• Journal of the Institute of Electronics Engineers of Korea SD
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• v.41 no.8
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• pp.9-16
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• 2004

For a System-on-a-Chip(SoC) comprised of multiple IP cores, test control techniques have been developed to perform the internal and external test efficiently relying on the various design for testability techniques such as scan and BIST(Built-In Self-Test). However the test area overhead is too expensive to guarantee diverse test link configurations. In this paper, at first we introduce a new flag based Wrapped Core Linking Module(WCLM) that enables systematic integration of IEEE 1149.1 TAP'd cores and P1500 wrapped cores. Then a simple test control technique, which can interconnect internal scan chains of different cores, is described with requiring least amount of area overhead compared with other state-of-art techniques. The design preserves compatibility with standards and scalability for hierarchical access.

• Proceedings of the KIEE Conference
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• 2002.11c
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• pp.197-200
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• 2002

We newly developed the procedures of X-ray Cargo inspection system with acquisition of multi-channel data, analog to digital converter and post logic circuit which is controlled by the FPGA. The IEEE1149.1 standard defines a four-wire serial interface(a fifth wire is optional)to access complex integrated circuits(ICs) such as PLD. This paper describes that Boundary_Scan test method applied to our home made cargo inspection system.

• ETRI Journal
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• v.33 no.3
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• pp.374-381
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• 2011

A simple and effective compression method is proposed for multiple-scan testing. For a given test set, each test pattern is compressed from the view of slices. An encoding table exploiting seven types of frequently-occurring pattern is used. Compression is then achieved by mapping slice data into codewords. The decompression logic is small and easy to implement. It is also applicable to schemes adopting a single-scan chain. Experimental results show this method can achieve good compression effect.

• JSTS:Journal of Semiconductor Technology and Science
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• v.13 no.1
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• pp.71-78
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• 2013

In highly reliable and durable systems, failures due to aging might result in catastrophes. Aging monitoring techniques to prevent catastrophes by predicting such a failure are required. Aging can be monitored by performing a delay test at faster clocks than functional clock in field and checking the current delay state from the test clock frequencies at which the delay test is passed or failed. In this paper, we focus on test clock control scheme for a system-on-chip (SoC) with multiple clock domains. We describe limitations of existing at-speed test clock control methods and present an on-chip faster-than-at-speed test clock control scheme for intra/inter-clock domain test. Experimental results show our simulation results and area analysis. With a simple control scheme, with low area overhead, and without any modification of scan architecture, the proposed method enables faster-than-at-speed test of SoCs with multiple clock domains.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.41 no.2
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• pp.55-65
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• 2004

In this paper, An efficient non-scan DFT method for datapaths described in RTL is proposed. The proposed non-scan DFT method improves testability of datapaths based on hierarchical testability analysis regardless to width of the datapath. It always guarantees higher fault efficiency and faster test pattern generation time with little hardware overhead than previous methods. The experimental result shows the superiority of the proposed method of test pattern generation time, application time, and area overhead compared to the scan method.

• Journal of Chest Surgery
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• v.31 no.11
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• pp.1085-1088
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• 1998

Background: In trauma patients, bony thorax are exposured to the trauma in many cases. With simple x-ray, we can not detect all definitive bony abnormalities, especially in less severe cases. Bone scan is very sensitive diagnostic method in such cases. Materials and methods: We experienced 680 cases and results were as follows. Results: 1. Diagnostic sensitivity was 97.4% and false negative rate was 2.6%. 2. In sensitivity study, the time factor(when we perform bone scan) was the most important thing according to trauma pattern. In rib fracture, sensitive test time was after 1 week. In sternal fracture, sensitive test time was after 1 week, too. In costochondral junction fracture and combined cases, it was after 3 days. Conclusions: We recommend timely using of bone scan as definitive diagnostic method in bony thorax trauma patients.

• Geomechanics and Engineering
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• v.33 no.2
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• pp.203-209
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• 2023

One major advantage of ground penetrating radar (GPR) over other field test methods is its ability to obtain subsurface images of roads in an efficient and non-intrusive manner. Not only can the strata of pavement structure be retrieved from the GPR scan images, but also various irregularities, such as cracks and internal cavities. This article introduces a deep learning-based approach, focusing on detecting subsurface cracks by recognizing their distinctive hyperbolic signatures in the GPR scan images. Given the limited road sections that contain target features, two data augmentation methods, i.e., feature insertion and generation, are implemented, resulting in 9,174 GPR scan images. One of the most popular real-time object detection models, You Only Learn One Representation (YOLOR), is trained for detecting the target features for two types of subsurface cracks: bottom cracks and full cracks from the GPR scan images. The former represents partial cracks initiated from the bottom of the asphalt layer or base layers, while the latter includes extended cracks that penetrate these layers. Our experiments show the test average precisions of 0.769, 0.803 and 0.735 for all cracks, bottom cracks, and full cracks, respectively. This demonstrates the practicality of deep learning-based methods in detecting subsurface cracks from GPR scan images.

• The Transactions of the Korea Information Processing Society
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• v.1 no.2
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• pp.272-278
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• 1994

The paper proposes a test pattern generator and a signature analyzer for pseudoexhaustive testing of the combinational circuit part within a sequential circuit when performing built-in self test of the circuit. The test pattern generator can scan in the seed test pattern and generate exhaustive test patterns. The signature analyzer can perform the analysis of the circuit response and scan out the result. Such test pattern generator and signature analyzer have been developed using SRL(shift register latch) and LFSR(linear feedback shift register).

• Journal of KIISE:Computer Systems and Theory
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• v.26 no.9
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• pp.1177-1184
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• 1999

본 논문에서는 스캔플립프롭 선택 시간이 짧고 높은 고장 검출률(fault coverage)을 얻을 수 있는 새로운 부분스캔 설계 기술을 제안한다. 순차회로에서 테스트패턴 생성을 용이하게 하기 위하여 완전스캔 및 부분스캔 설계 기술이 널리 이용되고 있다. 스캔 설계로 인한 추가영역을 최소화 하고 최대의 고장 검출률을 목표로 하는 부분스캔 기술은 크게 구조분석과 테스트 가능도(testability)에 의한 설계 기술로 나누어 볼 수 있다. 구조분석에 의한 부분스캔은 짧은 시간에 스캔플립프롭을 선택할 수 있지만 고장 검출률은 낮다. 반면 테스트 가능도에 의한 부분스캔은 구조분석에 의한 부분스캔보다 스캔플립프롭의 선택 시간이 많이 걸리는 단점이 있지만 높은 고장 검출률을 나타낸다. 본 논문에서는 구조분석에 의한 부분스캔과 테스트 가능도에 의한 부분스캔 설계 기술의 장단점을 비교.분석하여 통합함으로써 스캔플립프롭 선택 시간을 단축하고 고장 검출률을 높일 수 있는 새로운 부분스캔 설계 기술을 제안한다. 실험결과 대부분의 ISCAS89 벤치마크 회로에서 스캔플립프롭 선택 시간은 현격히 감소하였고 비교적 높은 고장 검출률을 나타내었다.Abstract This paper provides a new partial scan design technique which not only reduces the time for selecting scan flip-flops but also improves fault coverage. To simplify the problem of the test pattern generation in the sequential circuits, full scan and partial scan design techniques have been widely adopted. The partial scan techniques which aim at minimizing the area overhead while maximizing the fault coverage, can be classified into the techniques based on structural analysis and testabilities. In case of the partial scan by structural analysis, it does not take much time to select scan flip-flops, but fault coverage is low. On the other hand, although the partial scan by testabilities generally results in high fault coverage, it requires more time to select scan flip-flops than the former method. In this paper, we analyzed and unified the strengths of the techniques by structural analysis and by testabilities. The new partial scan design technique not only reduces the time for selecting scan flip-flops but also improves fault coverage. Test results demonstrate the remarkable reduction of the time to select the scan flip-flops and high fault coverage in most ISCAS89 benchmark circuits.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.45 no.6
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• pp.43-48
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• 2008

Power consumption during test can be much higher than that during normal operation since test vectors are determined independently. In order to reduce the power consumption during test process, a new BIST(Built-In Self Test) architecture is proposed. In the proposed architecture, test vectors generated by an LFSR(Linear Feedback Shift Resister) are transformed into the new patterns with low transitions using Bit Generator and Bit Dropper. Experiments performed on ISCAS'89 benchmark circuits show that transition reduction during scan testing can be achieved by 62% without loss of fault coverage. Therefore the new architecture is a viable solution for reducing both peak and average power consumption.