1 |
R.Mariani, P. Fuhrmann, and B.Vittorelli, "Fault-robust microcontrollers for automotiveapplications," in On-Line Testing Symposium, 2006. IOLTS 2006. 12th IEEE International, 0-0 2006, p. 6 pp
|
2 |
G. Buja and R.Menis, "Dependability and functional safety: Applications in industrial electronics systems," Industrial Electronics Magazine, IEEE, vol. 6, no. 3, pp. 4 -12, sept. 2012.
|
3 |
H. Gall, "Functional safety iec 61508 / iec 61511 the impact to certification and the user," in Computer Systems and Applications, 2008. AICCSA 2008. IEEE/ACS International Conference on, March 2008, pp. 1027-1031.
|
4 |
S. Ben Dhia, S. Baffreau, S. Calvet, and E. Sicard, "Characterisation of microcontroller electromagnetic emission: models for an international standard," in Devices, Circuits and Systems, 2002. Proceedings of the Fourth IEEE International Caracas Conference on, 2002, pp. I030-I1-8.
|
5 |
T. Tamandl and P. Preininger, "Online Self Tests for Microcontrollers in Safety Related Systems," 2007 5th IEEE International Conference on Industrial Informatics, vol. 1, pp. 137-142, 2007.
|
6 |
W. Lyons., "Enabling increased safety with fault robustness in microcontroller applications," ARM Corporation, 2009.
|
7 |
S. A. Skavhaug and O. Pettersen, "Micro-FaultTolerant ( )-a system for achieving cost effective fault tolerance in microcontroller based equipment," in Real-Time Systems, 1995. Proceedings., Seventh Euromicro Workshop on. IEEE Computer Soc. Press, 1995, pp. 344-351.
|
8 |
D. Park and T. G. Kim, "Safe memory read-path using silent crc calculation of binary bit-inversion for low-power fast rom integrity verifcation," in Consumer Electronics in Berlin (ICCE-Berlin), 2013. ICCE-Berlin 2013. IEEE Third International Conference on, Sept 2013, pp. 300- 313.
|
9 |
C. Metra, M. Omana, T. Mak, and S. Tam, "New design for testability approach for clock fault testing," Computers, IEEE Transactions on, vol. 61, no. 4, pp. 448-457, april 2012.
DOI
|
10 |
I. E. Commission, "IEC-60730 official website," in Specification 60730-2, 2015. [Online]. Available: http://www.iec.ch
|
11 |
H.-N. Lin, C.-W. Kuo, C. kuo Chen, and J.-S. Chen, "Analysis of emi effect on flash memory ic," in Electromagnetic Compatibility (APEMC), 2012 Asia-Pacific Symposium on, may 2012, pp. 757 -760.
|
12 |
H. Wang, Y. Zhang, X. Li, L. Chen, Z. Wen, K. Zhang, and M. Wang, "A configurable fault-tolerant glitch-free clock switching circuit," in Circuits and Systems (MWSCAS), 2013 IEEE 56th International Midwest Symposium on, Aug 2013, pp. 537-540.
|
13 |
J. An, J. Cho, and D. Park, "On-chip glitch-free backup clock changer using noise canceller and edge detector for automatic mcu clock failure protection," in The 10th International Symposium on Embedded Technology, Jun. 2015, pp. 38.39.
|