Browse > Article
http://dx.doi.org/10.5139/JKSAS.2014.42.11.981

TID and SEGR Testing on MOSFET of DC/DC Power Buck Converter  

Lho, Young Hwan (Dep't of Railroad Electricity System, Woosong University)
Publication Information
Journal of the Korean Society for Aeronautical & Space Sciences / v.42, no.11, 2014 , pp. 981-987 More about this Journal
Abstract
DC/DC switching power converters are commonly used to generate a regulated DC output voltage with high efficiency. The DC/DC converter is composed of a MOSFET (metal-oxide semiconductor field effect transistor), a PWM-IC (pulse width modulation-integrated circuit) controller, inductor, capacitor, etc. It is shown that the variation of threshold voltage and the breakdown voltage in the electrical characteristics of MOSFET occurs by radiation effects in TID (Total Ionizing Dose) testing at the low energy ${\gamma}$ rays using $^{60}Co$, and 5 heavy ions make the gate of MOSFET broken in SEGR (Single Event Gate Rupture) testing. TID testing on MOSFET is accomplished up to the total dose of 40 krad, and the cross section($cm^2$) versus LET(MeV/mg/$cm^2$) in the MOSFET operation is studied at SEGR testing after implementation of the controller board.
Keywords
MOSFET; TID; SEGR; SEE; DC/DC Converter;
Citations & Related Records
Times Cited By KSCI : 1  (Citation Analysis)
연도 인용수 순위
1 P. C. Adell et Al, "Total-Dose and Single-Event Effects in DC/DC Converter Control Circuitry," IEEE Transactions Nuclear Science, Vol. 50, No. 6, December, 2003
2 Y. H. Lho, "A Study on the Design of Voltage Mode PWM DC/DC Power Converter," Journal of the Korean Society for Railway, 14(5), October, 2011   과학기술학회마을   DOI
3 S. H. Lee, J. Y. Jung, "Power Electronics Engineering," Seoul, Hyung Seol Publications Inc. pp. 147-153, 2006
4 E. C. Roh, K. B. Jung, N. S. Choi, "Power Electronics," Moon Woon Dang, pp. 190-218, 1997 (in Korean)
5 Radiation Effects Research Program at IUCF Newsletter, March 2003
6 Rene Donaldson and M. G. D. Gilchrisese, Proceedings of the Workshop on Calorimetry for the Supercollider, pp.575, University of Alabama, Tuscaloosa, Alabama, 1989
7 Data sheet of IRF3315S/L, International Rectifier
8 Adel S. Sedra, Kenneth C. Smith, "Microelectronics Circuits,"SAUNDERS COLLEGE PUBLISHING pp. 320-326, 2002 (in Korean)
9 N. W. Van Vonno, L. G. Pearce, GM Wood et. al, "Total Dose and Single Event Testing of a Hardened Single-Ended Current Mode PWM Controller," NSREC, July, 2010
10 A Technical Report, "Development of Evaluation Technology of SEL Effects on Electronic Component for SPACE," National Research Foundation of Korea (2011) (in Korean)