• 대한전기학회논문지:전기물성ㆍ응용부문C
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• 제55권3호
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• pp.111-115
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• 2006

We investigated accelerated soft error rate(ASER) in 8M static random access memory(SRAM) cells. The effects on ASER by well structure, operational voltage, and cell transistor threshold voltage are examined. The ASER decreased exponentially with respect to operational voltage. The chips with buried nwell1 layer showed lower ASER than those either with normal well structure or with buried nwell1 + buried pwell structure. The ASER decreased as the ion implantation energy onto buried nwell1 changed from 1.5 MeV to 1.0 MeV. The lower viscosity of the capping layer also revealed lower ASER value. The decrease in the threshold voltage of driver or load transistor in SRAM cells caused the increase in the transistor on-current, resulting in lower ASER value. We confirmed that in order to obtain low ASER SRAM cells, it is necessary to also the buried nwell1 structure scheme and to fabricate the cell transistors with low threshold voltage and high on-current.

• 조명전기설비학회논문지
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• 제25권8호
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• pp.39-47
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• 2011

The motion of a conductive spherical particle under uniform electric field is investigated in order to find a suitable method for removing the conducting solid impurities contained in liquid plastic. When the positive dc voltage applied to the upper electrode, the vertical up-and-down motion of a charged particle by electrostatic force is observed by a charge-coupled device (CCD) camera or a high-speed video camera. The experimental data of the static threshold voltage by which the particle starts to move toward the counter electrode in air or silicone oil are in good agreement with theoretical value. When the applied voltage is larger than the static threshold voltage, the particle motion pattern in silicone oil consists of four stages: upward motion, stopping at the upper electrode, downward motion and stopping at the lower electrode. The stopping motion on the electrode is thought to be caused by the liquid flow accompanied by the particle motion. The particle charge calculated by integrating the pulse current, which is generated by the charge exchange between the electrode and the particle, is approximately 0.1~0.25 times of the theoretical value. This study is expected to help understand the electric properties of microparticles in oil circuit breaker (OCB) and oil transformer and improve their performance and longevity.

• 대한전기학회논문지:전기물성ㆍ응용부문C
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• 제53권10호
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• pp.510-514
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• 2004

In this paper, we analytically examine the voltage transfer function dependent on input conditions for an N-Input NAND Gate. The logic threshold voltage, defined as a voltage at which the input and the output voltage become equal, changes as the input condition changes for a static NAND Gate. The logic threshold voltage has the highest value when all the N-inputs undergo transitions and it has the lowest value when only the last input connected to the last NMOS to ground, makes a transition. This logic threshold voltage difference increases as the number of inputs increases. Therefore, in order to provide a near symmetric voltage transfer function, a multistage N-Input Gate consisting of 2-Input Logic Gates is desirable over a conventional N-Input Gate.

• JSTS:Journal of Semiconductor Technology and Science
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• 제10권2호
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• pp.118-129
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• 2010

A lower-threshold-voltage (LVth) SRAM cell with an elevated cell biasing scheme, which enables to reduce the random threshold-voltage (Vth) variation and to alleviate the stability-degradation caused by word-line (WL) and cell power line (VDDM) disturbed accesses in row and column directions, has been proposed. The random Vth variation (${\sigma}Vth$) is suppressed by the proposed LVth cell. As a result, the LVth cell reduces the variation of static noise margin (SNM) for the data retention, which enables to maintain a higher SNM over a larger memory size, compared with a conventionally being used higher Vth (HVth) cell. An elevated cell biasing scheme cancels the substantial trade-off relationship between SNM and the write margin (WRTM) in an SRAM cell. Obtained simulation results with a 45-nm CMOS technology model demonstrate that the proposed techniques allow sufficient stability margins to be maintained up to $6{\sigma}$ level with a 0.5-V data retention voltage and a 0.7-V logic bias voltage.

• 대한전기학회:학술대회논문집
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• 대한전기학회 1993년도 하계학술대회 논문집 A
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• pp.64-66
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• 1993

This paper presents an efficient method to calculate voltage collapse point and to improve static voltage stability. To evaluate static voltage stability in power systems. it is necessary to get critical loading points. For this purpose, we use linear programming to calculate efficiently voltage collapse point. And if index value becomes larger than given threshold value, vol tags stability is improved by compensation of reactive power at selected bus. This algorithm is verified by simulation on the sample system.

• 한국전기전자재료학회논문지
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• 제31권5호
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• pp.278-282
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• 2018

We propose a SPICE model of drain-induced barrier lowering (DIBL) for a junctionless cylindrical surrounding gate (JLCSG) MOSFETs. To this end, the potential distribution in the channel is obtained via the Poisson equation, and the threshold voltage model is presented for the JLCSG MOSFET. In a JLCSG nano-structured MOSFET, a channel radius affects the carrier transfer as well as the channel length and oxide thickness; therefore, DIBL should be expressed as a function of channel length, channel radius, and oxide thickness. Consequently, it can be seen that DIBLs are proportional to the power of -3 for the channel length, 2 for the channel radius, 1 for the thickness of the oxide film, and the constant of proportionality is 18.5 when the SPICE parameter, the static feedback coefficient ${\eta}$, is between 0.2 and 1.0. In particular, as the channel radius and the oxide film thickness increase, the value of ${\eta}$ remains nearly constant.

• 대한전기학회논문지
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• 제43권4호
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• pp.607-612
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• 1994

The static and dynamic model of IGBT for the SPICE simulation has been successfully developed. The various circuit model parameters are extracted from the I-V and C-V characteristics of IGBT and implemented into our model. The static model of IGBT consists of the MOSFET, bipolar transistor and series resistance. The parameters to be extracted are the threshold voltage of MOSFET, current gain $\beta$ of bipolar transistor, and the series resistance. They can be extracted from the measured I-V characteristics curve. The C-V characteristics between the terminals are very important parameters to determine the turn-on and turn-off waveform. Especially, voltage dependent capacitance are polynomially approximated to obtain the exact turn-on and turn-off waveforms. The SPICE simulation results employing new model agree well with the experimental values.

• 전자공학회논문지A
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• 제32A권11호
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• pp.71-78
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• 1995

Based on the popular 4-transistor SRAM cell, an analytical expression of the minimum cell ratio was derived by modeling the static read operation. By analyzing the relatively simple expression for the minimum cell ratio, which was derived assuming the ideal transistor characteristics, effects of the changes in supply voltage and process parameters on the minimum cell ratio was predicted, and the minimum power supply voltage for read operation was determined. The results were verified by simulations utilizing the suggested simulation method, which is suitable for monitoring the lower limit of supply voltage for proper cell operation. From the analysis, it was shown that the worst condition for cell operation is low temperature and low supply voltage, and that the operation margin can be effectively improved by reducing the threshold voltage of the cell transistors.

• JSTS:Journal of Semiconductor Technology and Science
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• 제14권5호
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• pp.625-631
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• 2014

We propose a compact power-on reset circuit consisting of a switched capacitor, a capacitor, and a Schmitt trigger inverter. A switched capacitor working with a clock signal charges the capacitor. Thus, the voltage across the capacitor is increased toward the supply voltage. The circuit provides a reset pulse until the voltage across the capacitor reaches the high threshold voltage of the Schmitt trigger inverter. The proposed circuit is simple, compact, has no static power consumption, and works for a wide range of power-on rising times. Furthermore, the clock signal is available while the reset pulse is activated. The proposed circuit works for up to 6 s of power-on rising time, and occupies a $60{\times}30{\mu}m^2$ active area.

• 전자공학회논문지A
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• 제31A권6호
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• pp.128-133
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• 1994

This paper proposes a new TTL-to-CMOS converter which has low power dissipation. This converter has no static power dissipation for typical TTL output voltage levels. The simulatio result shows that the power dissipation is reduced to about 1/20 of conventional level converter using CMOS inverters. It also has hysteresis due to the positive feedback which makes the converter noise immune. The logic threshold voltages in the hysteresis characteristic can be optimized by changing the size ratios of the transistors.