IC is validated by using test equipment electrical field radiation noise

• Journal of the Institute of Electronics Engineers of Korea SC
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• v.39 no.4
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• pp.43-53
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• 2002

In this paper, a new dynamic D-flip-flop which does not suffer from charge sharing and glitch problems is proposed. And a dual-modulus divide-by-128/129 prescaler has been designed with the proposed D-flip-flops using a 0.6$0.6{\mu}m$ CMOS technology. Eleven-transistor architecture enables it to operate at the higher frequency range and the transistor merging technique contributes to the reduction of power consumption. At 5V supply voltage, the simulated maximum operating frequency and the current consumption of the divide-by-128/129 prescaler are 1.97GHz and 7.453mA, respectively.

• Proceedings of the IEEK Conference
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• 1998.06a
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• pp.518-521
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• 1998

This paper describes a 3.3V-65MHz 12BIT CMOS current-mode DAC designed with a 8 MSB current matirx stage and a 4 LSB binary weighting stage. The linearity errors caused by a voltage drop of the ground line and a threshold voltage mismatch of transistors have been reduced by the symmetrical routing method with ground line and the tree structure bias circuit, respectively. In order to realize a low glitch energy, a cascode current switch ahs been employed. The simulation results of the designed DAC show a coversion rate of 65MHz, a powr dissipation of 71.7mW, a DNL of .+-.0.2LSB and an INL of .+-.0.8LSB with a single powr supply of 3.3V for a CMOS 0.6.mu.m n-well technology.

• Journal of IKEEE
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• v.15 no.3
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• pp.205-210
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• 2011

A novel hysteresis tunable monolithic comparator circuit based on a 0.35 ${\mu}m$ CMOS process is suggested in this paper. To tune the threshold voltage of the hysteresis in the comparator circuit, two external digital bits are used with supply voltage of 3.3V. The threshold voltage of the suggested comparator circuit is controlled by 234mV by change of 4 digital control bits in the simulation, which is a close agreement to the analytic calculation.

• The Journal of Korean Institute of Communications and Information Sciences
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• v.18 no.12
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• pp.1983-1993
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• 1993

A power-reduction technique for full-flash A/D converters is proposed. As the resolution of a full-flash A/D converter increases linearly, the number of comparators increases exponentially. The power dissipation is generally larger than other A/D converter architectures because there are many comparators, and they are operating continuously. In this proposed architecture, only a selected number of conmarators are made to operate instead of activating all the comparators of the full-flash A/D convertor. To determine whichcomparators should be activated, voltage levelfider circuits are used. A new clock driver is developed to suppress the dynamic glitch noise which is fed back into the input stage of the comparator. By using this clock driver, the glitch noise in the current source is reduced to one fourth of that when the typical clock signal is applied. The proposed architecture has been implemented with 1.2 m 5GHz BiCMOS technology. The maximum conversion speed is 350Msamples/s. and dissipates only 900mW.

• Journal of Industrial Technology
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• v.24 no.A
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• pp.83-90
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• 2004

Generally, electronic appliances are used on the basis of normal power source supply. The power source inevitably includes the abnormal condition, such as, sudden voltage sagging, power interrupt, and induced noises. As the electronic appliances which include micro-controller-based circuits are being increased recently, the controller circuit sometimes malfunctions by the abnormal condition of the power source. This situation causes serious problems such as hitch of electric appliance, fire and medical instrument glitch, which produces serious situations. In this paper, development of power interrupt tester which is highly suitable for an endurance test device under abnormal power source to microprocessor-based circuits is proposed 89C2051 microcontroller is performed to make power interrupt signal, and software controls peripheral hardwares and built-in functions. Experimental results of this study will offer a good application to electronic appliance maker as a test device of hardware and software debugging use.

• Proceedings of the IEEK Conference
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• 1999.11a
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• pp.689-692
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• 1999

This paper describes a 10-bit 75-MHz CMOS current-mode DAC designed for 0.8${\mu}{\textrm}{m}$ double-poly double-metal CMOS technology. This D/A converter is implemented using a current cell matrix that can drive a resistive load without output buffer. In the DAC. a current source is proposed to reduce the linearity error caused by the threshold-voltage variations over a wafer and the glitch energy caused by the time lagging, The integral and differential linearity error are founded to be within $\pm$0.35 LSB and $\pm$0.31 LSB respectively. The maximum conversion rate is about 80 MS/s. The total power dissipation is 160 ㎽ at 75 MS/s conversion rate.

• Proceedings of the KIEE Conference
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• 2002.11c
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• pp.609-612
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• 2002

In this paper, a 12-bit 100-MHz CMOS current steering digital-to-analog converter is designed. In the D/A converter, a driver circuit using a dynamic latch is implemented to obtain low glitch and thermometer decoder is used for low DNL errors, guaranteed monotonicity, reduced stitching noise. And a threshold voltage-compensated current source. The D/A converter is designed with 0.35-$\mu m$ CMOS technology at 3.3 V power supply and simulated with HSPICE. The maximum power dissipation of the designed DAC is 143 mW.