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http://dx.doi.org/10.13089/JKIISC.2009.19.5.195

An Experimental Fault Injection Attack on RSA Cryptosystem using Abnormal Source Voltage  

Park, Jea-Hoon (Kyungpook National University)
Moon, Sang-Jae (Kyungpook National University)
Ha, Jae-Cheol (Hoseo University)
Publication Information
Journal of the Korea Institute of Information Security & Cryptology / v.19, no.5, 2009 , pp. 195-200 More about this Journal
Abstract
CRT-based RSA algorithm, which was implemented on smartcard, microcontroller and so on, leakages secret primes p and q by fault attacks using laser injection, EM radiation, ion beam injection, voltage glitch injection and so on. Among the many fault injection methods, voltage glitch can be injected to target device without any modification, so more practical. In this paper, we made an experiment on the fault injection attack using abnormal source voltage. As a result, CRT-RSA's secret prime p and q are disclosed by fault attack with voltage glitch injection which was introduced by several previous papers, and also succeed the fault attack with source voltage blocking for proper period.
Keywords
Fault injection attack; CRT-RSA; Source voltage blocking; Voltage glitch; Microcontroller;
Citations & Related Records
Times Cited By KSCI : 1  (Citation Analysis)
연도 인용수 순위
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