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Electronics and Telecommunications Research Institute (한국전자통신연구원)
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An Internal Pattern Run-Length Methodology for Slice Encoding

  • Lee, Lung-Jen (Department of Computer Science & Engineering, Yuan Ze University) ;
  • Tseng, Wang-Dauh (Department of Computer Science & Engineering, Yuan Ze University) ;
  • Lin, Rung-Bin (Department of Computer Science & Engineering, Yuan Ze University)
  • Received : 2010.06.11
  • Accepted : 2010.11.12
  • Published : 2011.06.30
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Abstract

A simple and effective compression method is proposed for multiple-scan testing. For a given test set, each test pattern is compressed from the view of slices. An encoding table exploiting seven types of frequently-occurring pattern is used. Compression is then achieved by mapping slice data into codewords. The decompression logic is small and easy to implement. It is also applicable to schemes adopting a single-scan chain. Experimental results show this method can achieve good compression effect.

Keywords

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