• Proceedings of the KIEE Conference
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• 2001.11c
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• pp.376-379
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• 2001

In this paper, I design the control chip that controls inner test sequence of Logic Tester to test chip. Logic tester has the thirteen inner instructions to control test sequence in test. And these instructions are saved in memory with test pattern data. Control chip generates address and control signal such as read, write signal of memory. Before testing, necessary data such as start address, end address, etc. are written to inner register of control chip. When test started, control chip receives the instruction in start address and executes, and generates address and control signals to access tester' inner memory. So whole test sequence is controlled by making the address and control signal in tester's inner memory. Control chip designs instruction's execution blocks, respectively. So if inner instruction is added from now on, a revision is easy. The control chip will be made using FPGA of Xilinx Co. in future.

• The Transactions of The Korean Institute of Electrical Engineers
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• v.63 no.12
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• pp.1710-1715
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• 2014

In this paper, we propose a novel on-chip test logic for TSV fault detection in 3-dimensional integrated circuits. The proposed logic called OTT realizes the input signal delay-based TSV test method introduced earlier. OTT only includes one F/F, two MUXs, and some additional logic for signal delay. Thus, it requires small silicon area suitable for TSV testing. Both pre-bond and post-bond TSV tests are able to use OTT for short or open fault as well as small delay fault detection.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.43 no.7 s.349
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• pp.38-49
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• 2006

In this paper, a novel concept based on embedded processor and reconfigurable logic is proposed for efficient manufacturing test and design verification. Unlike traditional gap between design verification and manufacturing test, proposed concept is to combine both design verification and manufacturing test. The semiconductor chip which is using the proposed concept is named "SwToC" and SwToC stands for System with Test On a Chip. SwToC has two main features. First, it has functional verification function on a chip and this function could be made by using embedded processor, reconfigurable logic and memory. Second, it has internal ATE on a chip and this feature also could be made by the same architecture. To evaluate the proposed SwToC, we have implemented SwToC using commercial FPGA device with embedded processor. Experimental results showed that the proposed chip is possible for real application and could have faster verification time than traditional simulation method. Moreover, test could be done using low cost ATE.

• The Journal of the Institute of Internet, Broadcasting and Communication
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• v.24 no.1
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• pp.97-101
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• 2024

In this paper, we present the implementation of proton beam irradiation test logic and test results for Xilinx's RFSoC FPGA. In addition to the FPGA function, RFSoC is a chip that integrates CPU, ADC, and DAC and is attracting attention in the defense and space industries aimed at reducing the size of the chip. In order to use these chips in a space environment, an analysis of radiation effects was required and radiation mitigation measures were required. Through the proton irradiation test, the logic to measure the radiation effect of RFSoC was designed. Logic for comparing values stored in memory with normal values was implemented, and protons were irradiated to RFSoC to measure SEU generated in the block memory area. To alleviate the occurrence of SEU in other areas, TMR and SEM were applied and designed. Through the test results, we intend to verify this test configuration and establish an environment in which logic design for satellites can be verified in the future.

• 한국정보디스플레이학회:학술대회논문집
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• 2004.08a
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• pp.446-449
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• 2004

We developed a dynamic logic architecture which resulted better leakage current, lower power consumption and less area compared to the conventional dynamic logic structures. We demonstrated the advantage from HSPICE simulation and test chip design has been completed.

• Proceedings of the KIEE Conference
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• 2009.07a
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• pp.1931_1933
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• 2009

NoC 기반 시스템이 적용되는 설계는 시스템 크기가 커짐에 따라 칩 테스트 문제도 동시에 제기 되고 있다. 이에 따라 NoC 기반의 시스템의 테스트 시간을 줄일 수 있는 internal test 방식의 새로운 BIST(Built-in Self-Test) 구조에 관한 연구를 하였다. 기존의 NoC 기반 시스템의 BIST 테스트 구조는 각각의 router와 core에 BIST logic과 random pattern generator로 LFSR(Linear Feedback Shift Register)을 사용하여 연결하는 individual 방식과 하나의 BIST logic과 LFSR을 사용하여 각각의 router와 core에 병렬로 연결하는 distributed 방식을 사용한다. 이때, LFSR에서 생성된 테스트 벡터가 router에 사용되는 FIFO 메모리를 통과하면서 생기는 테스트 타임 증가를 줄이기 위하여 shift register 형태의 FIFO 메모리를 변경하였다 제안된 방법에서 테스트 커버리지 98%이상을 달성하였고, area overhead면에서 효과를 볼 수 있다.

• Journal of the Semiconductor & Display Technology
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• v.5 no.1 s.14
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• pp.33-38
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• 2006

The ATE driver to test a high speed semiconductor chip is designed by using general logic drivers instead of dedicated pin drivers. We have proposed a structure of general logic drivers using FPCA and assured its correct operation by EDA tool simulation. PCB circuit was implemented and Altera FPGA chip was programmed using DDR I/O library. On the PCB, it is necessary to place two resistors connected output drivers near to the output pin to adjust an impedance matching. We confirmed that the measured results agree with the simulated values within 5% errors at room temperature for the input signals with 800Mbps data transfer rate and 1.8V operating voltage.

• Journal of the Korean Institute of Telematics and Electronics C
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• v.35C no.6
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• pp.1-8
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• 1998

In this paper, we designed a low power 8bit ELM adder with static CMOS and hybrid logic styles on a chip. The designed 8bit ELM adder with both logic styles was fabricated in a 0.8$\mu\textrm{m}$ single-poly double-metal, LG CMOS process and tested. Hybrid logic style consists of CCPL(Combinative Complementary Pass-transistor Logic), Wang's XOR gate and static CMOS for critical path which determines the speed of ELM adder. As a result of chip test, the ELM adder with hybrid logic style is superior to the one with static CMOS by 9.29% in power consumption, 14.9% in delay time and 22.8% in PDP(Power Delay Product) at 5.0V supply voltage, respectively.

• Progress in Superconductivity
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• v.6 no.2
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• pp.104-107
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• 2005

We have developed and tested an RSFQ 4-bit Arithmetic Logic Unit (ALU) based on half adder cells and de switches. ALU is a core element of a computer processor that performs arithmetic and logic operations on the operands in computer instruction words. The designed ALU had limited operation functions of OR, AND, XOR, and ADD. It had a pipeline structure. We have simulated the circuit by using Josephson circuit simulation tools in order to reduce the timing problem, and confirmed the correct operation of the designed ALU. We used simulation tools of $XIC^{TM},\;WRspice^{TM}$, and Julia. The fabricated 4-bit ALU circuit had a size of $\3000{\ cal}um{\times}1500{\cal}$, and the chip size was $5{\cal} mm{\times}5{\cal}mm$. The test speeds were 1000 kHz and 5 GHz. For high-speed test, we used an eye-diagram technique. Our 4-bit ALU operated correctly up to 5 GHz clock frequency. The chip was tested at the liquid-helium temperature.

• JSTS:Journal of Semiconductor Technology and Science
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• v.15 no.2
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• pp.184-193
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• 2015

This paper proposes a cost-efficient and automatic method for large data acquisition from a test chip without expensive equipment to characterize random process variation in an integrated circuit. Our method requires only a test chip, a personal computer, a cheap digital-to-analog converter, a controller and multimeters, and thus large volume measurement can be performed on an office desk at low cost. To demonstrate the proposed method, we designed a test chip with a current model logic driver and an array of 128 current mirrors that mimic the random process variation of the driver's tail current mirror. Using our method, we characterized the random process variation of the driver's voltage due to the random process variation on the driver's tail current mirror from large volume measurement data. The statistical characteristics of the driver's output voltage calculated from the measured data are compared with Monte Carlo simulation. The difference between the measured and the simulated averages and standard deviations are less than 20% showing that we can easily characterize the random process variation at low cost by using our cost-efficient automatic large data acquisition method.