Implementation of a Radiation-hardened I-gate n-MOSFET and Analysis of its TID(Total Ionizing Dose) Effects |
Lee, Min-Woong
(Dept. of Nuclear convergence technology, Korea Atomic Energy Research Institute)
Lee, Nam-Ho (Dept. of Nuclear convergence technology, Korea Atomic Energy Research Institute) Jeong, Sang-Hun (Dept. of Nuclear convergence technology, Korea Atomic Energy Research Institute) Kim, Sung-Mi (Dept. of Electronic Engineering, Chonbuk National University) Cho, Seong-Ik (Dept. of Electronic Engineering, Chonbuk National University) |
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