• Title/Summary/Keyword: N-current

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Temperature-dependent current-voltage characteristics of Organic Light-Emitting Diodes(OLEDs) (온도 변화에 따른 유기 전기 발광 소자의 전기적 특성)

  • Lee, Ho-Sik;Chung, Taekk-Gyun;Kim, Sang-Keol;Jung, Dong-Hoe;Jang, Kyung-Wook;Lee, Won-Jae;Kim, Tae-Wan;Lee, Joon-Ung;Kang, Dou-Yol
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2001.11b
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    • pp.370-373
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    • 2001
  • Temperature-dependent current-voltage characteristics of Organic Light-Emitting Diodes(OLEDs) were studied. The OLEDs were based on the molecular compounds, N,N'-diphenyl-N,N'-bis(3-methylphenyl)-1,1'-diphenyl-4,4'-diamine (TPD) as a hole transport and tris(8-hydroxyquinoline) aluminum($Alq_3$) as an electron transport and emissive material. The current-voltage characteristics were measured in the temperature range of 10[K] and 300[K]. A conduction mechanism in OLEDs was interpreted in terms of tunneling and trap-filled limited current.

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On the respouse of Coastal Water to the intensification of East Korea Warm Current along the East Coast of Korea-A theoretical consideration (東韓暖流의 强化에 따른 沿岸水의 應答에 관한 理論的 고찰)

  • 성영호
    • 한국해양학회지
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    • v.21 no.4
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    • pp.229-235
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    • 1986
  • The response of coastal water to the summertime intensification of the East Korea Warm Current is considered theoretically. A simply analytic model explains well the development of southward coastal current in the north (37-38$^{\circ}$N) and the uprising of lower cold water in the south (35-36$^{\circ}$N). The mechanism involved is the Rossby adjustment to a sudden increase of current.

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Temperature-dependent current-voltage characteristics of Organic Light-Emitting Diodes(OLEDs) (온도 변화에 따른 유기 전기 발광 소자의 전기적 특성)

  • 이호식;정택균;김상걸;정동회;장경욱;이원재;김태완;이준웅;강도열
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2001.11a
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    • pp.370-373
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    • 2001
  • Temperature-dependent current-voltage characteristics of Organic Light-Emitting Diodes (OLEDs) were studied. The OLEDs were based on the molecular compounds, N,N'-diphenyl-N,N'-bis(3-methylphenyl)-1,1'-diphenyl-4,4'-diamine (TPD) as a hole transport and trois(8-hydroxyquinoline) aluminum(Alq$_3$) as an electron transport and emissive material. The current-voltage characteristics were measured in the temperature range of 10[K] and 300[K]. A conduction mechanism in OLEDs was interpreted in terms of tunneling and trap-filled limited current.

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A Comparative Study of Controllers for CSI Fed Induction Motor

  • Kumar, Piush;Agarwal, Vineeta
    • Journal of Power Electronics
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    • v.10 no.2
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    • pp.165-170
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    • 2010
  • This paper presents a comparative study of P and PI controllers for a current source inverter (CSI) fed induction motor drive system. A dq model has been used which incorporates the induction motor and the inverter power supply with current feedback. The model is used first to generate the steady state curves to determine the operating point through computer simulations using the software package MATLAB. Then a transient analysis has been carried out for different values of the speed and current controller parameters. The controller value is adjusted by the Ziegler-Nichols method. It has been observed that the transient time to reach the steady state value is larger with the PI controller than with the P controller.

Temperature Dependence of Electrical Parameters of Silicon-on-Insulator Triple Gate n-Channel Fin Field Effect Transistor

  • Boukortt, Nour El Islam;Hadri, Baghdad;Caddemi, Alina;Crupi, Giovanni;Patane, Salvatore
    • Transactions on Electrical and Electronic Materials
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    • v.17 no.6
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    • pp.329-334
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    • 2016
  • In this work, the temperature dependence of electrical parameters of nanoscale SOI (silicon-on-insulator) TG (triple gate) n-FinFET (n-channel Fin field effect transistor) was investigated. Numerical device simulator $ATLAS^{TM}$ was used to construct, examine, and simulate the structure in three dimensions with different models. The drain current, transconductance, threshold voltage, subthreshold swing, leakage current, drain induced barrier lowering, and on/off current ratio were studied in various biasing configurations. The temperature dependence of the main electrical parameters of a SOI TG n-FinFET was analyzed and discussed. Increased temperature led to degraded performance of some basic parameters such as subthreshold swing, transconductance, on-current, and leakage current. These results might be useful for further development of devises to strongly down-scale the manufacturing process.

Current-voltage characteristics of ITO/PEDOT:PSS/TPD/$Alq_3$/LiAl device with temperature variation (ITO/PEDOT:PSS/TPD/$Alq_3$/LiAl 구조에서 온도 변화에 따른 전압-전류 특성)

  • Kim, Sang-Keol;Chung, Dong-Hoe;Hong, Jin-Woong;Chung, Taek-Gyun;Kim, Tae-Wan;Lee, Joon-Ung
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2002.04b
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    • pp.114-117
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    • 2002
  • We have studied the dependence of current-voltage characteristics of Organic Light Emitting Diodes(OLEDs) on temperature-dependent variation. The OLEDs have been based on the molecular compounds. N,N'-diphenyl-N,N'-bis(3-methylphenyl)-1, 1'- biphenyl-4, 4'-diamine (TPD) as a hole transport. tris(8-hydroxyquinolinoline) aluminum (III) ($Alq_3$) as an electron transport and Poly(3,4-ethylenedioxythiophene) (PEDOT:PSS) as a buffer layer. The current-voltage characteristics were measured in the temperature range of 10K and 300K. A conduction mechanism in OLEDs has been interpreted in terms of space-charge-limited current(SCLC) and tunneling region.Ā᐀會Ā᐀衅?⨀頱岒ᄀĀ저會Ā저?⨀⡌ឫഀĀ᐀會Ā᐀㡆?⨀쁌ឫഀĀ᐀會Ā᐀遆?⨀郞ග瀀ꀏ會Ā?⨀〲岒ऀĀ᐀會Ā᐀䁇?⨀젲岒Ā㰀會Ā㰀顇?⨀끩Ā㈀會Ā㈀?⨀䡪ഀĀ᐀會Ā᐀䡈?⨀Ā᐀會Ā᐀ꁈ?⨀硫Ā저會Ā저?⨀샟ගऀĀ저會Ā저偉?⨀栰岒ഀĀ저會Ā저ꡉ?⨀1岒ഀĀ저會Ā저J?⨀惝ග؀Ā؀會Ā؀塊?⨀ග䈀Ā切

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Microstructures and Mechanical Properties of HfN Coatings Deposited by DC, Mid-Frequency, and ICP Magnetron Sputtering

  • Sung-Yong Chun
    • Corrosion Science and Technology
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    • v.22 no.6
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    • pp.393-398
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    • 2023
  • Properties of hafnium nitride (HfN) coatings are affected by deposition conditions, most often by the sputtering technique. Appropriate use of different magnetron sputtering modes allows control of the structural development of the film, thereby enabling adjustment of its properties. This study compared properties of HfN coatings deposited by direct current magnetron sputtering (dcMS), mid-frequency direct current magnetron sputtering (mfMS), and inductively coupled plasma-assisted magnetron sputtering (ICPMS) systems. The microstructure, crystalline, and mechanical properties of these HfN coatings were investigated by field emission electron microscopy, X-ray diffraction, atomic force microscopy, and nanoindentation measurements. HfN coatings deposited using ICPMS showed smooth and highly dense microstructures, whereas those deposited by dcMS showed rough and columnar structures. Crystalline structures of HfN coatings deposited using ICPMS showed a single δ-HfN phase, whereas those deposited using dcMS and mfMS showed a mixed δ-HfN and HfN0.4 phases. Their performance were increased in the order of dcMS < mfMS < ICPMS, with ICPMS achieving a value of 47.0 GPa, surpassing previously reported results.

Eletrostatic Discharge Effects on AlGaN/GaN High Electron Mobility Transistor on Sapphire Substrate (사파이어 기판을 사용한 AlGaN/GaN 고 전자이동도 트랜지스터의 정전기 방전 효과)

  • Ha Min-Woo;Lee Seung-Chul;Han Min-Koo;Choi Young-Hwan
    • The Transactions of the Korean Institute of Electrical Engineers C
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    • v.54 no.3
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    • pp.109-113
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    • 2005
  • It has been reported that the failure phenomenon and variation of electrical characteristic due to the effect of electrostatic discharge(ESD) in silicon devices. But we had fess reports about the phenomenon due to the ESD in the compound semiconductors. So there are a lot of difficulty to the phenomenon analysis and to select the protection method of main circuits or the devices. It has not been reported that the relation between the ESD stress and GaN devices, which is remarkable to apply the operation in high temperature and high voltage due to the superior material characteristic. We studied that the characteristic variation of the AlGaN/GaN HEMT current, the leakage current, the transconductance(gm) and the failure phenomenon of device due to the ESD stress. We have applied the ESD stress by transmission line pulse(TLP) method, which is widely used in ESD stress experiments, and observed the variation of the electrical characteristic before and after applying the ESD stress. The on-current trended to increase after applying the ESD stress. The leakage current and transconductance were changed slightly. The failure point of device was mainly located in middle and edge sides of the gate, was considered the increase of temperature due to a leakage current. The GaN devices have poor thermal characteristic due to usage of the sapphire substrate, so it have been shown to easily fail at low voltage compared to the conventional GaAs devices.

Study on the Current Spreading Effect of Blue GaN/InGaN LED using 3-Dimensional Circuit Modeling (3차원의 회로 모델링을 이용한 청색 GaN/InGaN LED의 전류 확산 효과에 관한 연구)

  • Hwang, Sung-Min;Shim, Jong-In
    • Korean Journal of Optics and Photonics
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    • v.18 no.2
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    • pp.155-161
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    • 2007
  • A new and simple method of 3-dimensional circuit modeling and analysis is proposed and verified experimentally for the first time by determining 3-dimensional current flow and 2-dimensional light distribution in blue InGaN/GaN multi-quantum well (MQW) light emitting diode (LED) devices. Circuit parameters of the LED consist of the resistance of the metallic film and epitaxial layer, and the intrinsic diode which represents the active region emitting the light. The circuit parameters are extracted from the transmission line model (TLM) and current-voltage relation. We applied the >> proposed method and extracted circuit parameters to obtain the light emission pattern in a top-surface emitting-type LED. The current spreading effect is analyzed theoretically and quantitatively with a variation of the resistance of metallic and epitaxial layers. The emitting-light distribution of the fabricated blue LED showed a good agreement with the analyzed result, which shows the dark emission intensity at the corner of the p-electrode.

A Study on the Efficiency Characteristics of the Interleaved CRM PFC using GaN FET (GaN FET를 적용한 인터리브 CRM PFC의 효율특성에 관한 연구)

  • Ahn, Tae-Young;Jang, Jin-Haeng;Gil, Yong-Man
    • The Transactions of the Korean Institute of Power Electronics
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    • v.20 no.1
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    • pp.65-71
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    • 2015
  • This paper presents the efficiency analysis of a critical current mode interleaved PFC rectifier, in which each of three different semiconductor switches is employed as the active switch. The Si FET, SiC FET, and GaN FET are consecutively used with the prototype PFC rectifier, and the efficiency of the PFC rectifier with each different semiconductor switch is analyzed. An equivalent circuit model of the PFC rectifier, which incorporates all the internal losses of the PFC rectifier, is developed. The rms values of the current waveforms main circuit components are calculated. By adapting the rms current waveforms to the equivalent model, all the losses are broken down and individually analyzed to assess the conduction loss, switching loss, and magnetic loss in the PFC rectifier. This study revealed that the GaN FET offers the highest overall efficiency with the least loss among the three switching devices. The GaN FET yields 96% efficiency at 90 V input and 97.6% efficiency at 240 V, under full load condition. This paper also confirmed that the efficiency of the three switching devices largely depends on the turn-on resistance and parasitic capacitance of the respective switching devices.