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http://dx.doi.org/10.5391/JKIIS.2012.22.1.49

Fault Diagnosis and Tolerance for Asynchronous Counters with Critical Races Caused by Total Ionizing Dose in Space  

Kwak, Seong-Woo (계명대학교 전자공학과)
Yang, Jung-Min (대구가톨릭대학교 전자공학과)
Publication Information
Journal of the Korean Institute of Intelligent Systems / v.22, no.1, 2012 , pp. 49-55 More about this Journal
Abstract
Asynchronous counters, where the counter value is changed not by a synchronizing clock but by outer inputs, are used in various modern digital systems such as spaceborne electronics. In this paper, we propose a scheme of fault tolerance for asynchronous counters with critical races caused by total ionizing dose (TID) in space. As a typical design flaw of asynchronous digital circuits, critical races cause an asynchronous circuit to show non-deterministic behavior, i.e., the next stable state of a state transition is not a fixed value but may be any value of a state set. Using the corrective control scheme for asynchronous sequential machines, this paper provides an existence condition and design procedure for a state feedback controller that can invalidate the effect of critical races. We implement the proposed control system in VHDL code and conduct experiments to demonstrate that the proposed control system can overcome critical races.
Keywords
Asynchronous counters; Critical races Total Ionizing Dose (TID); Corrective control; Fault tolerance;
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Times Cited By KSCI : 1  (Citation Analysis)
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