• 한국지능시스템학회논문지
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• 제22권1호
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• pp.49-55
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• 2012

전역 클럭 없이 외부 입력에 따라서 값이 변하는 비동기 카운터는 우주용 메모리 등 현대 디지털 시스템에서 널리 사용된다. 본 논문에서는 우주 방사능 누적에 기인하는 크리티컬 레이스 고장이 존재하는 비동기 카운터를 위한 고장 극복 기법을 제안한다. 크리티컬 레이스는 비동기 디지털 회로 설계 과정에서 발생하는 대표적인 고장으로서 회로의 다음 안정 상태가 고정되지 않고 여러 값 중 하나로 나오는 비결정적인 특성을 보인다. 이번 연구에서는 비동기 순차 머신에 대한 교정 제어 기법을 이용하여 크리티컬 레이스를 극복할 수 있는 상태 피드백 제어기의 설계 과정을 제시한다. 또한 비동기 카운터 교정 제어 시스템을 VHDL 코드로 구현하고 실험을 통하여 제안된 제어 시스템이 크리티컬 레이스 고장을 극복하는 과정을 예시한다.

• Journal of Electrical Engineering and Technology
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• 제12권4호
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• pp.1619-1626
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• 2017

Electronic components that are used in high-level radiation environment require a semiconductor device having a radiation-hardened characteristic. In this paper, we proposed a radiation-hardened I-gate n-MOSFET (n-type Metal Oxide Semiconductors Field Effect Transistors) using a layout modification technique only. The proposed I-gate n-MOSFET structure is modified as an I-shaped gate poly in order to mitigate a radiation-induced leakage current in the standard n-MOSFET structure. For verification of its radiation-hardened characteristic, the M&S (Modeling and Simulation) of the 3D (3-Dimension) structure is performed by TCAD (Technology Computer Aided Design) tool. In addition, we carried out an evaluation test using a $Co^{60}$ gamma-ray source of 10kGy(Si)/h. As a result, we have confirmed the radiation-hardened level up to a total ionizing dose of 20kGy(Si).

• 전기학회논문지
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• 제66권3호
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• pp.540-544
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• 2017

In this study, we analyzed the effects of TID(Total Ionizing Dese) and TREE(Transient Radiation Effects on Electronics) on nMOSFET and pMOSFET fabricated by 0.18um CMOS process. The size of nMOSFET and pMOSFET is 100um/1um(W/L). The TID test was conducted up to 1 Mrad(Si) with a gamma-ray(Co-60). During the TID test, the nMOSFET generated leakage current proportional to the applied dose, but that of the pMOSFET was remained in a steady state. The TREE test was conducted at TEST LINAC in Pohang Accelerator Laboratory with a maximum dose-rate of $3.16{\times}10^8rad(si)/s$. In that test nMOESFET generated a large amount of photocurrent at a maximum of $3.16{\times}10^8rad(si)/s$. Whereas, pMOSFETs showed high TREE immunity with a little amount of photocurrent at the same dose rate. Based on the results of this experiment, we will progress the research of the radiation hardening for CMOS unit devices.

• 전기학회논문지
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• 제67권6호
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• pp.745-752
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• 2018

ICs(Integrated circuits) for nuclear power plant exposed to radiation environment occur malfunctions and data errors by the TID(Total ionizing dose) effects among radiation-damage phenomenons. In order to protect ICs from the TID effects, this paper proposes a radiation-hardening of the logic circuit(D-latch) which used for the data synchronization and the clock division in the ICs design. The radiation-hardening technology in the logic device(NAND) that constitutes the proposed RH(Radiation-hardened) D-latch is structurally more advantageous than the conventional technologies in that it keeps the device characteristics of the commercial process. Because of this, the unit cell based design of the RH logic device is possible, which makes it easier to design RH ICs, including digital logic circuits, and reduce the time and cost required in RH circuit design. In this paper, we design and modeling the structure of RH D-latch based on commercial $0.35{\mu}m$ CMOS process using Silvaco's TCAD 3D tool. As a result of verifying the radiation characteristics by applying the radiation-damage M&S (Modeling&Simulation) technique, we have confirmed the radiation-damage of the standard D-latch and the RH performance of the proposed D-latch by the TID effects.

• Nuclear Engineering and Technology
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• 제54권11호
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• pp.3985-3995
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• 2022

The emergence of new nanoscale technologies has imposed significant challenges to designing reliable electronic systems in radiation environments. A few types of radiation like Total Ionizing Dose (TID) can cause permanent damages on such nanoscale electronic devices, and current state-of-the-art technologies to tackle TID make use of expensive radiation-hardened devices. This paper focuses on a novel and different approach: using machine learning algorithms on consumer electronic level Field Programmable Gate Arrays (FPGAs) to tackle TID effects and monitor them to replace before they stop working. This condition has a research challenge to anticipate when the board results in a total failure due to TID effects. We observed internal measurements of FPGA boards under gamma radiation and used three different anomaly detection machine learning (ML) algorithms to detect anomalies in the sensor measurements in a gamma-radiated environment. The statistical results show a highly significant relationship between the gamma radiation exposure levels and the board measurements. Moreover, our anomaly detection results have shown that a One-Class SVM with Radial Basis Function Kernel has an average recall score of 0.95. Also, all anomalies can be detected before the boards are entirely inoperative, i.e. voltages drop to zero and confirmed with a sanity check.

• 한국항공우주학회지
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• 제41권1호
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• pp.79-84
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• 2013

DC/DC 컨버터는 임의의 직류전원을 부하가 요구하는 형태의 직류전원으로 변환시키는 효율이 높은 전력변환기이다. DC/DC 컨버터는 PWM-IC(펄스폭 변조 집적회로) 제어기, MOSFET(산화물-반도체 전계 효과 트랜지스터), 인덕터, 콘덴서 등으로 구성되어있다. 코발트 60 ($^{60}Co$) 저준위 감마발생기를 이용한 TID실험에서 방사선의 영향으로 PWM-IC의 전기적 특성중에 문턱전압과 옵셋전압이 증가되고, SEL에 적용된 4종류의 중이온 입자는 PWM-IC의 파형을 불안정하게 만든다. 또한, 입/출력관계의 파형을 SPICE 시뮬레이션 프로그램으로 관찰하였다. PWM-IC의 TID 실험은 30 Krad 까지 수행하였으며, SEL 실험을 제어보드를 구현한 후 LET($MeV/mg/cm^2$)별 cross section($cm^2$)으로 연구하였다.

• 한국항공우주학회지
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• 제42권11호
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• pp.981-987
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• 2014

DC/DC 컨버터는 임의의 직류전원을 부하가 요구하는 형태의 직류전원으로 변환시키는 효율이 높은 전력변환기이다. DC/DC 컨버터는 MOSFET(산화물-반도체 전계 효과 트랜지스터), PWM-IC(펄스폭 변조 집적회로) 제어기, 인덕터, 콘덴서 등으로 구성되어있다. MOSFET는 스위치 기능을 수행하는데 코발트 60 ($^{60}Co$) 저준위 감마발생기를 이용한 TID 실험에서 방사선의 영향으로 문턱전압과 항복전압의 변화와 SEGR 실험에 적용된 5종류의 중이온 입자는 MOSFET의 게이트(gate)에 영향을 주어 게이트가 파괴된다. MOSFET의 TID 실험은 40 Krad 까지 수행하였으며, SEGR 실험은 제어보드를 구현한 후 LET(MeV/mg/$cm^2$)별 cross section($cm^2$)을 연구하는데 있다.

• 한국방사선학회논문지
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• 제11권3호
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• pp.101-108
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• 2017

DC/DC 컨버터는 임의의 직류전원을 부하가 요구하는 형태의 직류전원으로 변환시키는 효율이 높은 전력변환기이다. 고급형 DC/DC 컨버터는 MOSFET(산화물-반도체 전계 효과 트랜지스터)를 제어하기 위해 OP-Amp.(연산 증폭기)를 실장한 PWM-IC(펄스폭 변조 집적회로)를 사용한다. OP-Amp.는 증폭기 기능을 수행하는데 방사선 영향으로 전기적 특성이 변화하는데 본 논문에서는 코발트 60 (60Co) 저준위 감마발생기를 이용한 TID실험과 5종류의 중이온 입자를 이용하여 SEL 실험을 수행하는데 바이어스(bias) 전류가 순간적으로 과전류가 흘러 SEL이 발생된다. OP-Amp.의 TID 실험은 조사율은 5 rad/sec.로 전체 조사량을 30 krad 까지 수행하였으며, SEL 실험은 제어보드를 구현한 후 LET($MeV/mg/cm^2$)별 cross section($cm^2$)을 이용하여 성능평가를 하는데 있다.

• Nuclear Engineering and Technology
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• 제36권1호
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• pp.1-11
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• 2004

Two approximate methods for a cosmic radiation shielding calculation in low earth orbits were developed and assessed. Those are a sectoring method and a chord-length distribution method. In order to simulate a change in cosmic radiation environments along the satellite mission trajectory, IGRF model and AP(E)-8 model were used. When the approximate methods were applied, the geometrical model of satellite structure was approximated as one-dimensional slabs, and a pre-calculated dose-depth conversion function was introduced to simplify the dose calculation process. Verification was performed with mission data of KITSAT-1 and the calculated results were also compared with detailed 3-dimensional calculation results using Monte Carlo calculation. Dose results from the approximate methods were conservatively higher than Monte Carlo results, but were lower than experimental data in total dose rate. Differences between calculation and experimental data seem to come from the AP-8 model, for which it is reported that fluxes of proton are underestimated. We confirmed that the developed approximate method can be applied to commercial satellite shielding calculations. It is also found that commercial products of semi-conductors can be damaged due to total ionizing dose under LEO radiation environment. An intensive shielding analysis should be taken into account when commercial devices are used.

• Journal of Astronomy and Space Sciences
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• 제33권3호
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• pp.229-236
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• 2016

We present proton-induced single event effects (SEEs) and γ-ray-induced total ionizing dose (TID) data for 1 Gbit lowpower double data rate synchronous dynamic random access memory (LPDDR SDRAM) fabricated on a 5 μm epitaxial layer (54 nm complementary metal-oxide-semiconductor (CMOS) technology). We compare our radiation tolerance data for LPDDR SDRAM with those of general DDR SDRAM. The data confirms that our devices under test (DUTs) are potential candidates for space flight applications.